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href="https://www.eeworldonline.com/category/bill-schweber-blogs/"><span >Bill’s Blogs</span></a></li> </ul></div></nav> <div style="padding-top:10px;text-align:center"><div id='jumbo-banner-ad-container' style='min-width: 970px; min-height: 90px;'><script>googletag.cmd.push(function() { googletag.display("jumbo-banner-ad-container"); });</script></div></div> <div class="site-inner"><div class="content-sidebar-wrap"><main class="content" id="genesis-content"><div class="archive-description taxonomy-archive-description taxonomy-description"><h1 class="archive-title">Analog IC Tips</h1></div><article class="post-514605 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-applications category-connectivity category-pcb-design tag-ironwood-electronics entry" aria-label="Elastomer socket combines thermal and RF power"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/elastomer-socket-combines-thermal-and-rf-power/">Elastomer socket combines thermal and RF power</a></h2> <p class="entry-meta"><time class="entry-time">February 13, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/akalnoskas/" class="entry-author-link" rel="author"><span class="entry-author-name">Aimee Kalnoskas</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/elastomer-socket-combines-thermal-and-rf-power/" aria-hidden="true" tabindex="-1"><img width="150" height="84" src="https://www.eeworldonline.com/wp-content/uploads/2025/02/C23348_highres-150x84.jpg" class="alignleft post-image entry-image" alt="" decoding="async" srcset="https://www.eeworldonline.com/wp-content/uploads/2025/02/C23348_highres-150x84.jpg 150w, https://www.eeworldonline.com/wp-content/uploads/2025/02/C23348_highres-300x169.jpg 300w, https://www.eeworldonline.com/wp-content/uploads/2025/02/C23348_highres.jpg 740w" sizes="(max-width: 150px) 100vw, 150px" /></a><p>To verify the performance of high power network processor chip, 94+ GHz bandwidth elastomer socket can be used with heatsink/axial flow fan to remove 135+ watts of heat generation. The elastomer socket is transparent, so the performance is equivalent to that of the direct solder version. The inductance of elastomer is 0.1nH, and the socket […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/applications/" rel="category tag">Applications</a>, <a href="https://www.eeworldonline.com/category/applications/connectivity/" rel="category tag">Connectivity</a>, <a href="https://www.eeworldonline.com/category/pcb-design/" rel="category tag">PCB Design</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/ironwood-electronics/" rel="tag">Ironwood Electronics</a></span></p></footer></article><article class="post-514428 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-faq category-featured tag-faq entry" aria-label="What are the three types of logic level translators (LLTs)?"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/what-are-the-three-types-of-logic-level-translators-llts/">What are the three types of logic level translators (LLTs)?</a></h2> <p class="entry-meta"><time class="entry-time">February 11, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/aharon-etengoff/" class="entry-author-link" rel="author"><span class="entry-author-name">Aharon Etengoff</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/what-are-the-three-types-of-logic-level-translators-llts/" aria-hidden="true" tabindex="-1"><img width="150" height="94" src="https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-28-at-11.36.52-AM-150x94.png" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-28-at-11.36.52-AM-150x94.png 150w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-28-at-11.36.52-AM-300x189.png 300w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-28-at-11.36.52-AM.png 700w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Logic-level translators (LLTs) are electronic circuits that enable communication between devices operating at different voltage levels, such as 3.3V and 5V. Also known as voltage-level translators or level shifters, LLTs convert signals between incompatible logic standards. This article outlines key LLT specifications and features, reviewing bidirectional, high-to-low, and low-to-high LLTs. It also explores the role […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/faq/" rel="category tag">FAQ</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/faq/" rel="tag">FAQ</a></span></p></footer></article><article class="post-514336 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-artificial-intelligence category-eda category-faq category-featured tag-eda tag-faq entry" aria-label="How AI and ML optimize functional verification for EDA"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/how-ai-and-ml-optimize-functional-verification-for-eda/">How AI and ML optimize functional verification for EDA</a></h2> <p class="entry-meta"><time class="entry-time">February 5, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/aharon-etengoff/" class="entry-author-link" rel="author"><span class="entry-author-name">Aharon Etengoff</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/how-ai-and-ml-optimize-functional-verification-for-eda/" aria-hidden="true" tabindex="-1"><img width="150" height="81" src="https://www.eeworldonline.com/wp-content/uploads/2025/01/Picture1-150x81.jpg" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2025/01/Picture1-150x81.jpg 150w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Picture1-300x162.jpg 300w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Picture1-737x400.jpg 737w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Picture1.jpg 740w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Functional verification ensures that the register transfer layer (RTL) implementation of semiconductor designs operates according to specified requirements. Electronic engineers typically perform functional verification using hardware verification languages (HVLs) such as SystemVerilog paired with the universal verification methodology (UVM). Other HVLs, such as VHSIC Hardware Description Language (VHDL) and Property Specification Language (PSL), may be […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/applications/artificial-intelligence/" rel="category tag">Artificial intelligence</a>, <a href="https://www.eeworldonline.com/category/eda/" rel="category tag">EDA</a>, <a href="https://www.eeworldonline.com/category/faq/" rel="category tag">FAQ</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/eda/" rel="tag">EDA</a>, <a href="https://www.eeworldonline.com/tag/faq/" rel="tag">FAQ</a></span></p></footer></article><article class="post-514298 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-faq category-featured tag-faq entry" aria-label="What is formal verification, and why is it important?"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/what-is-formal-verification-and-why-is-it-important/">What is formal verification, and why is it important?</a></h2> <p class="entry-meta"><time class="entry-time">January 29, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/aharon-etengoff/" class="entry-author-link" rel="author"><span class="entry-author-name">Aharon Etengoff</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/what-is-formal-verification-and-why-is-it-important/" aria-hidden="true" tabindex="-1"><img width="150" height="81" src="https://www.eeworldonline.com/wp-content/uploads/2025/01/Formal_Verification_EDA_Figure2-1-150x81.jpeg" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2025/01/Formal_Verification_EDA_Figure2-1-150x81.jpeg 150w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Formal_Verification_EDA_Figure2-1-300x162.jpeg 300w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Formal_Verification_EDA_Figure2-1-737x400.jpeg 737w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Formal_Verification_EDA_Figure2-1.jpeg 740w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Formal verification uses mathematical analysis to ensure semiconductor designs perform as intended. Typically automated, it efficiently identifies critical design errors, such as deadlocks, race conditions, and unreachable states. This article reviews the fundamentals of formal verification in semiconductor design, explores its integration with simulation for comprehensive validation, and highlights strategies for optimizing implementation. Defining formal […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/faq/" rel="category tag">FAQ</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/faq/" rel="tag">FAQ</a></span></p></footer></article><article class="post-514244 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-eda category-faq category-featured tag-faq entry" aria-label="Empowering innovation: OpenROAD and the future of open-source EDA"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/empowering-innovation-openroad-and-the-future-of-open-source-eda/">Empowering innovation: OpenROAD and the future of open-source EDA</a></h2> <p class="entry-meta"><time class="entry-time">January 27, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/aharon-etengoff/" class="entry-author-link" rel="author"><span class="entry-author-name">Aharon Etengoff</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/empowering-innovation-openroad-and-the-future-of-open-source-eda/" aria-hidden="true" tabindex="-1"><img width="150" height="81" src="https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-07-at-10.10.26-AM-150x81.png" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-07-at-10.10.26-AM-150x81.png 150w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-07-at-10.10.26-AM-300x162.png 300w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-07-at-10.10.26-AM-737x400.png 737w, https://www.eeworldonline.com/wp-content/uploads/2025/01/Screen-Shot-2025-01-07-at-10.10.26-AM.png 740w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Many electronic design automation (EDA) tools remain out of reach for semiconductor startups and research organizations. However, a growing number of open-source EDA solutions are bridging the affordability gap and democratizing advanced chip design. This article discusses how tools like OpenROAD and OpenLane lower entry barriers, reduce development costs, and drive innovation. It also explores how […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/eda/" rel="category tag">EDA</a>, <a href="https://www.eeworldonline.com/category/faq/" rel="category tag">FAQ</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/faq/" rel="tag">FAQ</a></span></p></footer></article><article class="post-514329 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-applications category-artificial-intelligence category-automotive category-data-centers category-ee-trainings-days-2025 category-events category-featured tag-multi-die-design tag-synopsys entry" aria-label="EE Training Days kicks-off 2025 with The A to Z of Multi-die Design"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/ee-training-days-kicks-off-2025-with-the-a-to-z-of-multi-die-design/">EE Training Days kicks-off 2025 with The A to Z of Multi-die Design</a></h2> <p class="entry-meta"><time class="entry-time">January 22, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/akalnoskas/" class="entry-author-link" rel="author"><span class="entry-author-name">Aimee Kalnoskas</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/ee-training-days-kicks-off-2025-with-the-a-to-z-of-multi-die-design/" aria-hidden="true" tabindex="-1"><img width="150" height="147" src="https://www.eeworldonline.com/wp-content/uploads/2025/01/mulit-die-design-featured-image-150x147.png" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2025/01/mulit-die-design-featured-image-150x147.png 150w, https://www.eeworldonline.com/wp-content/uploads/2025/01/mulit-die-design-featured-image-300x294.png 300w, https://www.eeworldonline.com/wp-content/uploads/2025/01/mulit-die-design-featured-image-768x753.png 768w, https://www.eeworldonline.com/wp-content/uploads/2025/01/mulit-die-design-featured-image.png 846w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Did you know that multi-die architectures now represent over 50% of new semiconductor designs, marking a significant shift in chip development strategy? It’s true. There’s now a clear trend towards more multi-die designs, especially in data center, AI, and server applications where the complexity of the chips is too large to fit on a single […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/applications/" rel="category tag">Applications</a>, <a href="https://www.eeworldonline.com/category/applications/artificial-intelligence/" rel="category tag">Artificial intelligence</a>, <a href="https://www.eeworldonline.com/category/applications/automotive/" rel="category tag">Automotive/Transportation</a>, <a href="https://www.eeworldonline.com/category/applications/data-centers/" rel="category tag">Data centers</a>, <a href="https://www.eeworldonline.com/category/events/ee-trainings-days-2025/" rel="category tag">EE Trainings Days 2025</a>, <a href="https://www.eeworldonline.com/category/events/" rel="category tag">Events</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/multi-die-design/" rel="tag">multi-die design</a>, <a href="https://www.eeworldonline.com/tag/synopsys/" rel="tag">synopsys</a></span></p></footer></article><article class="post-514162 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-faq category-featured tag-faq entry" aria-label="How hardware-assisted verification (HAV) transforms EDA workflows"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/how-hardware-assisted-verification-hav-transforms-eda-workflows/">How hardware-assisted verification (HAV) transforms EDA workflows</a></h2> <p class="entry-meta"><time class="entry-time">January 17, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/aharon-etengoff/" class="entry-author-link" rel="author"><span class="entry-author-name">Aharon Etengoff</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/how-hardware-assisted-verification-hav-transforms-eda-workflows/" aria-hidden="true" tabindex="-1"><img width="150" height="81" src="https://www.eeworldonline.com/wp-content/uploads/2024/12/HAV_Transform_EDA_Workflows_Figure2-1-150x81.jpg" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2024/12/HAV_Transform_EDA_Workflows_Figure2-1-150x81.jpg 150w, https://www.eeworldonline.com/wp-content/uploads/2024/12/HAV_Transform_EDA_Workflows_Figure2-1-300x162.jpg 300w, https://www.eeworldonline.com/wp-content/uploads/2024/12/HAV_Transform_EDA_Workflows_Figure2-1-737x400.jpg 737w, https://www.eeworldonline.com/wp-content/uploads/2024/12/HAV_Transform_EDA_Workflows_Figure2-1.jpg 740w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Many semiconductor companies rely on hardware-assisted verification (HAV) to optimize sophisticated monolithic system-on-chip (SoC) designs and chiplet architectures. HAV streamlines verification and validation by integrating emulation, field-programmable gate array (FPGA) prototyping, and virtual platforms. This approach enables design engineers to efficiently verify individual components and system-wide interactions while validating functionality at granular and system-wide levels. […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/faq/" rel="category tag">FAQ</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/faq/" rel="tag">FAQ</a></span></p></footer></article><article class="post-514132 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-eda category-faq category-featured category-tools tag-eda tag-faq entry" aria-label="Parasitic extraction in EDA: what it is and why it matters"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/parasitic-extraction-in-eda-what-it-is-and-why-it-matters/">Parasitic extraction in EDA: what it is and why it matters</a></h2> <p class="entry-meta"><time class="entry-time">January 15, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/aharon-etengoff/" class="entry-author-link" rel="author"><span class="entry-author-name">Aharon Etengoff</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/parasitic-extraction-in-eda-what-it-is-and-why-it-matters/" aria-hidden="true" tabindex="-1"><img width="150" height="81" src="https://www.eeworldonline.com/wp-content/uploads/2024/12/EDA_Parasitic_Extraction_Figure3-1-150x81.jpg" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2024/12/EDA_Parasitic_Extraction_Figure3-1-150x81.jpg 150w, https://www.eeworldonline.com/wp-content/uploads/2024/12/EDA_Parasitic_Extraction_Figure3-1-300x162.jpg 300w, https://www.eeworldonline.com/wp-content/uploads/2024/12/EDA_Parasitic_Extraction_Figure3-1-737x400.jpg 737w, https://www.eeworldonline.com/wp-content/uploads/2024/12/EDA_Parasitic_Extraction_Figure3-1.jpg 740w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Parasitic extraction (PEX) in electronic design automation (EDA) calculates parasitic effects — such as capacitances, resistances, and inductance — within integrated circuits (ICs). Parasitics are introduced during the physical manufacturing process in semiconductor foundries, affecting both IC devices and their interconnects (Figure 1). This article explores the three primary categories of parasitic effects, compares field […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/eda/" rel="category tag">EDA</a>, <a href="https://www.eeworldonline.com/category/faq/" rel="category tag">FAQ</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a>, <a href="https://www.eeworldonline.com/category/tools/" rel="category tag">Tools</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/eda/" rel="tag">EDA</a>, <a href="https://www.eeworldonline.com/tag/faq/" rel="tag">FAQ</a></span></p></footer></article><article class="post-514296 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-analog-ics tag-ironwoodelectronics entry" aria-label="ATE test contactors for Analog/RF/MMWave device testing"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/ate-test-contactors-for-analog-rf-mmwave-device-testing/">ATE test contactors for Analog/RF/MMWave device testing</a></h2> <p class="entry-meta"><time class="entry-time">January 15, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/emma-lutjen/" class="entry-author-link" rel="author"><span class="entry-author-name">Emma Lutjen</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/ate-test-contactors-for-analog-rf-mmwave-device-testing/" aria-hidden="true" tabindex="-1"><img width="150" height="81" src="https://www.eeworldonline.com/wp-content/uploads/2025/01/PicoRaptor_Front_View_More_Angle_highres-scaled-2-150x81.jpg" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2025/01/PicoRaptor_Front_View_More_Angle_highres-scaled-2-150x81.jpg 150w, https://www.eeworldonline.com/wp-content/uploads/2025/01/PicoRaptor_Front_View_More_Angle_highres-scaled-2-300x162.jpg 300w, https://www.eeworldonline.com/wp-content/uploads/2025/01/PicoRaptor_Front_View_More_Angle_highres-scaled-2-737x400.jpg 737w, https://www.eeworldonline.com/wp-content/uploads/2025/01/PicoRaptor_Front_View_More_Angle_highres-scaled-2.jpg 740w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Ironwood Electronics introduces its new Raptor line of ATE (automatic test equipment) test contactors. The cartridges, configured as quickly replaceable cartridges — a first for ATE applications — utilize Ironwood’s proprietary lamination technology for increased precision, convenience, and Mean Time Between Assist (MTBA). PicoRaptor high-performance rigid contact pins provide both high bandwidth and high insertion […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/analog-ics/" rel="category tag">Analog ICs</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/ironwoodelectronics/" rel="tag">ironwoodelectronics</a></span></p></footer></article><article class="post-514106 post type-post status-publish format-standard has-post-thumbnail category-analog-ic-tips category-artificial-intelligence category-faq category-featured tag-faq entry" aria-label="What are the different types of AI accelerators?"><header class="entry-header"><h2 class="entry-title"><a class="entry-title-link" rel="bookmark" href="https://www.eeworldonline.com/what-are-the-different-types-of-ai-accelerators/">What are the different types of AI accelerators?</a></h2> <p class="entry-meta"><time class="entry-time">January 13, 2025</time> By <span class="entry-author"><a href="https://www.eeworldonline.com/author/aharon-etengoff/" class="entry-author-link" rel="author"><span class="entry-author-name">Aharon Etengoff</span></a></span> </p></header><div class="entry-content"><a class="entry-image-link" href="https://www.eeworldonline.com/what-are-the-different-types-of-ai-accelerators/" aria-hidden="true" tabindex="-1"><img width="150" height="81" src="https://www.eeworldonline.com/wp-content/uploads/2024/12/Screen-Shot-2024-12-17-at-11.39.03-AM-150x81.png" class="alignleft post-image entry-image" alt="" decoding="async" loading="lazy" srcset="https://www.eeworldonline.com/wp-content/uploads/2024/12/Screen-Shot-2024-12-17-at-11.39.03-AM-150x81.png 150w, https://www.eeworldonline.com/wp-content/uploads/2024/12/Screen-Shot-2024-12-17-at-11.39.03-AM-300x162.png 300w, https://www.eeworldonline.com/wp-content/uploads/2024/12/Screen-Shot-2024-12-17-at-11.39.03-AM-737x400.png 737w, https://www.eeworldonline.com/wp-content/uploads/2024/12/Screen-Shot-2024-12-17-at-11.39.03-AM.png 740w" sizes="auto, (max-width: 150px) 100vw, 150px" /></a><p>Whether in data centers or at the edge, artificial intelligence (AI) accelerators address the limitations of traditional von Neumann architecture by rapidly processing massive datasets. Despite the gradual slowing of Moore’s law, these accelerators efficiently enable key applications such as generative AI (GenAI), deep reinforcement learning (DRL), advanced driver assistance systems (ADAS), smart edge devices, […]</p> </div><footer class="entry-footer"><p class="entry-meta"><span class="entry-categories">Filed Under: <a href="https://www.eeworldonline.com/category/analog-ic-tips/" rel="category tag">Analog IC Tips</a>, <a href="https://www.eeworldonline.com/category/applications/artificial-intelligence/" rel="category tag">Artificial intelligence</a>, <a href="https://www.eeworldonline.com/category/faq/" rel="category tag">FAQ</a>, <a href="https://www.eeworldonline.com/category/featured/" rel="category tag">Featured</a></span> <span class="entry-tags">Tagged With: <a href="https://www.eeworldonline.com/tag/faq/" rel="tag">FAQ</a></span></p></footer></article><div class="archive-pagination pagination" role="navigation" aria-label="Pagination"><ul><li class="active" 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