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Floating-gate MOSFET - Wikipedia
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class="vector-dropdown-content"> <div id="vector-page-titlebar-toc-unpinned-container" class="vector-unpinned-container"> </div> </div> </div> </nav> <h1 id="firstHeading" class="firstHeading mw-first-heading"><span class="mw-page-title-main">Floating-gate MOSFET</span></h1> <div id="p-lang-btn" class="vector-dropdown mw-portlet mw-portlet-lang" > <input type="checkbox" id="p-lang-btn-checkbox" role="button" aria-haspopup="true" data-event-name="ui.dropdown-p-lang-btn" class="vector-dropdown-checkbox mw-interlanguage-selector" aria-label="Go to an article in another language. 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href="https://de.wikipedia.org/wiki/Floating-Gate-Transistor" title="Floating-Gate-Transistor – German" lang="de" hreflang="de" data-title="Floating-Gate-Transistor" data-language-autonym="Deutsch" data-language-local-name="German" class="interlanguage-link-target"><span>Deutsch</span></a></li><li class="interlanguage-link interwiki-fa mw-list-item"><a href="https://fa.wikipedia.org/wiki/%D9%85%D8%A7%D8%B3%D9%81%D8%AA_%DA%AF%DB%8C%D8%AA-%D8%B4%D9%86%D8%A7%D9%88%D8%B1" title="ماسفت گیت-شناور – Persian" lang="fa" hreflang="fa" data-title="ماسفت گیت-شناور" data-language-autonym="فارسی" data-language-local-name="Persian" class="interlanguage-link-target"><span>فارسی</span></a></li><li class="interlanguage-link interwiki-ko mw-list-item"><a href="https://ko.wikipedia.org/wiki/%ED%94%8C%EB%A1%9C%ED%8C%85_%EA%B2%8C%EC%9D%B4%ED%8A%B8_MOSFET" title="플로팅 게이트 MOSFET – Korean" lang="ko" hreflang="ko" data-title="플로팅 게이트 MOSFET" data-language-autonym="한국어" data-language-local-name="Korean" class="interlanguage-link-target"><span>한국어</span></a></li><li class="interlanguage-link interwiki-id mw-list-item"><a href="https://id.wikipedia.org/wiki/Memori_gerbang_mengambang" title="Memori gerbang mengambang – Indonesian" lang="id" hreflang="id" data-title="Memori gerbang mengambang" data-language-autonym="Bahasa Indonesia" data-language-local-name="Indonesian" class="interlanguage-link-target"><span>Bahasa Indonesia</span></a></li><li class="interlanguage-link interwiki-it mw-list-item"><a href="https://it.wikipedia.org/wiki/Floating_Gate_MOSFET" title="Floating Gate MOSFET – Italian" lang="it" hreflang="it" data-title="Floating Gate MOSFET" data-language-autonym="Italiano" data-language-local-name="Italian" class="interlanguage-link-target"><span>Italiano</span></a></li><li class="interlanguage-link interwiki-ja mw-list-item"><a href="https://ja.wikipedia.org/wiki/%E6%B5%AE%E9%81%8A%E3%82%B2%E3%83%BC%E3%83%88MOSFET" title="浮遊ゲートMOSFET – Japanese" lang="ja" hreflang="ja" data-title="浮遊ゲートMOSFET" data-language-autonym="日本語" data-language-local-name="Japanese" class="interlanguage-link-target"><span>日本語</span></a></li><li class="interlanguage-link interwiki-ru mw-list-item"><a href="https://ru.wikipedia.org/wiki/%D0%A2%D1%80%D0%B0%D0%BD%D0%B7%D0%B8%D1%81%D1%82%D0%BE%D1%80_%D1%81_%D0%BF%D0%BB%D0%B0%D0%B2%D0%B0%D1%8E%D1%89%D0%B8%D0%BC_%D0%B7%D0%B0%D1%82%D0%B2%D0%BE%D1%80%D0%BE%D0%BC" title="Транзистор с плавающим затвором – Russian" lang="ru" hreflang="ru" data-title="Транзистор с плавающим затвором" data-language-autonym="Русский" data-language-local-name="Russian" class="interlanguage-link-target"><span>Русский</span></a></li><li class="interlanguage-link interwiki-uk mw-list-item"><a href="https://uk.wikipedia.org/wiki/%D0%A2%D1%80%D0%B0%D0%BD%D0%B7%D0%B8%D1%81%D1%82%D0%BE%D1%80_%D1%96%D0%B7_%D0%BF%D0%BB%D0%B0%D0%B2%D0%BD%D0%B8%D0%BC_%D0%B7%D0%B0%D1%82%D0%B2%D0%BE%D1%80%D0%BE%D0%BC" title="Транзистор із плавним затвором – Ukrainian" lang="uk" hreflang="uk" data-title="Транзистор із плавним затвором" data-language-autonym="Українська" data-language-local-name="Ukrainian" class="interlanguage-link-target"><span>Українська</span></a></li><li class="interlanguage-link interwiki-vi mw-list-item"><a href="https://vi.wikipedia.org/wiki/FGMOS" title="FGMOS – Vietnamese" lang="vi" hreflang="vi" data-title="FGMOS" data-language-autonym="Tiếng Việt" data-language-local-name="Vietnamese" class="interlanguage-link-target"><span>Tiếng Việt</span></a></li><li class="interlanguage-link interwiki-zh mw-list-item"><a href="https://zh.wikipedia.org/wiki/%E6%B5%AE%E6%A0%85%E9%87%91%E5%B1%9E%E6%B0%A7%E5%8C%96%E7%89%A9%E5%8D%8A%E5%AF%BC%E4%BD%93%E5%9C%BA%E6%95%88%E5%BA%94%E6%99%B6%E4%BD%93%E7%AE%A1" title="浮栅金属氧化物半导体场效应晶体管 – Chinese" lang="zh" hreflang="zh" data-title="浮栅金属氧化物半导体场效应晶体管" data-language-autonym="中文" data-language-local-name="Chinese" class="interlanguage-link-target"><span>中文</span></a></li> </ul> <div class="after-portlet 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searchaux" style="display:none">Type of MOSFET where the gate is electrically isolated</div> <p>The <b>floating-gate MOSFET</b> (<b>FGMOS</b>), also known as a <b>floating-gate MOS transistor</b> or <b>floating-gate transistor</b>, is a type of <a href="/wiki/Metal%E2%80%93oxide%E2%80%93semiconductor_field-effect_transistor" class="mw-redirect" title="Metal–oxide–semiconductor field-effect transistor">metal–oxide–semiconductor field-effect transistor</a> (MOSFET) where the gate is electrically isolated, creating a floating node in <a href="/wiki/Direct_current" title="Direct current">direct current</a>, and a number of secondary gates or inputs are deposited above the floating gate (FG) and are electrically isolated from it. These inputs are only <a href="/wiki/Capacitive_coupling" title="Capacitive coupling">capacitively</a> connected to the FG. Since the FG is surrounded by highly resistive material, the charge contained in it remains unchanged for long periods<sup id="cite_ref-Tunneling_1-0" class="reference"><a href="#cite_note-Tunneling-1"><span class="cite-bracket">[</span>1<span class="cite-bracket">]</span></a></sup> of time, typically longer than 10 years in modern devices. Usually <a href="/wiki/Field_electron_emission#Fowler–Nordheim_tunneling" title="Field electron emission">Fowler-Nordheim tunneling</a> or <a href="/wiki/Hot-carrier_injection" title="Hot-carrier injection">hot-carrier injection</a> mechanisms are used to modify the amount of charge stored in the FG. </p><p>The FGMOS is commonly used as a floating-gate <a href="/wiki/Memory_cell_(computing)" title="Memory cell (computing)">memory cell</a>, the <a href="/wiki/Computer_memory" title="Computer memory">digital storage</a> element in <a href="/wiki/EPROM" title="EPROM">EPROM</a>, <a href="/wiki/EEPROM" title="EEPROM">EEPROM</a> and <a href="/wiki/Flash_memory" title="Flash memory">flash memory</a> technologies. Other uses of the FGMOS include a neuronal computational element in <a href="/wiki/Neural_network" title="Neural network">neural networks</a>,<sup id="cite_ref-Mead_2-0" class="reference"><a href="#cite_note-Mead-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-Holler_3-0" class="reference"><a href="#cite_note-Holler-3"><span class="cite-bracket">[</span>3<span class="cite-bracket">]</span></a></sup> analog storage element,<sup id="cite_ref-Mead_2-1" class="reference"><a href="#cite_note-Mead-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup> <a href="/wiki/Digital_potentiometer" title="Digital potentiometer">digital potentiometers</a> and single-transistor <a href="/wiki/Digital-to-analog_converter" title="Digital-to-analog converter">DACs</a>. </p> <meta property="mw:PageProp/toc" /> <div class="mw-heading mw-heading2"><h2 id="History">History</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=1" title="Edit section: History"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <p>The concept of using stored charge to gate transistors for electronic memory, was first separately patented by Jack Morton and Ian Ross in 1955 at Bell Labs.<sup id="cite_ref-:0_4-0" class="reference"><a href="#cite_note-:0-4"><span class="cite-bracket">[</span>4<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-:1_5-0" class="reference"><a href="#cite_note-:1-5"><span class="cite-bracket">[</span>5<span class="cite-bracket">]</span></a></sup> Both proposed to store charge in a ferroelectric on the surface of the semiconductor with the purpose of gating electricity for information storage.<sup id="cite_ref-:0_4-1" class="reference"><a href="#cite_note-:0-4"><span class="cite-bracket">[</span>4<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-:1_5-1" class="reference"><a href="#cite_note-:1-5"><span class="cite-bracket">[</span>5<span class="cite-bracket">]</span></a></sup> The <a href="/wiki/MOSFET" title="MOSFET">MOSFET</a> was invented at Bell Labs between 1955 and 1960, after Frosch and Derick discovered surface silicon dioxide passivation and used their discovery to create the first planar transistors.<sup id="cite_ref-6" class="reference"><a href="#cite_note-6"><span class="cite-bracket">[</span>6<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-7" class="reference"><a href="#cite_note-7"><span class="cite-bracket">[</span>7<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-8" class="reference"><a href="#cite_note-8"><span class="cite-bracket">[</span>8<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-9" class="reference"><a href="#cite_note-9"><span class="cite-bracket">[</span>9<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-10" class="reference"><a href="#cite_note-10"><span class="cite-bracket">[</span>10<span class="cite-bracket">]</span></a></sup><sup id="cite_ref-Lojek12022_11-0" class="reference"><a href="#cite_note-Lojek12022-11"><span class="cite-bracket">[</span>11<span class="cite-bracket">]</span></a></sup> In 1961, Vasil Uzunoglu and Phillip Koenig, patented the idea applied to MOS-type transistors, also for solid memory.<sup id="cite_ref-12" class="reference"><a href="#cite_note-12"><span class="cite-bracket">[</span>12<span class="cite-bracket">]</span></a></sup> In 1961 Paul Weimer, from RCA, patented insulated electrodes for solid state devices.<sup id="cite_ref-13" class="reference"><a href="#cite_note-13"><span class="cite-bracket">[</span>13<span class="cite-bracket">]</span></a></sup> A FGMOS with thick insulation between the electrode and ferroelectric was later made in 1967 by Dawon Kahng and <a href="/wiki/Simon_Min_Sze" class="mw-redirect" title="Simon Min Sze">Simon Min Sze</a> at Bell Labs<sup id="cite_ref-14" class="reference"><a href="#cite_note-14"><span class="cite-bracket">[</span>14<span class="cite-bracket">]</span></a></sup> and patented by Kahng.<sup id="cite_ref-15" class="reference"><a href="#cite_note-15"><span class="cite-bracket">[</span>15<span class="cite-bracket">]</span></a></sup> </p><p>Until 1974, single floating gates were unable to be erased electronically and were not mass produced for electronic storage. Modern FGMOS used in flash memories are based on Fowler-Nordheim tunnelling EEPROM gates, which was invented by Bernward and patented by <a href="/wiki/Siemens" title="Siemens">Siemens</a> in 1974<sup id="cite_ref-16" class="reference"><a href="#cite_note-16"><span class="cite-bracket">[</span>16<span class="cite-bracket">]</span></a></sup> and further improved by Israeli-American <a href="/wiki/Eli_Harari" title="Eli Harari">Eliyahou Harari</a> at <a href="/wiki/Hughes_Aircraft_Company" title="Hughes Aircraft Company">Hughes Aircraft Company</a> and <a href="/wiki/George_Perlegos" title="George Perlegos">George Perlegos</a> and others at Intel.<sup id="cite_ref-17" class="reference"><a href="#cite_note-17"><span class="cite-bracket">[</span>17<span class="cite-bracket">]</span></a></sup> Initial applications of FGMOS was digital <a href="/wiki/Semiconductor_memory" title="Semiconductor memory">semiconductor</a> <a href="/wiki/Computer_memory" title="Computer memory">memory</a>, to store <a href="/wiki/Nonvolatile_memory" class="mw-redirect" title="Nonvolatile memory">nonvolatile</a> data in <a href="/wiki/EPROM" title="EPROM">EPROM</a>, <a href="/wiki/EEPROM" title="EEPROM">EEPROM</a> and <a href="/wiki/Flash_memory" title="Flash memory">flash memory</a>.<sup id="cite_ref-18" class="reference"><a href="#cite_note-18"><span class="cite-bracket">[</span>18<span class="cite-bracket">]</span></a></sup> </p><p>In 1989, Intel employed the FGMOS as an analog nonvolatile memory element in its electrically trainable <a href="/wiki/Artificial_neural_network" class="mw-redirect" title="Artificial neural network">artificial neural network</a> (ETANN) chip,<sup id="cite_ref-Holler_3-1" class="reference"><a href="#cite_note-Holler-3"><span class="cite-bracket">[</span>3<span class="cite-bracket">]</span></a></sup> demonstrating the potential of using FGMOS devices for applications other than digital memory. </p><p>Three research accomplishments laid the groundwork for much of the current FGMOS circuit development: </p> <ul><li>Thomsen and Brooke's demonstration and use of <a href="/wiki/Electron_tunneling" class="mw-redirect" title="Electron tunneling">electron tunneling</a> in a standard <a href="/wiki/CMOS" title="CMOS">CMOS</a> double-<a href="/wiki/Polysilicon" class="mw-redirect" title="Polysilicon">poly</a> process<sup id="cite_ref-19" class="reference"><a href="#cite_note-19"><span class="cite-bracket">[</span>19<span class="cite-bracket">]</span></a></sup> allowed many researchers to investigate FGMOS circuits concepts without requiring access to specialized fabrication processes.</li> <li>The <i>ν</i>MOS, or neuron-MOS, circuit approach by Shibata and Ohmi<sup id="cite_ref-20" class="reference"><a href="#cite_note-20"><span class="cite-bracket">[</span>20<span class="cite-bracket">]</span></a></sup> provided the initial inspiration and framework to use capacitors for linear computations. These researchers concentrated on the FG circuit properties instead of the device properties, and used either <a href="/wiki/Ultraviolet" title="Ultraviolet">UV</a> light to equalize charge, or simulated FG elements by opening and closing MOSFET switches.</li> <li><a href="/wiki/Carver_Mead" title="Carver Mead">Carver Mead</a>'s <a href="/w/index.php?title=Adaptive_retina&action=edit&redlink=1" class="new" title="Adaptive retina (page does not exist)">adaptive retina</a><sup id="cite_ref-Mead_2-2" class="reference"><a href="#cite_note-Mead-2"><span class="cite-bracket">[</span>2<span class="cite-bracket">]</span></a></sup> gave the first example of using continuously-operating FG programming/erasing techniques, in this case UV light, as the backbone of an adaptive circuit technology.</li></ul> <div class="mw-heading mw-heading2"><h2 id="Structure">Structure</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=2" title="Edit section: Structure"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <figure class="mw-default-size" typeof="mw:File/Thumb"><a href="/wiki/File:Floating_gate_transistor-en.svg" class="mw-file-description"><img src="//upload.wikimedia.org/wikipedia/commons/thumb/a/ae/Floating_gate_transistor-en.svg/220px-Floating_gate_transistor-en.svg.png" decoding="async" width="220" height="82" class="mw-file-element" srcset="//upload.wikimedia.org/wikipedia/commons/thumb/a/ae/Floating_gate_transistor-en.svg/330px-Floating_gate_transistor-en.svg.png 1.5x, //upload.wikimedia.org/wikipedia/commons/thumb/a/ae/Floating_gate_transistor-en.svg/440px-Floating_gate_transistor-en.svg.png 2x" data-file-width="283" data-file-height="106" /></a><figcaption>A cross-section of a floating-gate transistor</figcaption></figure> <p>An FGMOS can be fabricated by electrically isolating the gate of a standard MOS transistor<sup class="noprint Inline-Template" style="margin-left:0.1em; white-space:nowrap;">[<i><a href="/wiki/Wikipedia:Please_clarify" title="Wikipedia:Please clarify"><span title="I think that's a MOSFET, specifically, right? (May 2020)">clarification needed</span></a></i>]</sup>, so that there are no resistive connections to its gate. A number of secondary gates or inputs are then deposited above the floating gate (FG) and are electrically isolated from it. These inputs are only capacitively connected to the FG, since the FG is completely surrounded by highly resistive material. So, in terms of its DC operating point, the FG is a floating node. </p><p>For applications where the charge of the FG needs to be modified, a pair of small extra transistors are added to each FGMOS transistor to conduct the injection and tunneling operations. The gates of every transistor are connected together; the tunneling transistor has its source, drain and bulk terminals interconnected to create a capacitive tunneling structure. The injection transistor is connected normally and specific voltages are applied to create hot carriers that are then injected via an electric field into the floating gate. </p><p>FGMOS transistor for purely capacitive use can be fabricated on N or P versions. <sup id="cite_ref-21" class="reference"><a href="#cite_note-21"><span class="cite-bracket">[</span>21<span class="cite-bracket">]</span></a></sup> For charge modification applications, the tunneling transistor (and therefore the operating FGMOS) needs to be embedded into a well, hence the technology dictates the type of FGMOS that can be fabricated. </p> <div class="mw-heading mw-heading2"><h2 id="Modeling">Modeling</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=3" title="Edit section: Modeling"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <div class="mw-heading mw-heading3"><h3 id="Large_signal_DC">Large signal DC</h3><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=4" title="Edit section: Large signal DC"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <p>The equations modeling the DC operation of the FGMOS can be derived from the equations that describe the operation of the MOS transistor used to build the FGMOS. If it is possible to determine the voltage at the FG of an FGMOS device, it is then possible to express its drain to source current using standard MOS transistor models. Therefore, to derive a set of equations that model the large signal operation of an FGMOS device, it is necessary to find the relationship between its effective input voltages and the voltage at its FG. </p> <div class="mw-heading mw-heading3"><h3 id="Small_signal">Small signal</h3><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=5" title="Edit section: Small signal"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <p>An <i>N</i>-input FGMOS device has <i>N</i>−1 more terminals than a MOS transistor, and therefore, <i>N</i>+2 small signal parameters can be defined: <i>N</i> effective input <a href="/wiki/Transconductance" title="Transconductance">transconductances</a>, an output transconductance and a bulk transconductance. Respectively: </p> <dl><dd><span class="mwe-math-element"><span class="mwe-math-mathml-inline mwe-math-mathml-a11y" style="display: none;"><math xmlns="http://www.w3.org/1998/Math/MathML" alttext="{\displaystyle g_{mi}={\frac {C_{i}}{C_{T}}}g_{m}\quad {\mbox{for}}\quad i=[1,N]}"> <semantics> <mrow class="MJX-TeXAtom-ORD"> <mstyle displaystyle="true" scriptlevel="0"> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>m</mi> <mi>i</mi> </mrow> </msub> <mo>=</mo> <mrow class="MJX-TeXAtom-ORD"> <mfrac> <msub> <mi>C</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>i</mi> </mrow> </msub> <msub> <mi>C</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>T</mi> </mrow> </msub> </mfrac> </mrow> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>m</mi> </mrow> </msub> <mspace width="1em"></mspace> <mrow class="MJX-TeXAtom-ORD"> <mstyle displaystyle="false" scriptlevel="0"> <mtext>for</mtext> </mstyle> </mrow> <mspace width="1em"></mspace> <mi>i</mi> <mo>=</mo> <mo stretchy="false">[</mo> <mn>1</mn> <mo>,</mo> <mi>N</mi> <mo stretchy="false">]</mo> </mstyle> </mrow> <annotation encoding="application/x-tex">{\displaystyle g_{mi}={\frac {C_{i}}{C_{T}}}g_{m}\quad {\mbox{for}}\quad i=[1,N]}</annotation> </semantics> </math></span><img src="https://wikimedia.org/api/rest_v1/media/math/render/svg/e194d0688d39a0f12d724e488ee4ce3ab966bbde" class="mwe-math-fallback-image-inline mw-invert skin-invert" aria-hidden="true" style="vertical-align: -2.338ex; width:30.007ex; height:5.843ex;" alt="{\displaystyle g_{mi}={\frac {C_{i}}{C_{T}}}g_{m}\quad {\mbox{for}}\quad i=[1,N]}" /></span></dd> <dd><span class="mwe-math-element"><span class="mwe-math-mathml-inline mwe-math-mathml-a11y" style="display: none;"><math xmlns="http://www.w3.org/1998/Math/MathML" alttext="{\displaystyle g_{dsF}=g_{ds}+{\frac {C_{GD}}{C_{T}}}g_{m}}"> <semantics> <mrow class="MJX-TeXAtom-ORD"> <mstyle displaystyle="true" scriptlevel="0"> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>d</mi> <mi>s</mi> <mi>F</mi> </mrow> </msub> <mo>=</mo> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>d</mi> <mi>s</mi> </mrow> </msub> <mo>+</mo> <mrow class="MJX-TeXAtom-ORD"> <mfrac> <msub> <mi>C</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>G</mi> <mi>D</mi> </mrow> </msub> <msub> <mi>C</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>T</mi> </mrow> </msub> </mfrac> </mrow> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>m</mi> </mrow> </msub> </mstyle> </mrow> <annotation encoding="application/x-tex">{\displaystyle g_{dsF}=g_{ds}+{\frac {C_{GD}}{C_{T}}}g_{m}}</annotation> </semantics> </math></span><img src="https://wikimedia.org/api/rest_v1/media/math/render/svg/4f86c3a3b8b753e8d1f9771001546542e894ac35" class="mwe-math-fallback-image-inline mw-invert skin-invert" aria-hidden="true" style="vertical-align: -2.338ex; width:21.281ex; height:5.843ex;" alt="{\displaystyle g_{dsF}=g_{ds}+{\frac {C_{GD}}{C_{T}}}g_{m}}" /></span></dd> <dd><span class="mwe-math-element"><span class="mwe-math-mathml-inline mwe-math-mathml-a11y" style="display: none;"><math xmlns="http://www.w3.org/1998/Math/MathML" alttext="{\displaystyle g_{mbF}=g_{mb}+{\frac {C_{GB}}{C_{T}}}g_{m}}"> <semantics> <mrow class="MJX-TeXAtom-ORD"> <mstyle displaystyle="true" scriptlevel="0"> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>m</mi> <mi>b</mi> <mi>F</mi> </mrow> </msub> <mo>=</mo> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>m</mi> <mi>b</mi> </mrow> </msub> <mo>+</mo> <mrow class="MJX-TeXAtom-ORD"> <mfrac> <msub> <mi>C</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>G</mi> <mi>B</mi> </mrow> </msub> <msub> <mi>C</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>T</mi> </mrow> </msub> </mfrac> </mrow> <msub> <mi>g</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>m</mi> </mrow> </msub> </mstyle> </mrow> <annotation encoding="application/x-tex">{\displaystyle g_{mbF}=g_{mb}+{\frac {C_{GB}}{C_{T}}}g_{m}}</annotation> </semantics> </math></span><img src="https://wikimedia.org/api/rest_v1/media/math/render/svg/2038bf86b9ce392f960577ecaf51e713256e4a2f" class="mwe-math-fallback-image-inline mw-invert skin-invert" aria-hidden="true" style="vertical-align: -2.338ex; width:22.202ex; height:5.843ex;" alt="{\displaystyle g_{mbF}=g_{mb}+{\frac {C_{GB}}{C_{T}}}g_{m}}" /></span></dd></dl> <p>where <span class="mwe-math-element"><span class="mwe-math-mathml-inline mwe-math-mathml-a11y" style="display: none;"><math xmlns="http://www.w3.org/1998/Math/MathML" alttext="{\displaystyle C_{T}}"> <semantics> <mrow class="MJX-TeXAtom-ORD"> <mstyle displaystyle="true" scriptlevel="0"> <msub> <mi>C</mi> <mrow class="MJX-TeXAtom-ORD"> <mi>T</mi> </mrow> </msub> </mstyle> </mrow> <annotation encoding="application/x-tex">{\displaystyle C_{T}}</annotation> </semantics> </math></span><img src="https://wikimedia.org/api/rest_v1/media/math/render/svg/f6003ca59bfce8f624dd45e8ee023d098c7923cb" class="mwe-math-fallback-image-inline mw-invert skin-invert" aria-hidden="true" style="vertical-align: -0.671ex; width:3.051ex; height:2.509ex;" alt="{\displaystyle C_{T}}" /></span> is the total capacitance seen by the floating gate. These equations show two drawbacks of the FGMOS compared with the MOS transistor: </p> <ul><li>Reduction of the input transconductance</li> <li>Reduction of the output resistance</li></ul> <div class="mw-heading mw-heading2"><h2 id="Simulation">Simulation</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=6" title="Edit section: Simulation"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <p>Under normal conditions, a floating node in a circuit represents an error because its initial condition is unknown unless it is somehow fixed. This generates two problems: </p> <ol><li>It is not easy to simulate these circuits</li> <li>An unknown amount of charge might stay trapped at the floating gate during the fabrication process which will result in an unknown initial condition for the FG voltage.</li></ol> <p>Among the many solutions proposed for the computer simulation, one of the most promising methods is an Initial Transient Analysis (ITA) proposed by Rodriguez-Villegas,<sup id="cite_ref-22" class="reference"><a href="#cite_note-22"><span class="cite-bracket">[</span>22<span class="cite-bracket">]</span></a></sup> where the FGs are set to zero volts or a previously known voltage based on the measurement of the charge trapped in the FG after the fabrication process. A transient analysis is then run with the supply voltages set to their final values, letting the outputs evolve normally. The values of the FGs can then be extracted and used for posterior small-signal simulations, connecting a voltage supply with the initial FG value to the floating gate using a very-high-value inductor. </p> <div class="mw-heading mw-heading2"><h2 id="Applications">Applications</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=7" title="Edit section: Applications"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <p>The usage and applications of the FGMOS can be broadly classified in two cases. If the charge in the floating gate is not modified during the circuit usage, the operation is capacitively coupled. </p><p>In the capacitively coupled regime of operation, the net charge in the floating gate is not modified. Examples of application for this regime are single transistor adders, DACs, multipliers and logic functions, and variable threshold inverters. </p><p>Using the FGMOS as a programmable charge element, it is commonly used for <a href="/wiki/Non-volatile_storage" class="mw-redirect" title="Non-volatile storage">non-volatile storage</a> such as <a href="/wiki/Flash_memory" title="Flash memory">flash</a>, <a href="/wiki/EPROM" title="EPROM">EPROM</a> and <a href="/wiki/EEPROM" title="EEPROM">EEPROM</a> memory. In this context, floating-gate MOSFETs are useful because of their ability to store an electrical charge for extended periods of time without a connection to a power supply. Other applications of the FGMOS are neuronal computational element in <a href="/wiki/Neural_network" title="Neural network">neural networks</a>, analog storage element and <a href="/wiki/Digital_potentiometer" title="Digital potentiometer">e-pots</a>. </p> <div class="mw-heading mw-heading2"><h2 id="See_also">See also</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=8" title="Edit section: See also"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <ul><li><a href="/wiki/Charge_trap_flash" title="Charge trap flash">Charge trap flash</a></li> <li><a href="/wiki/Fe_FET" title="Fe FET">Fe FET</a></li> <li><a href="/wiki/IGBT" class="mw-redirect" title="IGBT">IGBT</a></li> <li><a href="/wiki/MOSFET" title="MOSFET">MOSFET</a></li> <li><a href="/wiki/SONOS" title="SONOS">SONOS</a></li></ul> <div class="mw-heading mw-heading2"><h2 id="References">References</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=9" title="Edit section: References"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <style data-mw-deduplicate="TemplateStyles:r1239543626">.mw-parser-output .reflist{margin-bottom:0.5em;list-style-type:decimal}@media screen{.mw-parser-output .reflist{font-size:90%}}.mw-parser-output .reflist .references{font-size:100%;margin-bottom:0;list-style-type:inherit}.mw-parser-output .reflist-columns-2{column-width:30em}.mw-parser-output .reflist-columns-3{column-width:25em}.mw-parser-output .reflist-columns{margin-top:0.3em}.mw-parser-output .reflist-columns ol{margin-top:0}.mw-parser-output .reflist-columns li{page-break-inside:avoid;break-inside:avoid-column}.mw-parser-output .reflist-upper-alpha{list-style-type:upper-alpha}.mw-parser-output .reflist-upper-roman{list-style-type:upper-roman}.mw-parser-output .reflist-lower-alpha{list-style-type:lower-alpha}.mw-parser-output .reflist-lower-greek{list-style-type:lower-greek}.mw-parser-output .reflist-lower-roman{list-style-type:lower-roman}</style><div class="reflist"> <div class="mw-references-wrap mw-references-columns"><ol class="references"> <li id="cite_note-Tunneling-1"><span class="mw-cite-backlink"><b><a href="#cite_ref-Tunneling_1-0">^</a></b></span> <span class="reference-text"><style data-mw-deduplicate="TemplateStyles:r1238218222">.mw-parser-output cite.citation{font-style:inherit;word-wrap:break-word}.mw-parser-output .citation q{quotes:"\"""\"""'""'"}.mw-parser-output .citation:target{background-color:rgba(0,127,255,0.133)}.mw-parser-output .id-lock-free.id-lock-free a{background:url("//upload.wikimedia.org/wikipedia/commons/6/65/Lock-green.svg")right 0.1em center/9px no-repeat}.mw-parser-output .id-lock-limited.id-lock-limited a,.mw-parser-output .id-lock-registration.id-lock-registration a{background:url("//upload.wikimedia.org/wikipedia/commons/d/d6/Lock-gray-alt-2.svg")right 0.1em center/9px no-repeat}.mw-parser-output .id-lock-subscription.id-lock-subscription a{background:url("//upload.wikimedia.org/wikipedia/commons/a/aa/Lock-red-alt-2.svg")right 0.1em center/9px no-repeat}.mw-parser-output .cs1-ws-icon a{background:url("//upload.wikimedia.org/wikipedia/commons/4/4c/Wikisource-logo.svg")right 0.1em center/12px no-repeat}body:not(.skin-timeless):not(.skin-minerva) .mw-parser-output .id-lock-free a,body:not(.skin-timeless):not(.skin-minerva) .mw-parser-output .id-lock-limited a,body:not(.skin-timeless):not(.skin-minerva) .mw-parser-output .id-lock-registration a,body:not(.skin-timeless):not(.skin-minerva) .mw-parser-output .id-lock-subscription a,body:not(.skin-timeless):not(.skin-minerva) .mw-parser-output .cs1-ws-icon a{background-size:contain;padding:0 1em 0 0}.mw-parser-output .cs1-code{color:inherit;background:inherit;border:none;padding:inherit}.mw-parser-output .cs1-hidden-error{display:none;color:var(--color-error,#d33)}.mw-parser-output .cs1-visible-error{color:var(--color-error,#d33)}.mw-parser-output .cs1-maint{display:none;color:#085;margin-left:0.3em}.mw-parser-output .cs1-kern-left{padding-left:0.2em}.mw-parser-output .cs1-kern-right{padding-right:0.2em}.mw-parser-output .citation .mw-selflink{font-weight:inherit}@media screen{.mw-parser-output .cs1-format{font-size:95%}html.skin-theme-clientpref-night .mw-parser-output .cs1-maint{color:#18911f}}@media screen and (prefers-color-scheme:dark){html.skin-theme-clientpref-os .mw-parser-output .cs1-maint{color:#18911f}}</style><cite class="citation journal cs1"><a rel="nofollow" class="external text" href="https://doi.org/10.1002%2Faelm.201800726">"Tunneling: New Floating Gate Memory with Excellent Retention Characteristics"</a>. <a href="/wiki/Doi_(identifier)" class="mw-redirect" title="Doi (identifier)">doi</a>:<span class="id-lock-free" title="Freely accessible"><a rel="nofollow" class="external text" href="https://doi.org/10.1002%2Faelm.201800726">10.1002/aelm.201800726</a></span>. <a href="/wiki/S2CID_(identifier)" class="mw-redirect" title="S2CID (identifier)">S2CID</a> <a rel="nofollow" class="external text" href="https://api.semanticscholar.org/CorpusID:139369906">139369906</a>.</cite><span title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Tunneling%3A+New+Floating+Gate+Memory+with+Excellent+Retention+Characteristics&rft_id=info%3Adoi%2F10.1002%2Faelm.201800726&rft_id=https%3A%2F%2Fapi.semanticscholar.org%2FCorpusID%3A139369906%23id-name%3DS2CID&rft_id=https%3A%2F%2Fdoi.org%2F10.1002%252Faelm.201800726&rfr_id=info%3Asid%2Fen.wikipedia.org%3AFloating-gate+MOSFET" class="Z3988"></span> <span class="cs1-visible-error citation-comment"><code class="cs1-code">{{<a href="/wiki/Template:Cite_journal" title="Template:Cite journal">cite journal</a>}}</code>: </span><span class="cs1-visible-error citation-comment">Cite journal requires <code class="cs1-code">|journal=</code> (<a href="/wiki/Help:CS1_errors#missing_periodical" title="Help:CS1 errors">help</a>)</span></span> </li> <li id="cite_note-Mead-2"><span class="mw-cite-backlink">^ <a href="#cite_ref-Mead_2-0"><sup><i><b>a</b></i></sup></a> <a href="#cite_ref-Mead_2-1"><sup><i><b>b</b></i></sup></a> <a href="#cite_ref-Mead_2-2"><sup><i><b>c</b></i></sup></a></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1238218222" /><cite id="CITEREFMeadIsmail1989" class="citation book cs1">Mead, Carver A.; Ismail, Mohammed, eds. (May 8, 1989). <a rel="nofollow" class="external text" href="http://fennetic.net/irc/Christopher%20R.%20Carroll%20Carver%20Mead%20Mohammed%20Ismail%20Analog%20VLSI%20Implementation%20of%20Neural%20Systems.pdf"><i>Analog VLSI Implementation of Neural Systems</i></a> <span class="cs1-format">(PDF)</span>. The Kluwer International Series in Engineering and Computer Science. Vol. 80. Norwell, MA: <a href="/wiki/Kluwer_Academic_Publishers" class="mw-redirect" title="Kluwer Academic Publishers">Kluwer Academic Publishers</a>. <a href="/wiki/Doi_(identifier)" class="mw-redirect" title="Doi (identifier)">doi</a>:<a rel="nofollow" class="external text" href="https://doi.org/10.1007%2F978-1-4613-1639-8">10.1007/978-1-4613-1639-8</a>. <a href="/wiki/ISBN_(identifier)" class="mw-redirect" title="ISBN (identifier)">ISBN</a> <a href="/wiki/Special:BookSources/978-1-4613-1639-8" title="Special:BookSources/978-1-4613-1639-8"><bdi>978-1-4613-1639-8</bdi></a>.</cite><span title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=book&rft.btitle=Analog+VLSI+Implementation+of+Neural+Systems&rft.place=Norwell%2C+MA&rft.series=The+Kluwer+International+Series+in+Engineering+and+Computer+Science&rft.pub=Kluwer+Academic+Publishers&rft.date=1989-05-08&rft_id=info%3Adoi%2F10.1007%2F978-1-4613-1639-8&rft.isbn=978-1-4613-1639-8&rft_id=http%3A%2F%2Ffennetic.net%2Firc%2FChristopher%2520R.%2520Carroll%2520Carver%2520Mead%2520Mohammed%2520Ismail%2520Analog%2520VLSI%2520Implementation%2520of%2520Neural%2520Systems.pdf&rfr_id=info%3Asid%2Fen.wikipedia.org%3AFloating-gate+MOSFET" class="Z3988"></span></span> </li> <li id="cite_note-Holler-3"><span class="mw-cite-backlink">^ <a href="#cite_ref-Holler_3-0"><sup><i><b>a</b></i></sup></a> <a href="#cite_ref-Holler_3-1"><sup><i><b>b</b></i></sup></a></span> <span class="reference-text">M. Holler, S. Tam, H. Castro, and R. Benson, "An electrically trainable artificial neural network with 10240 'floating gate' synapses", <i>Proceedings of the International Joint Conference on Neural Networks</i>, Washington, D.C., vol. II, 1989, pp. 191–196</span> </li> <li id="cite_note-:0-4"><span class="mw-cite-backlink">^ <a href="#cite_ref-:0_4-0"><sup><i><b>a</b></i></sup></a> <a href="#cite_ref-:0_4-1"><sup><i><b>b</b></i></sup></a></span> <span class="reference-text"><style data-mw-deduplicate="TemplateStyles:r1041539562">.mw-parser-output .citation{word-wrap:break-word}.mw-parser-output .citation:target{background-color:rgba(0,127,255,0.133)}</style><span class="citation patent" id="CITEREFMorton1957"><a rel="nofollow" class="external text" href="https://patents.google.com/patent/US2791761A/en">US2791761A</a>, Morton, Jack A., "Electrical switching and storage", issued 1957-05-07</span><span class="Z3988" title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.number=US2791761A&rft.cc=&rft.title=Electrical+switching+and+storage&rft.inventor=Morton&rft.date=1957-05-07"><span style="display: none;"> </span></span></span> </li> <li id="cite_note-:1-5"><span class="mw-cite-backlink">^ <a href="#cite_ref-:1_5-0"><sup><i><b>a</b></i></sup></a> <a href="#cite_ref-:1_5-1"><sup><i><b>b</b></i></sup></a></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1041539562" /><span class="citation patent" id="CITEREFRoss1957"><a rel="nofollow" class="external text" href="https://patents.google.com/patent/US2791760A/en">US2791760A</a>, Ross, Ian M., "Semiconductive translating device", issued 1957-05-07</span><span class="Z3988" title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.number=US2791760A&rft.cc=&rft.title=Semiconductive+translating+device&rft.inventor=Ross&rft.date=1957-05-07"><span style="display: none;"> </span></span></span> </li> <li id="cite_note-6"><span class="mw-cite-backlink"><b><a href="#cite_ref-6">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1041539562" /><span class="citation patent" id="CITEREFLincolnFrosch1957"><a rel="nofollow" class="external text" href="https://patents.google.com/patent/US2802760A">US2802760A</a>, Lincoln, Derick & Frosch, Carl J., "Oxidation of semiconductive surfaces for controlled diffusion", issued 1957-08-13</span><span class="Z3988" title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.number=US2802760A&rft.cc=&rft.title=Oxidation+of+semiconductive+surfaces+for+controlled+diffusion&rft.inventor=Lincoln&rft.date=1957-08-13"><span style="display: none;"> </span></span></span> </li> <li id="cite_note-7"><span class="mw-cite-backlink"><b><a href="#cite_ref-7">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1238218222" /><cite id="CITEREFFroschDerick1957" class="citation journal cs1">Frosch, C. J.; Derick, L (1957). <a rel="nofollow" class="external text" href="https://iopscience.iop.org/article/10.1149/1.2428650">"Surface Protection and Selective Masking during Diffusion in Silicon"</a>. <i>Journal of the Electrochemical Society</i>. <b>104</b> (9): 547. <a href="/wiki/Doi_(identifier)" class="mw-redirect" title="Doi (identifier)">doi</a>:<a rel="nofollow" class="external text" href="https://doi.org/10.1149%2F1.2428650">10.1149/1.2428650</a>.</cite><span title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.jtitle=Journal+of+the+Electrochemical+Society&rft.atitle=Surface+Protection+and+Selective+Masking+during+Diffusion+in+Silicon&rft.volume=104&rft.issue=9&rft.pages=547&rft.date=1957&rft_id=info%3Adoi%2F10.1149%2F1.2428650&rft.aulast=Frosch&rft.aufirst=C.+J.&rft.au=Derick%2C+L&rft_id=https%3A%2F%2Fiopscience.iop.org%2Farticle%2F10.1149%2F1.2428650&rfr_id=info%3Asid%2Fen.wikipedia.org%3AFloating-gate+MOSFET" class="Z3988"></span></span> </li> <li id="cite_note-8"><span class="mw-cite-backlink"><b><a href="#cite_ref-8">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1238218222" /><cite id="CITEREFKAHNG1961" class="citation journal cs1">KAHNG, D. (1961). <a rel="nofollow" class="external text" href="https://doi.org/10.1142/9789814503464_0076">"Silicon-Silicon Dioxide Surface Device"</a>. <i>Technical Memorandum of Bell Laboratories</i>: <span class="nowrap">583–</span>596. <a href="/wiki/Doi_(identifier)" class="mw-redirect" title="Doi (identifier)">doi</a>:<a rel="nofollow" class="external text" href="https://doi.org/10.1142%2F9789814503464_0076">10.1142/9789814503464_0076</a>. <a href="/wiki/ISBN_(identifier)" class="mw-redirect" title="ISBN (identifier)">ISBN</a> <a href="/wiki/Special:BookSources/978-981-02-0209-5" title="Special:BookSources/978-981-02-0209-5"><bdi>978-981-02-0209-5</bdi></a>.</cite><span title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.jtitle=Technical+Memorandum+of+Bell+Laboratories&rft.atitle=Silicon-Silicon+Dioxide+Surface+Device&rft.pages=%3Cspan+class%3D%22nowrap%22%3E583-%3C%2Fspan%3E596&rft.date=1961&rft_id=info%3Adoi%2F10.1142%2F9789814503464_0076&rft.isbn=978-981-02-0209-5&rft.aulast=KAHNG&rft.aufirst=D.&rft_id=https%3A%2F%2Fdoi.org%2F10.1142%2F9789814503464_0076&rfr_id=info%3Asid%2Fen.wikipedia.org%3AFloating-gate+MOSFET" class="Z3988"></span></span> </li> <li id="cite_note-9"><span class="mw-cite-backlink"><b><a href="#cite_ref-9">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1238218222" /><cite id="CITEREFLojek2007" class="citation book cs1">Lojek, Bo (2007). <i>History of Semiconductor Engineering</i>. Berlin, Heidelberg: Springer-Verlag Berlin Heidelberg. p. 321. <a href="/wiki/ISBN_(identifier)" class="mw-redirect" title="ISBN (identifier)">ISBN</a> <a href="/wiki/Special:BookSources/978-3-540-34258-8" title="Special:BookSources/978-3-540-34258-8"><bdi>978-3-540-34258-8</bdi></a>.</cite><span title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=book&rft.btitle=History+of+Semiconductor+Engineering&rft.place=Berlin%2C+Heidelberg&rft.pages=321&rft.pub=Springer-Verlag+Berlin+Heidelberg&rft.date=2007&rft.isbn=978-3-540-34258-8&rft.aulast=Lojek&rft.aufirst=Bo&rfr_id=info%3Asid%2Fen.wikipedia.org%3AFloating-gate+MOSFET" class="Z3988"></span></span> </li> <li id="cite_note-10"><span class="mw-cite-backlink"><b><a href="#cite_ref-10">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1238218222" /><cite id="CITEREFLigenzaSpitzer1960" class="citation journal cs1">Ligenza, J.R.; Spitzer, W.G. (1960). <a rel="nofollow" class="external text" href="https://linkinghub.elsevier.com/retrieve/pii/0022369760902195">"The mechanisms for silicon oxidation in steam and oxygen"</a>. <i>Journal of Physics and Chemistry of Solids</i>. <b>14</b>: <span class="nowrap">131–</span>136. <a href="/wiki/Bibcode_(identifier)" class="mw-redirect" title="Bibcode (identifier)">Bibcode</a>:<a rel="nofollow" class="external text" href="https://ui.adsabs.harvard.edu/abs/1960JPCS...14..131L">1960JPCS...14..131L</a>. <a href="/wiki/Doi_(identifier)" class="mw-redirect" title="Doi (identifier)">doi</a>:<a rel="nofollow" class="external text" href="https://doi.org/10.1016%2F0022-3697%2860%2990219-5">10.1016/0022-3697(60)90219-5</a>.</cite><span title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.jtitle=Journal+of+Physics+and+Chemistry+of+Solids&rft.atitle=The+mechanisms+for+silicon+oxidation+in+steam+and+oxygen&rft.volume=14&rft.pages=%3Cspan+class%3D%22nowrap%22%3E131-%3C%2Fspan%3E136&rft.date=1960&rft_id=info%3Adoi%2F10.1016%2F0022-3697%2860%2990219-5&rft_id=info%3Abibcode%2F1960JPCS...14..131L&rft.aulast=Ligenza&rft.aufirst=J.R.&rft.au=Spitzer%2C+W.G.&rft_id=https%3A%2F%2Flinkinghub.elsevier.com%2Fretrieve%2Fpii%2F0022369760902195&rfr_id=info%3Asid%2Fen.wikipedia.org%3AFloating-gate+MOSFET" class="Z3988"></span></span> </li> <li id="cite_note-Lojek12022-11"><span class="mw-cite-backlink"><b><a href="#cite_ref-Lojek12022_11-0">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1238218222" /><cite id="CITEREFLojek2007" class="citation book cs1">Lojek, Bo (2007). <i>History of Semiconductor Engineering</i>. <a href="/wiki/Springer_Science_%26_Business_Media" class="mw-redirect" title="Springer Science & Business Media">Springer Science & Business Media</a>. p. 120. <a href="/wiki/ISBN_(identifier)" class="mw-redirect" title="ISBN (identifier)">ISBN</a> <a href="/wiki/Special:BookSources/9783540342588" title="Special:BookSources/9783540342588"><bdi>9783540342588</bdi></a>.</cite><span title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=book&rft.btitle=History+of+Semiconductor+Engineering&rft.pages=120&rft.pub=Springer+Science+%26+Business+Media&rft.date=2007&rft.isbn=9783540342588&rft.aulast=Lojek&rft.aufirst=Bo&rfr_id=info%3Asid%2Fen.wikipedia.org%3AFloating-gate+MOSFET" class="Z3988"></span></span> </li> <li id="cite_note-12"><span class="mw-cite-backlink"><b><a href="#cite_ref-12">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1041539562" /><span class="citation patent" id="CITEREFVasilKoenig1968"><a rel="nofollow" class="external text" href="https://patents.google.com/patent/US3418493A/en">US3418493A</a>, Vasil, Uzunoglu & Koenig, Jr Phillip R., "Semiconductor memory device", issued 1968-12-24</span><span class="Z3988" title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.number=US3418493A&rft.cc=&rft.title=Semiconductor+memory+device&rft.inventor=Vasil&rft.date=1968-12-24"><span style="display: none;"> </span></span></span> </li> <li id="cite_note-13"><span class="mw-cite-backlink"><b><a href="#cite_ref-13">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1041539562" /><span class="citation patent" id="CITEREFWeimer1966"><a rel="nofollow" class="external text" href="https://patents.google.com/patent/US3258663A/en">US3258663A</a>, Weimer, Paul, "Solid state device with gate electrode on thin insulative film", issued 1966-06-28</span><span class="Z3988" title="ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.number=US3258663A&rft.cc=&rft.title=Solid+state+device+with+gate+electrode+on%0Athin+insulative+film&rft.inventor=Weimer&rft.date=1966-06-28"><span style="display: none;"> </span></span></span> </li> <li id="cite_note-14"><span class="mw-cite-backlink"><b><a href="#cite_ref-14">^</a></b></span> <span class="reference-text"><link rel="mw-deduplicated-inline-style" href="mw-data:TemplateStyles:r1238218222" /><cite id="CITEREFKahngSze1967" class="citation journal cs1"><a href="/wiki/Dawon_Kahng" title="Dawon Kahng">Kahng, Dawon</a>; <a href="/wiki/Simon_Sze" title="Simon Sze">Sze, Simon Min</a> (1967). 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Low Power and Low Voltage Circuit Design with the FGMOS Transistor</span> </li> </ol></div></div> <div class="mw-heading mw-heading2"><h2 id="External_links">External links</h2><span class="mw-editsection"><span class="mw-editsection-bracket">[</span><a href="/w/index.php?title=Floating-gate_MOSFET&action=edit&section=10" title="Edit section: External links"><span>edit</span></a><span class="mw-editsection-bracket">]</span></span></div> <ul><li><a rel="nofollow" class="external text" href="https://web.archive.org/web/20110105165103/http://etd.gatech.edu/theses/available/etd-08062006-001021/unrestricted/ozalevli_erhan_200612_phd.pdf">EXPLOITING FLOATING-GATE TRANSISTOR PROPERTIES IN ANALOG AND MIXED-SIGNAL CIRCUIT DESIGN</a></li> <li><a rel="nofollow" class="external text" href="http://computer.howstuffworks.com/rom4.htm">Howstuffworks "How ROM Works"</a></li> <li><a rel="nofollow" class="external text" href="http://www.cs.washington.edu/homes/diorio/Publications/CoAuthConfPapers/PaulHasler/Floatgate_dev.pdf">Floating Gate Devices</a></li> <li><a rel="nofollow" class="external text" href="https://www.amazon.com/dp/3639134109">FLOATING-GATE TRANSISTORS IN ANALOG AND MIXED-SIGNAL CIRCUIT DESIGN</a></li> <li><a rel="nofollow" class="external text" href="https://www.amazon.com/dp/3836441772">Tunable and reconfigurable circuits using floating-gate transistors</a></li></ul> <!-- NewPP limit report Parsed by mw‐api‐ext.codfw.next‐54c599c98‐pmr4d Cached time: 20250308150822 Cache expiry: 2592000 Reduced expiry: false Complications: [vary‐revision‐sha1, show‐toc] CPU time usage: 0.262 seconds Real time usage: 0.403 seconds Preprocessor visited node count: 3678/1000000 Post‐expand include size: 36622/2097152 bytes Template argument size: 6044/2097152 bytes Highest expansion depth: 13/100 Expensive parser function count: 2/500 Unstrip recursion depth: 1/20 Unstrip post‐expand size: 51543/5000000 bytes Lua time usage: 0.141/10.000 seconds Lua memory usage: 5919691/52428800 bytes Number of Wikibase entities loaded: 0/400 --> <!-- Transclusion expansion time report (%,ms,calls,template) 100.00% 268.709 1 -total 66.43% 178.511 1 Template:Reflist 36.44% 97.912 5 Template:Cite_journal 19.82% 53.252 1 Template:Short_description 11.68% 31.387 2 Template:Pagetype 11.17% 30.007 7 Template:Cite_patent 10.47% 28.132 1 Template:Clarify 8.88% 23.867 1 Template:Fix-span 7.18% 19.305 7 Template:Cite_patent/core 5.91% 15.888 2 Template:Category_handler --> <!-- Saved in parser cache with key enwiki:pcache:6241465:|#|:idhash:canonical and timestamp 20250308150823 and revision id 1279431649. 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