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level reliability (FWLR)</title> <meta name="description" content="Search results for: fast wafer level reliability (FWLR)"> <meta name="keywords" content="fast wafer level reliability (FWLR)"> <meta name="viewport" content="width=device-width, initial-scale=1, minimum-scale=1, maximum-scale=1, user-scalable=no"> <meta charset="utf-8"> <link href="https://cdn.waset.org/favicon.ico" type="image/x-icon" rel="shortcut icon"> <link href="https://cdn.waset.org/static/plugins/bootstrap-4.2.1/css/bootstrap.min.css" rel="stylesheet"> <link href="https://cdn.waset.org/static/plugins/fontawesome/css/all.min.css" rel="stylesheet"> <link href="https://cdn.waset.org/static/css/site.css?v=150220211555" rel="stylesheet"> </head> <body> <header> <div class="container"> <nav class="navbar navbar-expand-lg navbar-light"> <a class="navbar-brand" href="https://waset.org"> <img src="https://cdn.waset.org/static/images/wasetc.png" alt="Open Science Research Excellence" title="Open Science Research 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method="get" action="https://publications.waset.org/abstracts/search"> <div id="custom-search-input"> <div class="input-group"> <i class="fas fa-search"></i> <input type="text" class="search-query" name="q" placeholder="Author, Title, Abstract, Keywords" value="fast wafer level reliability (FWLR)"> <input type="submit" class="btn_search" value="Search"> </div> </div> </form> </div> </div> <div class="row mt-3"> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Commenced</strong> in January 2007</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Frequency:</strong> Monthly</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Edition:</strong> International</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Paper Count:</strong> 15871</div> </div> </div> </div> <h1 class="mt-3 mb-3 text-center" style="font-size:1.6rem;">Search results for: fast wafer level reliability (FWLR)</h1> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15871</span> Influence of Measurement System on Negative Bias Temperature Instability Characterization: Fast BTI vs Conventional BTI vs Fast Wafer Level Reliability</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Vincent%20King%20Soon%20Wong">Vincent King Soon Wong</a>, <a href="https://publications.waset.org/abstracts/search?q=Hong%20Seng%20Ng"> Hong Seng Ng</a>, <a href="https://publications.waset.org/abstracts/search?q=Florinna%20Sim"> Florinna Sim</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Negative Bias Temperature Instability (NBTI) is one of the critical degradation mechanisms in semiconductor device reliability that causes shift in the threshold voltage (Vth). However, thorough understanding of this reliability failure mechanism is still unachievable due to a recovery characteristic known as NBTI recovery. This paper will demonstrate the severity of NBTI recovery as well as one of the effective methods used to mitigate, which is the minimization of measurement system delays. Comparison was done in between two measurement systems that have significant differences in measurement delays to show how NBTI recovery causes result deviations and how fast measurement systems can mitigate NBTI recovery. Another method to minimize NBTI recovery without the influence of measurement system known as Fast Wafer Level Reliability (FWLR) NBTI was also done to be used as reference. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=fast%20vs%20slow%20BTI" title="fast vs slow BTI">fast vs slow BTI</a>, <a href="https://publications.waset.org/abstracts/search?q=fast%20wafer%20level%20reliability%20%28FWLR%29" title=" fast wafer level reliability (FWLR)"> fast wafer level reliability (FWLR)</a>, <a href="https://publications.waset.org/abstracts/search?q=negative%20bias%20temperature%20instability%20%28NBTI%29" title=" negative bias temperature instability (NBTI)"> negative bias temperature instability (NBTI)</a>, <a href="https://publications.waset.org/abstracts/search?q=NBTI%20measurement%20system" title=" NBTI measurement system"> NBTI measurement system</a>, <a href="https://publications.waset.org/abstracts/search?q=metal-oxide-semiconductor%20field-effect%20transistor%20%28MOSFET%29" title=" metal-oxide-semiconductor field-effect transistor (MOSFET)"> metal-oxide-semiconductor field-effect transistor (MOSFET)</a>, <a href="https://publications.waset.org/abstracts/search?q=NBTI%20recovery" title=" NBTI recovery"> NBTI recovery</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability" title=" reliability"> reliability</a> </p> <a href="https://publications.waset.org/abstracts/61786/influence-of-measurement-system-on-negative-bias-temperature-instability-characterization-fast-bti-vs-conventional-bti-vs-fast-wafer-level-reliability" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/61786.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">426</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15870</span> The Grinding Influence on the Strength of Fan-Out Wafer-Level Packages</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Z.%20W.%20Zhong">Z. W. Zhong</a>, <a href="https://publications.waset.org/abstracts/search?q=C.%20Xu"> C. Xu</a>, <a href="https://publications.waset.org/abstracts/search?q=W.%20K.%20Choi"> W. K. Choi</a> </p> <p class="card-text"><strong>Abstract:</strong></p> To build a thin fan-out wafer-level package, the package had to be ground to a thin level. In this work, the influence of the grinding processes on the strength of the fan-out wafer-level packages was investigated. After different grinding processes, all specimens were placed on a three-point-bending fixture installed on a universal tester for three-point-bending testing, and the strength of the fan-out wafer-level packages was measured. The experiments revealed that the average flexure strength increased with the decreasing surface roughness height of the fan-out wafer-level package tested. The grinding processes had a significant influence on the strength of the fan-out wafer-level packages investigated. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=FOWLP%20strength" title="FOWLP strength">FOWLP strength</a>, <a href="https://publications.waset.org/abstracts/search?q=surface%20roughness" title=" surface roughness"> surface roughness</a>, <a href="https://publications.waset.org/abstracts/search?q=three-point%20bending" title=" three-point bending"> three-point bending</a>, <a href="https://publications.waset.org/abstracts/search?q=grinding" title=" grinding"> grinding</a> </p> <a href="https://publications.waset.org/abstracts/91441/the-grinding-influence-on-the-strength-of-fan-out-wafer-level-packages" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/91441.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">278</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15869</span> Mechanical Response Investigation of Wafer Probing Test with Vertical Cobra Probe via the Experiment and Transient Dynamic Simulation</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=De-Shin%20Liu">De-Shin Liu</a>, <a href="https://publications.waset.org/abstracts/search?q=Po-Chun%20Wen"> Po-Chun Wen</a>, <a href="https://publications.waset.org/abstracts/search?q=Zhen-Wei%20Zhuang"> Zhen-Wei Zhuang</a>, <a href="https://publications.waset.org/abstracts/search?q=Hsueh-Chih%20Liu"> Hsueh-Chih Liu</a>, <a href="https://publications.waset.org/abstracts/search?q=Pei-Chen%20Huang"> Pei-Chen Huang</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Wafer probing tests play an important role in semiconductor manufacturing procedures in accordance with the yield and reliability requirement of the wafer after the backend-of-the-line process. Accordingly, the stable physical and electrical contact between the probe and the tested wafer during wafer probing is regarded as an essential issue in identifying the known good die. The probe card can be integrated with multiple probe needles, which are classified as vertical, cantilever and micro-electro-mechanical systems type probe selections. Among all potential probe types, the vertical probe has several advantages as compared with other probe types, including maintainability, high probe density and feasibility for high-speed wafer testing. In the present study, the mechanical response of the wafer probing test with the vertical cobra probe on 720 μm thick silicon (Si) substrate with a 1.4 μm thick aluminum (Al) pad is investigated by the experiment and transient dynamic simulation approach. Because the deformation mechanism of the vertical cobra probe is determined by both bending and buckling mechanisms, the stable correlation between contact forces and overdrive (OD) length must be carefully verified. Moreover, the decent OD length with corresponding contact force contributed to piercing the native oxide layer of the Al pad and preventing the probing test-induced damage on the interconnect system. Accordingly, the scratch depth of the Al pad under various OD lengths is estimated by the atomic force microscope (AFM) and simulation work. In the wafer probing test configuration, the contact phenomenon between the probe needle and the tested object introduced large deformation and twisting of mesh gridding, causing the subsequent numerical divergence issue. For this reason, the arbitrary Lagrangian-Eulerian method is utilized in the present simulation work to conquer the aforementioned issue. The analytic results revealed a slight difference when the OD is considered as 40 μm, and the simulated is almost identical to the measured scratch depths of the Al pad under higher OD lengths up to 70 μm. This phenomenon can be attributed to the unstable contact of the probe at low OD length with the scratch depth below 30% of Al pad thickness, and the contact status will be being stable when the scratch depth over 30% of pad thickness. The splash of the Al pad is observed by the AFM, and the splashed Al debris accumulates on a specific side; this phenomenon is successfully simulated in the transient dynamic simulation. Thus, the preferred testing OD lengths are found as 45 μm to 70 μm, and the corresponding scratch depths on the Al pad are represented as 31.4% and 47.1% of Al pad thickness, respectively. The investigation approach demonstrated in this study contributed to analyzing the mechanical response of wafer probing test configuration under large strain conditions and assessed the geometric designs and material selections of probe needles to meet the requirement of high resolution and high-speed wafer-level probing test for thinned wafer application. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=wafer%20probing%20test" title="wafer probing test">wafer probing test</a>, <a href="https://publications.waset.org/abstracts/search?q=vertical%20probe" title=" vertical probe"> vertical probe</a>, <a href="https://publications.waset.org/abstracts/search?q=probe%20mark" title=" probe mark"> probe mark</a>, <a href="https://publications.waset.org/abstracts/search?q=mechanical%20response" title=" mechanical response"> mechanical response</a>, <a href="https://publications.waset.org/abstracts/search?q=FEA%20simulation" title=" FEA simulation"> FEA simulation</a> </p> <a href="https://publications.waset.org/abstracts/179072/mechanical-response-investigation-of-wafer-probing-test-with-vertical-cobra-probe-via-the-experiment-and-transient-dynamic-simulation" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/179072.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">57</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15868</span> Optimal Designof Brush Roll for Semiconductor Wafer Using CFD Analysis</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Byeong-Sam%20Kim">Byeong-Sam Kim</a>, <a href="https://publications.waset.org/abstracts/search?q=Kyoungwoo%20Park"> Kyoungwoo Park</a> </p> <p class="card-text"><strong>Abstract:</strong></p> This research analyzes structure of flat panel display (FPD) such as LCD as quantitative through CFD analysis and modeling change to minimize the badness rate and rate of production decrease by damage of large scale plater at wafer heating chamber at semi-conductor manufacturing process. This glass panel and wafer device with atmospheric pressure or chemical vapor deposition equipment for transporting and transferring wafers, robot hands carry these longer and wider wafers can also be easily handled. As a contact handling system composed of several problems in increased potential for fracture or warping. A non-contact handling system is required to solve this problem. The panel and wafer warping makes it difficult to carry out conventional contact to analysis. We propose a new non-contact transportation system with combining air suction and blowout. The numerical analysis and experimental is, therefore, should be performed to obtain compared to results achieved with non-contact solutions. This wafer panel noncontact handler shows its strength in maintaining high cleanliness levels for semiconductor production processes. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=flat%20panel%20display" title="flat panel display">flat panel display</a>, <a href="https://publications.waset.org/abstracts/search?q=non%20contact%20transportation" title=" non contact transportation"> non contact transportation</a>, <a href="https://publications.waset.org/abstracts/search?q=heat%20treatment%20process" title=" heat treatment process"> heat treatment process</a>, <a href="https://publications.waset.org/abstracts/search?q=CFD%20analysis" title=" CFD analysis"> CFD analysis</a> </p> <a href="https://publications.waset.org/abstracts/23844/optimal-designof-brush-roll-for-semiconductor-wafer-using-cfd-analysis" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/23844.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">416</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15867</span> Property of Diamond Coated Tools for Lapping Single-Crystal Sapphire Wafer</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Feng%20Wei">Feng Wei</a>, <a href="https://publications.waset.org/abstracts/search?q=Lu%20Wenzhuang"> Lu Wenzhuang</a>, <a href="https://publications.waset.org/abstracts/search?q=Cai%20Wenjun"> Cai Wenjun</a>, <a href="https://publications.waset.org/abstracts/search?q=Yu%20Yaping"> Yu Yaping</a>, <a href="https://publications.waset.org/abstracts/search?q=Basnet%20Rabin"> Basnet Rabin</a>, <a href="https://publications.waset.org/abstracts/search?q=Zuo%20Dunwen"> Zuo Dunwen</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Diamond coatings were prepared on cemented carbide by hot filament chemical vapor deposition (HFCVD) method. Lapping experiment of single-crystal sapphire wafer was carried out using the prepared diamond coated tools. The diamond coatings and machined surface of the sapphire wafer were evaluated by SEM, laser confocal microscope and Raman spectrum. The results indicate that the lapping sapphire chips are small irregular debris and long thread-like debris. There is graphitization of diamond crystal during the lapping process. A low surface roughness can be obtained using a spherical grain diamond coated tool. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=lapping" title="lapping">lapping</a>, <a href="https://publications.waset.org/abstracts/search?q=nano-micro%20crystalline%20diamond%20coating" title=" nano-micro crystalline diamond coating"> nano-micro crystalline diamond coating</a>, <a href="https://publications.waset.org/abstracts/search?q=Raman%20spectrum" title=" Raman spectrum"> Raman spectrum</a>, <a href="https://publications.waset.org/abstracts/search?q=sapphire" title=" sapphire"> sapphire</a> </p> <a href="https://publications.waset.org/abstracts/21218/property-of-diamond-coated-tools-for-lapping-single-crystal-sapphire-wafer" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/21218.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">494</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15866</span> Hybrid Wind Solar Gas Reliability Optimization Using Harmony Search under Performance and Budget Constraints</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Meziane%20Rachid">Meziane Rachid</a>, <a href="https://publications.waset.org/abstracts/search?q=Boufala%20Seddik"> Boufala Seddik</a>, <a href="https://publications.waset.org/abstracts/search?q=Hamzi%20Amar"> Hamzi Amar</a>, <a href="https://publications.waset.org/abstracts/search?q=Amara%20Mohamed"> Amara Mohamed</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Today’s energy industry seeks maximum benefit with maximum reliability. In order to achieve this goal, design engineers depend on reliability optimization techniques. This work uses a harmony search algorithm (HS) meta-heuristic optimization method to solve the problem of wind-Solar-Gas power systems design optimization. We consider the case where redundant electrical components are chosen to achieve a desirable level of reliability. The electrical power components of the system are characterized by their cost, capacity and reliability. The reliability is considered in this work as the ability to satisfy the consumer demand which is represented as a piecewise cumulative load curve. This definition of the reliability index is widely used for power systems. The proposed meta-heuristic seeks for the optimal design of series-parallel power systems in which a multiple choice of wind generators, transformers and lines are allowed from a list of product available in the market. Our approach has the advantage to allow electrical power components with different parameters to be allocated in electrical power systems. To allow fast reliability estimation, a universal moment generating function (UMGF) method is applied. A computer program has been developed to implement the UMGF and the HS algorithm. An illustrative example is presented. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=reliability%20optimization" title="reliability optimization">reliability optimization</a>, <a href="https://publications.waset.org/abstracts/search?q=harmony%20search%20optimization%20%28HSA%29" title=" harmony search optimization (HSA)"> harmony search optimization (HSA)</a>, <a href="https://publications.waset.org/abstracts/search?q=universal%20generating%20function%20%28UMGF%29" title=" universal generating function (UMGF)"> universal generating function (UMGF)</a> </p> <a href="https://publications.waset.org/abstracts/11734/hybrid-wind-solar-gas-reliability-optimization-using-harmony-search-under-performance-and-budget-constraints" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/11734.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">576</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15865</span> Laser-Dicing Modeling: Implementation of a High Accuracy Tool for Laser-Grooving and Cutting Application</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Jeff%20Moussodji">Jeff Moussodji</a>, <a href="https://publications.waset.org/abstracts/search?q=Dominique%20Drouin"> Dominique Drouin</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The highly complex technology requirements of today’s integrated circuits (ICs), lead to the increased use of several materials types such as metal structures, brittle and porous low-k materials which are used in both front end of line (FEOL) and back end of line (BEOL) process for wafer manufacturing. In order to singulate chip from wafer, a critical laser-grooving process, prior to blade dicing, is used to remove these layers of materials out of the dicing street. The combination of laser-grooving and blade dicing allows to reduce the potential risk of induced mechanical defects such micro-cracks, chipping, on the wafer top surface where circuitry is located. It seems, therefore, essential to have a fundamental understanding of the physics involving laser-dicing in order to maximize control of these critical process and reduce their undesirable effects on process efficiency, quality, and reliability. In this paper, the study was based on the convergence of two approaches, numerical and experimental studies which allowed us to investigate the interaction of a nanosecond pulsed laser and BEOL wafer materials. To evaluate this interaction, several laser grooved samples were compared with finite element modeling, in which three different aspects; phase change, thermo-mechanical and optic sensitive parameters were considered. The mathematical model makes it possible to highlight a groove profile (depth, width, etc.) of a single pulse or multi-pulses on BEOL wafer material. Moreover, the heat affected zone, and thermo-mechanical stress can be also predicted as a function of laser operating parameters (power, frequency, spot size, defocus, speed, etc.). After modeling validation and calibration, a satisfying correlation between experiment and modeling, results have been observed in terms of groove depth, width and heat affected zone. The study proposed in this work is a first step toward implementing a quick assessment tool for design and debug of multiple laser grooving conditions with limited experiments on hardware in industrial application. More correlations and validation tests are in progress and will be included in the full paper. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=laser-dicing" title="laser-dicing">laser-dicing</a>, <a href="https://publications.waset.org/abstracts/search?q=nano-second%20pulsed%20laser" title=" nano-second pulsed laser"> nano-second pulsed laser</a>, <a href="https://publications.waset.org/abstracts/search?q=wafer%20multi-stack" title=" wafer multi-stack"> wafer multi-stack</a>, <a href="https://publications.waset.org/abstracts/search?q=multiphysics%20modeling" title=" multiphysics modeling"> multiphysics modeling</a> </p> <a href="https://publications.waset.org/abstracts/98144/laser-dicing-modeling-implementation-of-a-high-accuracy-tool-for-laser-grooving-and-cutting-application" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/98144.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">209</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15864</span> Two-Dimensional WO₃ and TiO₂ Semiconductor Oxides Developed by Atomic Layer Deposition with Controllable Nano-Thickness on Wafer-Scale</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=S.%20Zhuiykov">S. Zhuiykov</a>, <a href="https://publications.waset.org/abstracts/search?q=Z.%20Wei"> Z. Wei</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Conformal defect-free two-dimensional (2D) WO₃ and TiO₂ semiconductors have been developed by the atomic layer deposition (ALD) technique on wafer scale with unique approach to the thickness control with precision of ± 10% from the monolayer of nanomaterial (less than 1.0 nm thick) to the nano-layered 2D structures with thickness of ~3.0-7.0 nm. Developed 2D nanostructures exhibited unique, distinguishable properties at nanoscale compare to their thicker counterparts. Specifically, 2D TiO₂-Au bilayer demonstrated improved photocatalytic degradation of palmitic acid under UV and visible light illumination. Improved functional capabilities of 2D semiconductors would be advantageous to various environmental, nano-energy and bio-sensing applications. The ALD-enabled approach is proven to be versatile, scalable and applicable to the broader range of 2D semiconductors. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=two-dimensional%20%282D%29%20semiconductors" title="two-dimensional (2D) semiconductors">two-dimensional (2D) semiconductors</a>, <a href="https://publications.waset.org/abstracts/search?q=ALD" title=" ALD"> ALD</a>, <a href="https://publications.waset.org/abstracts/search?q=WO%E2%82%83" title=" WO₃"> WO₃</a>, <a href="https://publications.waset.org/abstracts/search?q=TiO%E2%82%82" title=" TiO₂"> TiO₂</a>, <a href="https://publications.waset.org/abstracts/search?q=wafer%20scale" title=" wafer scale"> wafer scale</a> </p> <a href="https://publications.waset.org/abstracts/78749/two-dimensional-wo3-and-tio2-semiconductor-oxides-developed-by-atomic-layer-deposition-with-controllable-nano-thickness-on-wafer-scale" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/78749.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">153</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15863</span> Optimization of Reliability Test Plans: Increase Wafer Fabrication Equipments Uptime</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Swajeeth%20Panchangam">Swajeeth Panchangam</a>, <a href="https://publications.waset.org/abstracts/search?q=Arun%20Rajendran"> Arun Rajendran</a>, <a href="https://publications.waset.org/abstracts/search?q=Swarnim%20Gupta"> Swarnim Gupta</a>, <a href="https://publications.waset.org/abstracts/search?q=Ahmed%20Zeouita"> Ahmed Zeouita</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Semiconductor processing chambers tend to operate in controlled but aggressive operating conditions (chemistry, plasma, high temperature etc.) Owing to this, the design of this equipment requires developing robust and reliable hardware and software. Any equipment downtime due to reliability issues can have cost implications both for customers in terms of tool downtime (reduced throughput) and for equipment manufacturers in terms of high warranty costs and customer trust deficit. A thorough reliability assessment of critical parts and a plan for preventive maintenance/replacement schedules need to be done before tool shipment. This helps to save significant warranty costs and tool downtimes in the field. However, designing a proper reliability test plan to accurately demonstrate reliability targets with proper sample size and test duration is quite challenging. This is mainly because components can fail in different failure modes that fit into different Weibull beta value distributions. Without apriori Weibull beta of a failure mode under consideration, it always leads to over/under utilization of resources, which eventually end up in false positives or false negatives estimates. This paper proposes a methodology to design a reliability test plan with optimal model size/duration/both (independent of apriori Weibull beta). This methodology can be used in demonstration tests and can be extended to accelerated life tests to further decrease sample size/test duration. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=reliability" title="reliability">reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=stochastics" title=" stochastics"> stochastics</a>, <a href="https://publications.waset.org/abstracts/search?q=preventive%20maintenance" title=" preventive maintenance"> preventive maintenance</a> </p> <a href="https://publications.waset.org/abstracts/192542/optimization-of-reliability-test-plans-increase-wafer-fabrication-equipments-uptime" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/192542.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">15</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15862</span> Development of 420 mm Diameter Silicon Crystal Growth Using Continuous Czochralski Process</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Ilsun%20Pang">Ilsun Pang</a>, <a href="https://publications.waset.org/abstracts/search?q=Kwanghun%20Kim"> Kwanghun Kim</a>, <a href="https://publications.waset.org/abstracts/search?q=Sungsun%20Baik"> Sungsun Baik </a> </p> <p class="card-text"><strong>Abstract:</strong></p> Large diameter Si wafer is used as semiconductor substrate. Large diameter Si crystal ingot should be needed in order to increase wafer size. To make convection of large silicon melt stable, magnetic field is normally applied, but magnetic field is expensive and it is not proper to stabilize the large Si melt. To solve the problem, we propose a continuous Czochralski process which can be applied to small melt without magnetic field. We used granule poly, which has size distribution of 1~3 mm and is easily supplied in double crucible during silicon ingot growth. As the result, we produced 420 mm diameter ingot. In this paper, we describe an experimental study on crystal growth of large diameter silicon by Continuous Czochralski process. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=Czochralski" title="Czochralski">Czochralski</a>, <a href="https://publications.waset.org/abstracts/search?q=ingot" title=" ingot"> ingot</a>, <a href="https://publications.waset.org/abstracts/search?q=silicon%20crystal" title=" silicon crystal"> silicon crystal</a>, <a href="https://publications.waset.org/abstracts/search?q=wafer" title=" wafer"> wafer</a> </p> <a href="https://publications.waset.org/abstracts/23956/development-of-420-mm-diameter-silicon-crystal-growth-using-continuous-czochralski-process" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/23956.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">450</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15861</span> Reliability Analysis in Power Distribution System</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=R.%20A.%20Deshpande">R. A. Deshpande</a>, <a href="https://publications.waset.org/abstracts/search?q=P.%20Chandhra%20Sekhar"> P. Chandhra Sekhar</a>, <a href="https://publications.waset.org/abstracts/search?q=V.%20Sankar"> V. Sankar</a> </p> <p class="card-text"><strong>Abstract:</strong></p> In this paper, we discussed the basic reliability evaluation techniques needed to evaluate the reliability of distribution systems which are applied in distribution system planning and operation. Basically, the reliability study can also help to predict the reliability performance of the system after quantifying the impact of adding new components to the system. The number and locations of new components needed to improve the reliability indices to certain limits are identified and studied. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=distribution%20system" title="distribution system">distribution system</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability%20indices" title=" reliability indices"> reliability indices</a>, <a href="https://publications.waset.org/abstracts/search?q=urban%20feeder" title=" urban feeder"> urban feeder</a>, <a href="https://publications.waset.org/abstracts/search?q=rural%20feeder" title=" rural feeder"> rural feeder</a> </p> <a href="https://publications.waset.org/abstracts/29954/reliability-analysis-in-power-distribution-system" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/29954.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">776</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15860</span> Study of Fork Marks on Sapphire Wafers in Plasma Enhanced Chemical Vapor Deposition Tool</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Qiao%20Pei%20Wen">Qiao Pei Wen</a>, <a href="https://publications.waset.org/abstracts/search?q=Ng%20Seng%20Lee"> Ng Seng Lee</a>, <a href="https://publications.waset.org/abstracts/search?q=Sae%20Tae%20Veera"> Sae Tae Veera</a>, <a href="https://publications.waset.org/abstracts/search?q=Chiu%20Ah%20Fong"> Chiu Ah Fong</a>, <a href="https://publications.waset.org/abstracts/search?q=Loke%20Weng%20Onn"> Loke Weng Onn</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Thin film thickness uniformity is crucial to get consistent film etch rate and device yield across the wafer. In the capacitive-coupled parallel plate PECVD system; the film thickness uniformity can be affected by many factors such as the heater temperature uniformity, the spacing between top and bottom electrode, RF power, pressure, gas flows and etc. In this paper, we studied how the PECVD SiN film thickness uniformity is affected by the substrate electrical conductivity and the RF power coupling efficiency. PECVD SiN film was deposited on 150-mm sapphire wafers in 200-mm Lam Sequel tool, fork marks were observed on the wafers. On the fork marks area SiN film thickness is thinner than that on the non-fork area. The forks are the wafer handler inside the process chamber to move the wafers from one station to another. The sapphire wafers and the ceramic forks both are insulator. The high resistivity of the sapphire wafers and the forks inhibits the RF power coupling efficiency during PECVD deposition, thereby reducing the deposition rate. Comparing between the high frequency and low frequency RF power (HFRF and LFRF respectively), the LFRF power coupling effect on the sapphire wafers is more dominant than the HFRF power on the film thickness. This paper demonstrated that the SiN thickness uniformity on sapphire wafers can be improved by depositing a thin TiW layer on the wafer before the SiN deposition. The TiW layer can be on the wafer surface, bottom or any layer before SiN deposition. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=PECVD%20SiN%20deposition" title="PECVD SiN deposition">PECVD SiN deposition</a>, <a href="https://publications.waset.org/abstracts/search?q=sapphire%20wafer" title=" sapphire wafer"> sapphire wafer</a>, <a href="https://publications.waset.org/abstracts/search?q=substrate%20electrical%20conductivity" title=" substrate electrical conductivity"> substrate electrical conductivity</a>, <a href="https://publications.waset.org/abstracts/search?q=RF%20power%20coupling" title=" RF power coupling"> RF power coupling</a>, <a href="https://publications.waset.org/abstracts/search?q=high%20frequency%20RF%20power" title=" high frequency RF power"> high frequency RF power</a>, <a href="https://publications.waset.org/abstracts/search?q=low%20frequency%20RF%20power" title=" low frequency RF power"> low frequency RF power</a>, <a href="https://publications.waset.org/abstracts/search?q=film%20deposition%20rate" title=" film deposition rate"> film deposition rate</a>, <a href="https://publications.waset.org/abstracts/search?q=thickness%20uniformity" title=" thickness uniformity"> thickness uniformity</a> </p> <a href="https://publications.waset.org/abstracts/36353/study-of-fork-marks-on-sapphire-wafers-in-plasma-enhanced-chemical-vapor-deposition-tool" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/36353.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">376</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15859</span> Operation Strategy of Multi-Energy Storage System Considering Power System Reliability </h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Wook-Won%20Kim">Wook-Won Kim</a>, <a href="https://publications.waset.org/abstracts/search?q=Je-Seok%20Shin"> Je-Seok Shin</a>, <a href="https://publications.waset.org/abstracts/search?q=Jin-O%20Kim"> Jin-O Kim</a> </p> <p class="card-text"><strong>Abstract:</strong></p> As the penetration of Energy Storage System (ESS) increases in the power system due to higher performance and lower cost than ever, ESS is expanding its role to the ancillary service as well as the storage of extra energy from the intermittent renewable energy resources. For multi-ESS with different capacity and SOC level each other, it is required to make the optimal schedule of SOC level use the multi-ESS effectively. This paper proposes the energy allocation method for the multiple battery ESS with reliability constraint, in order to make the ESS discharge the required energy as long as possible. A simple but effective method is proposed in this paper, to satisfy the power for the spinning reserve requirement while improving the system reliability. Modelling of ESS is also proposed, and reliability is evaluated by using the combined reliability model which includes the proposed ESS model and conventional generation one. In the case study, it can be observed that the required power is distributed to each ESS adequately and accordingly, the SOC is scheduled to improve the reliability indices such as Loss of Load Probability (LOLP) and Loss of Load Expectation (LOLE). <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=multiple%20energy%20storage%20system%20%28MESS%29" title="multiple energy storage system (MESS)">multiple energy storage system (MESS)</a>, <a href="https://publications.waset.org/abstracts/search?q=energy%20allocation%20method" title=" energy allocation method"> energy allocation method</a>, <a href="https://publications.waset.org/abstracts/search?q=SOC%20schedule" title=" SOC schedule"> SOC schedule</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability%20constraints" title=" reliability constraints"> reliability constraints</a> </p> <a href="https://publications.waset.org/abstracts/48673/operation-strategy-of-multi-energy-storage-system-considering-power-system-reliability" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/48673.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">368</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15858</span> Reliability-Based Codified Design of Concrete Structures</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Naser%20Alenezi">Naser Alenezi</a>, <a href="https://publications.waset.org/abstracts/search?q=Ibrahim%20Alsakkaf"> Ibrahim Alsakkaf</a>, <a href="https://publications.waset.org/abstracts/search?q=Osama%20Eid"> Osama Eid </a> </p> <p class="card-text"><strong>Abstract:</strong></p> The main objective of this study is to develop an independent reliability based code for reinforced concrete (R/C) structural components and elements solely for the State of Kuwait and its neighboring countries. The proposed code will take into account the harsh Kuwait’s harsh environment, loading conditions and material strengths. The method for developing such a code is based on structural reliability theory that takes into accounts the specific geographical and the various prescribed societal environment of the Kuwait region. These methods were developed according to the following four components: (1) loads, (2) structural strength, (3) reliability analysis, and (4) achieving target reliability levels (reliability index ’s ). The final product from this study will be a design code for R/C structural elements that include beams and columns, and some other structural members. This reliability-based LRFD design code will provide appropriate, easy, fast, and economical approach for designing R/C structural elements such as, beams and columns, for both houses and bridges, and other concrete structures. In addition, this reliability-based codified design of R/C beams, columns, and, possibly, concrete slabs will improve the design and serviceability of R/C bridge and building systems in Kuwait and neighboring GCC countries. Also, it has the potential to reduce the cost of new concrete structures, as fewer materials are used with more design efficiency. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=live%20laod" title="live laod">live laod</a>, <a href="https://publications.waset.org/abstracts/search?q=design" title=" design"> design</a>, <a href="https://publications.waset.org/abstracts/search?q=evaluation" title=" evaluation"> evaluation</a>, <a href="https://publications.waset.org/abstracts/search?q=structural%20building" title=" structural building"> structural building</a> </p> <a href="https://publications.waset.org/abstracts/34927/reliability-based-codified-design-of-concrete-structures" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/34927.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">346</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15857</span> A Spatial Point Pattern Analysis to Recognize Fail Bit Patterns in Semiconductor Manufacturing</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Youngji%20Yoo">Youngji Yoo</a>, <a href="https://publications.waset.org/abstracts/search?q=Seung%20Hwan%20Park"> Seung Hwan Park</a>, <a href="https://publications.waset.org/abstracts/search?q=Daewoong%20An"> Daewoong An</a>, <a href="https://publications.waset.org/abstracts/search?q=Sung-Shick%20Kim"> Sung-Shick Kim</a>, <a href="https://publications.waset.org/abstracts/search?q=Jun-Geol%20Baek"> Jun-Geol Baek</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The yield management system is very important to produce high-quality semiconductor chips in the semiconductor manufacturing process. In order to improve quality of semiconductors, various tests are conducted in the post fabrication (FAB) process. During the test process, large amount of data are collected and the data includes a lot of information about defect. In general, the defect on the wafer is the main causes of yield loss. Therefore, analyzing the defect data is necessary to improve performance of yield prediction. The wafer bin map (WBM) is one of the data collected in the test process and includes defect information such as the fail bit patterns. The fail bit has characteristics of spatial point patterns. Therefore, this paper proposes the feature extraction method using the spatial point pattern analysis. Actual data obtained from the semiconductor process is used for experiments and the experimental result shows that the proposed method is more accurately recognize the fail bit patterns. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=semiconductor" title="semiconductor">semiconductor</a>, <a href="https://publications.waset.org/abstracts/search?q=wafer%20bin%20map" title=" wafer bin map"> wafer bin map</a>, <a href="https://publications.waset.org/abstracts/search?q=feature%20extraction" title=" feature extraction"> feature extraction</a>, <a href="https://publications.waset.org/abstracts/search?q=spatial%20point%20patterns" title=" spatial point patterns"> spatial point patterns</a>, <a href="https://publications.waset.org/abstracts/search?q=contour%20map" title=" contour map"> contour map</a> </p> <a href="https://publications.waset.org/abstracts/5010/a-spatial-point-pattern-analysis-to-recognize-fail-bit-patterns-in-semiconductor-manufacturing" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/5010.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">384</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15856</span> Structural Reliability Analysis Using Extreme Learning Machine</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Mehul%20Srivastava">Mehul Srivastava</a>, <a href="https://publications.waset.org/abstracts/search?q=Sharma%20Tushar%20Ravikant"> Sharma Tushar Ravikant</a>, <a href="https://publications.waset.org/abstracts/search?q=Mridul%20Krishn%20Mishra"> Mridul Krishn Mishra</a> </p> <p class="card-text"><strong>Abstract:</strong></p> In structural design, the evaluation of safety and probability failure of structure is of significant importance, mainly when the variables are random. On real structures, structural reliability can be evaluated obtaining an implicit limit state function. The structural reliability limit state function is obtained depending upon the statistically independent variables. In the analysis of reliability, we considered the statistically independent random variables to be the load intensity applied and the depth or height of the beam member considered. There are many approaches for structural reliability problems. In this paper Extreme Learning Machine technique and First Order Second Moment Method is used to determine the reliability indices for the same set of variables. The reliability index obtained using ELM is compared with the reliability index obtained using FOSM. Higher the reliability index, more feasible is the method to determine the reliability. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=reliability" title="reliability">reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability%20index" title=" reliability index"> reliability index</a>, <a href="https://publications.waset.org/abstracts/search?q=statistically%20independent" title=" statistically independent"> statistically independent</a>, <a href="https://publications.waset.org/abstracts/search?q=extreme%20learning%20machine" title=" extreme learning machine"> extreme learning machine</a> </p> <a href="https://publications.waset.org/abstracts/21683/structural-reliability-analysis-using-extreme-learning-machine" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/21683.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">682</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15855</span> The Characterisation of TLC NAND Flash Memory, Leading to a Definable Endurance/Retention Trade-Off</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Sorcha%20Bennett">Sorcha Bennett</a>, <a href="https://publications.waset.org/abstracts/search?q=Joe%20Sullivan"> Joe Sullivan</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Triple-Level Cell (TLC) NAND Flash memory at, and below, 20nm (nanometer) is still largely unexplored by researchers, and with the ever more commonplace existence of Flash in consumer and enterprise applications there is a need for such gaps in knowledge to be filled. At the time of writing, there was little published data or literature on TLC, and more specifically reliability testing, with a further emphasis on both endurance and retention. This paper will give an introduction to NAND Flash memory, followed by an overview of the relevant current research on the reliability of Flash memory, along with the planned future work which will provide results to help characterise the reliability of TLC memory. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=endurance" title="endurance">endurance</a>, <a href="https://publications.waset.org/abstracts/search?q=patterns" title=" patterns"> patterns</a>, <a href="https://publications.waset.org/abstracts/search?q=raw%20flash" title=" raw flash"> raw flash</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability" title=" reliability"> reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=retention" title=" retention"> retention</a>, <a href="https://publications.waset.org/abstracts/search?q=TLC%20NAND%20flash%20memory" title=" TLC NAND flash memory"> TLC NAND flash memory</a>, <a href="https://publications.waset.org/abstracts/search?q=trade-off" title=" trade-off"> trade-off</a> </p> <a href="https://publications.waset.org/abstracts/45350/the-characterisation-of-tlc-nand-flash-memory-leading-to-a-definable-enduranceretention-trade-off" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/45350.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">359</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15854</span> Series-Parallel Systems Reliability Optimization Using Genetic Algorithm and Statistical Analysis</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Essa%20Abrahim%20Abdulgader%20Saleem">Essa Abrahim Abdulgader Saleem</a>, <a href="https://publications.waset.org/abstracts/search?q=Thien-My%20Dao"> Thien-My Dao</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The main objective of this paper is to optimize series-parallel system reliability using Genetic Algorithm (GA) and statistical analysis; considering system reliability constraints which involve the redundant numbers of selected components, total cost, and total weight. To perform this work, firstly the mathematical model which maximizes system reliability subject to maximum system cost and maximum system weight constraints is presented; secondly, a statistical analysis is used to optimize GA parameters, and thirdly GA is used to optimize series-parallel systems reliability. The objective is to determine the strategy choosing the redundancy level for each subsystem to maximize the overall system reliability subject to total cost and total weight constraints. Finally, the series-parallel system case study reliability optimization results are showed, and comparisons with the other previous results are presented to demonstrate the performance of our GA. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=reliability" title="reliability">reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=optimization" title=" optimization"> optimization</a>, <a href="https://publications.waset.org/abstracts/search?q=meta-heuristic" title=" meta-heuristic"> meta-heuristic</a>, <a href="https://publications.waset.org/abstracts/search?q=genetic%20algorithm" title=" genetic algorithm"> genetic algorithm</a>, <a href="https://publications.waset.org/abstracts/search?q=redundancy" title=" redundancy"> redundancy</a> </p> <a href="https://publications.waset.org/abstracts/55689/series-parallel-systems-reliability-optimization-using-genetic-algorithm-and-statistical-analysis" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/55689.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">337</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15853</span> Controlled Nano Texturing in Silicon Wafer for Excellent Optical and Photovoltaic Properties</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Deb%20Kumar%20Shah">Deb Kumar Shah</a>, <a href="https://publications.waset.org/abstracts/search?q=M.%20Shaheer%20Akhtar"> M. Shaheer Akhtar</a>, <a href="https://publications.waset.org/abstracts/search?q=Ha%20Ryeon%20Lee"> Ha Ryeon Lee</a>, <a href="https://publications.waset.org/abstracts/search?q=O-Bong%20Yang"> O-Bong Yang</a>, <a href="https://publications.waset.org/abstracts/search?q=Chong%20Yeal%20Kim"> Chong Yeal Kim</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The crystalline silicon (Si) solar cells are highly renowned photovoltaic technology and well-established as the commercial solar technology. Most of the solar panels are globally installed with the crystalline Si solar modules. At the present scenario, the major photovoltaic (PV) market is shared by c-Si solar cells, but the cost of c-Si panels are still very high as compared with the other PV technology. In order to reduce the cost of Si solar panels, few necessary steps such as low-cost Si manufacturing, cheap antireflection coating materials, inexpensive solar panel manufacturing are to be considered. It is known that the antireflection (AR) layer in c-Si solar cell is an important component to reduce Fresnel reflection for improving the overall conversion efficiency. Generally, Si wafer exhibits the 30% reflection because it normally poses the two major intrinsic drawbacks such as; the spectral mismatch loss and the high Fresnel reflection loss due to the high contrast of refractive indices between air and silicon wafer. In recent years, researchers and scientists are highly devoted to a lot of researches in the field of searching effective and low-cost AR materials. Silicon nitride (SiNx) is well-known AR materials in commercial c-Si solar cells due to its good deposition and interaction with passivated Si surfaces. However, the deposition of SiNx AR is usually performed by expensive plasma enhanced chemical vapor deposition (PECVD) process which could have several demerits like difficult handling and damaging the Si substrate by plasma when secondary electrons collide with the wafer surface for AR coating. It is very important to explore new, low cost and effective AR deposition process to cut the manufacturing cost of c-Si solar cells. One can also be realized that a nano-texturing process like the growth of nanowires, nanorods, nanopyramids, nanopillars, etc. on Si wafer can provide a low reflection on the surface of Si wafer based solar cells. The above nanostructures might be enhanced the antireflection property which provides the larger surface area and effective light trapping. In this work, we report on the development of crystalline Si solar cells without using the AR layer. The Silicon wafer was modified by growing nanowires like Si nanostructures using the wet controlled etching method and directly used for the fabrication of Si solar cell without AR. The nanostructures over Si wafer were optimized in terms of sizes, lengths, and densities by changing the etching conditions. Well-defined and aligned wires like structures were achieved when the etching time is 20 to 30 min. The prepared Si nanostructured displayed the minimum reflectance ~1.64% at 850 nm with the average reflectance of ~2.25% in the wavelength range from 400-1000 nm. The nanostructured Si wafer based solar cells achieved the comparable power conversion efficiency in comparison with c-Si solar cells with SiNx AR layer. From this study, it is confirmed that the reported method (controlled wet etching) is an easy, facile method for preparation of nanostructured like wires on Si wafer with low reflectance in the whole visible region, which has greater prospects in developing c-Si solar cells without AR layer at low cost. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=chemical%20etching" title="chemical etching">chemical etching</a>, <a href="https://publications.waset.org/abstracts/search?q=conversion%20efficiency" title=" conversion efficiency"> conversion efficiency</a>, <a href="https://publications.waset.org/abstracts/search?q=silicon%20nanostructures" title=" silicon nanostructures"> silicon nanostructures</a>, <a href="https://publications.waset.org/abstracts/search?q=silicon%20solar%20cells" title=" silicon solar cells"> silicon solar cells</a>, <a href="https://publications.waset.org/abstracts/search?q=surface%20modification" title=" surface modification"> surface modification</a> </p> <a href="https://publications.waset.org/abstracts/109834/controlled-nano-texturing-in-silicon-wafer-for-excellent-optical-and-photovoltaic-properties" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/109834.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">125</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15852</span> Reliability of an Application for the System for Observing Play and Recreation in Communities in the Recreovia of Bucaramanga, Colombia</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Erika%20Tatiana%20Paredes%20Prada">Erika Tatiana Paredes Prada</a>, <a href="https://publications.waset.org/abstracts/search?q=Diana%20Marina%20Camargo%20Lemos"> Diana Marina Camargo Lemos</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Introduction: Recreovía as a public health strategy contributes to encourage the practice and adherence to physical activity (PA) recommendations, by temporarily closing the roads to motorized vehicles. The determination of the PA requires the evaluation of the reliability of the measurement instruments, in order to sustain the continuity and relevance of Recreovía as a community intervention. Objective: Establish the inter-rater reliability of the App for the System for Observing Play and Recreation in Communities (iSOPARC®) in the Recreovía of Bucaramanga, Colombia. Methods: Five trained observers at two observation points on the 2.3 km of the Recreovía (14th Street and 32nd Street) used the App (iSOPARC®), between 08:00 a.m. and 12:00 m. in periods of 20 minutes during a regular Sunday. Reliability analysis was performed using the Intraclass Correlation Coefficient (ICC 2.1). Results: A total of 2682 users were observed (43.6 % women) in 7 observations. ICC showed a range between 0.96 and 0.99 for the PA level and ICC between 0.95 and 0.99 for age group for the two observation points. Conclusion: The reliability found for the iSOPARC® guarantees the consecutive measurement of the PA level at the Recreovía, which will allow measuring it is effectiveness in the medium and long term, as a community intervention strategy. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=environment" title="environment">environment</a>, <a href="https://publications.waset.org/abstracts/search?q=observation" title=" observation"> observation</a>, <a href="https://publications.waset.org/abstracts/search?q=physical%20activity" title=" physical activity"> physical activity</a>, <a href="https://publications.waset.org/abstracts/search?q=recreation" title=" recreation"> recreation</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability" title=" reliability"> reliability</a> </p> <a href="https://publications.waset.org/abstracts/87017/reliability-of-an-application-for-the-system-for-observing-play-and-recreation-in-communities-in-the-recreovia-of-bucaramanga-colombia" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/87017.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">328</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15851</span> Multi-Objective Optimization of Combined System Reliability and Redundancy Allocation Problem</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Vijaya%20K.%20Srivastava">Vijaya K. Srivastava</a>, <a href="https://publications.waset.org/abstracts/search?q=Davide%20Spinello"> Davide Spinello</a> </p> <p class="card-text"><strong>Abstract:</strong></p> This paper presents established 3<strong><sup>n</sup></strong> enumeration procedure for mixed integer optimization problems for solving multi-objective reliability and redundancy allocation problem subject to design constraints. The formulated problem is to find the optimum level of unit reliability and the number of units for each subsystem. A number of illustrative examples are provided and compared to indicate the application of the superiority of the proposed method. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=integer%20programming" title="integer programming">integer programming</a>, <a href="https://publications.waset.org/abstracts/search?q=mixed%20integer%20programming" title=" mixed integer programming"> mixed integer programming</a>, <a href="https://publications.waset.org/abstracts/search?q=multi-objective%20optimization" title=" multi-objective optimization"> multi-objective optimization</a>, <a href="https://publications.waset.org/abstracts/search?q=Reliability%20Redundancy%20Allocation" title=" Reliability Redundancy Allocation"> Reliability Redundancy Allocation</a> </p> <a href="https://publications.waset.org/abstracts/107208/multi-objective-optimization-of-combined-system-reliability-and-redundancy-allocation-problem" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/107208.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">172</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15850</span> The Factors Predicting Credibility of News in Social Media in Thailand</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Ekapon%20Thienthaworn">Ekapon Thienthaworn</a> </p> <p class="card-text"><strong>Abstract:</strong></p> This research aims to study the reliability of the forecasting factor in social media by using survey research methods with questionnaires. The sampling is the group of undergraduate students in Bangkok. A multiple-step random number of 400 persons, data analysis are descriptive statistics with multivariate regression analysis. The research found the average of the overall trust at the intermediate level for reading the news in social media and the results of the multivariate regression analysis to find out the factors that forecast credibility of the media found the only content that has the power to forecast reliability of undergraduate students in Bangkok to reading the news on social media at the significance level.at 0.05.These can be factors with forecasts reliability of news in social media by a variable that has the highest influence factor of the media content and the speed is also important for reliability of the news. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=credibility%20of%20news" title="credibility of news">credibility of news</a>, <a href="https://publications.waset.org/abstracts/search?q=behaviors%20and%20attitudes" title=" behaviors and attitudes"> behaviors and attitudes</a>, <a href="https://publications.waset.org/abstracts/search?q=social%20media" title=" social media"> social media</a>, <a href="https://publications.waset.org/abstracts/search?q=web%20board" title=" web board"> web board</a> </p> <a href="https://publications.waset.org/abstracts/55587/the-factors-predicting-credibility-of-news-in-social-media-in-thailand" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/55587.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">468</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15849</span> Developing Fuzzy Logic Model for Reliability Estimation: Case Study</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Soroor%20K.%20H.%20Al-Khafaji">Soroor K. H. Al-Khafaji</a>, <a href="https://publications.waset.org/abstracts/search?q=Manal%20Mohammad%20Abed"> Manal Mohammad Abed</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The research aim of this paper is to evaluate the reliability of a complex engineering system and to design a fuzzy model for the reliability estimation. The designed model has been applied on Vegetable Oil Purification System (neutralization system) to help the specialist user based on the concept of FMEA (Failure Mode and Effect Analysis) to estimate the reliability of the repairable system at the vegetable oil industry. The fuzzy model has been used to predict the system reliability for a future time period, depending on a historical database for the two past years. The model can help to specify the system malfunctions and to predict its reliability during a future period in more accurate and reasonable results compared with the results obtained by the traditional method of reliability estimation. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=fuzzy%20logic" title="fuzzy logic">fuzzy logic</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability" title=" reliability"> reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=repairable%20systems" title=" repairable systems"> repairable systems</a>, <a href="https://publications.waset.org/abstracts/search?q=FMEA" title=" FMEA"> FMEA</a> </p> <a href="https://publications.waset.org/abstracts/11576/developing-fuzzy-logic-model-for-reliability-estimation-case-study" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/11576.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">614</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15848</span> The Determination of Operating Reserve in Small Power Systems Based on Reliability Criteria</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=H.%20Falsafi%20Falsafizadeh">H. Falsafi Falsafizadeh</a>, <a href="https://publications.waset.org/abstracts/search?q=R.%20Zeinali%20Zeinali"> R. Zeinali Zeinali</a> </p> <p class="card-text"><strong>Abstract:</strong></p> This paper focuses on determination of total Operating Reserve (OR) level, consisting of spinning and non-spinning reserves, in two small real power systems, in such a way that the system reliability indicator would comply with typical industry standards. For this purpose, the standard used by the North American Electric Reliability Corporation (NERC) – i.e., 1 day outage in 10 years or 0.1 days/year is relied. The simulation of system operation for these systems that was used for the determination of total operating reserve level was performed by industry standard production simulation software in this field, named PLEXOS. In this paper, the operating reserve which meets an annual Loss of Load Expectation (LOLE) of approximately 0.1 days per year is determined in the study year. This reserve is the minimum amount of reserve required in a power system and generally defined as a percentage of the annual peak. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=frequency%20control" title="frequency control">frequency control</a>, <a href="https://publications.waset.org/abstracts/search?q=LOLE" title=" LOLE"> LOLE</a>, <a href="https://publications.waset.org/abstracts/search?q=operating%20reserve" title=" operating reserve"> operating reserve</a>, <a href="https://publications.waset.org/abstracts/search?q=system%20reliability" title=" system reliability"> system reliability</a> </p> <a href="https://publications.waset.org/abstracts/67268/the-determination-of-operating-reserve-in-small-power-systems-based-on-reliability-criteria" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/67268.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">344</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15847</span> Presentation of the Model of Reliability of the Signaling System with Emphasis on Determining Best Time Schedule for Repairments and Preventive Maintenance in the Iranian Railway</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Maziar%20Yazdani">Maziar Yazdani</a>, <a href="https://publications.waset.org/abstracts/search?q=Ahmad%20Khodaee"> Ahmad Khodaee</a>, <a href="https://publications.waset.org/abstracts/search?q=Fatemeh%20Hajizadeh"> Fatemeh Hajizadeh</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The purpose of this research was analysis of the reliability of the signaling system in the railway and planning repair and maintenance of its subsystems. For this purpose, it will be endeavored to introduce practical strategies for activities control and appropriate planning for repair and preventive maintenance by statistical modeling of reliability. Therefore, modeling, evaluation, and promotion of reliability of the signaling system appear very critical. Among the key goals of the railway is provision of quality service for passengers and this purpose is gained by increasing reliability, availability, maintainability and safety of (RAMS). In this research, data were analyzed, and the reliability of the subsystems and entire system was calculated and with emphasis on preservation of performance of each of the subsystems with a reliability of 80%, a plan for repair and preventive maintenance of the subsystems of the signaling system was introduced. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=reliability" title="reliability">reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=modeling%20reliability" title=" modeling reliability"> modeling reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=plan%20for%20repair%20and%20preventive%20maintenance" title=" plan for repair and preventive maintenance"> plan for repair and preventive maintenance</a>, <a href="https://publications.waset.org/abstracts/search?q=signaling%20system" title=" signaling system"> signaling system</a> </p> <a href="https://publications.waset.org/abstracts/90078/presentation-of-the-model-of-reliability-of-the-signaling-system-with-emphasis-on-determining-best-time-schedule-for-repairments-and-preventive-maintenance-in-the-iranian-railway" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/90078.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">184</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15846</span> Analysis of Reliability of Mining Shovel Using Weibull Model</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Anurag%20Savarnya">Anurag Savarnya</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The reliability of the various parts of electric mining shovel has been assessed through the application of Weibull Model. The study was initiated to find reliability of components of electric mining shovel. The paper aims to optimize the reliability of components and increase the life cycle of component. A multilevel decomposition of the electric mining shovel was done and maintenance records were used to evaluate the failure data and appropriate system characterization was done to model the system in terms of reasonable number of components. The approach used develops a mathematical model to assess the reliability of the electric mining shovel components. The model can be used to predict reliability of components of the hydraulic mining shovel and system performance. Reliability is an inherent attribute to a system. When the life-cycle costs of a system are being analyzed, reliability plays an important role as a major driver of these costs and has considerable influence on system performance. It is an iterative process that begins with specification of reliability goals consistent with cost and performance objectives. The data were collected from an Indian open cast coal mine and the reliability of various components of the electric mining shovel has been assessed by following a Weibull Model. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=reliability" title="reliability">reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=Weibull%20model" title=" Weibull model"> Weibull model</a>, <a href="https://publications.waset.org/abstracts/search?q=electric%20mining%20shovel" title=" electric mining shovel"> electric mining shovel</a> </p> <a href="https://publications.waset.org/abstracts/8913/analysis-of-reliability-of-mining-shovel-using-weibull-model" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/8913.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">514</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15845</span> Software Reliability Prediction Model Analysis </h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Lela%20Mirtskhulava">Lela Mirtskhulava</a>, <a href="https://publications.waset.org/abstracts/search?q=Mariam%20Khunjgurua"> Mariam Khunjgurua</a>, <a href="https://publications.waset.org/abstracts/search?q=Nino%20Lomineishvili"> Nino Lomineishvili</a>, <a href="https://publications.waset.org/abstracts/search?q=Koba%20Bakuria"> Koba Bakuria</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Software reliability prediction gives a great opportunity to measure the software failure rate at any point throughout system test. A software reliability prediction model provides with the technique for improving reliability. Software reliability is very important factor for estimating overall system reliability, which depends on the individual component reliabilities. It differs from hardware reliability in that it reflects the design perfection. Main reason of software reliability problems is high complexity of software. Various approaches can be used to improve the reliability of software. We focus on software reliability model in this article, assuming that there is a time redundancy, the value of which (the number of repeated transmission of basic blocks) can be an optimization parameter. We consider given mathematical model in the assumption that in the system may occur not only irreversible failures, but also a failure that can be taken as self-repairing failures that significantly affect the reliability and accuracy of information transfer. Main task of the given paper is to find a time distribution function (DF) of instructions sequence transmission, which consists of random number of basic blocks. We consider the system software unreliable; the time between adjacent failures has exponential distribution. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=exponential%20distribution" title="exponential distribution">exponential distribution</a>, <a href="https://publications.waset.org/abstracts/search?q=conditional%20mean%20time%20to%20failure" title=" conditional mean time to failure"> conditional mean time to failure</a>, <a href="https://publications.waset.org/abstracts/search?q=distribution%20function" title=" distribution function"> distribution function</a>, <a href="https://publications.waset.org/abstracts/search?q=mathematical%20model" title=" mathematical model"> mathematical model</a>, <a href="https://publications.waset.org/abstracts/search?q=software%20reliability" title=" software reliability"> software reliability</a> </p> <a href="https://publications.waset.org/abstracts/5219/software-reliability-prediction-model-analysis" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/5219.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">464</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15844</span> Modeling and Simulation of Pad Surface Topography by Diamond Dressing in Chemical-Mechanical Polishing Process</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=A.Chen%20Chao-Chang">A.Chen Chao-Chang</a>, <a href="https://publications.waset.org/abstracts/search?q=Phong%20Pham-Quoc"> Phong Pham-Quoc</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Chemical-mechanical polishing (CMP) process has been widely applied on fabricating integrated circuits (IC) with a soft polishing pad combined with slurry composed of micron or nano-scaled abrasives for generating chemical reaction to remove substrate or film materials from wafer. During CMP process, pad uniformity usually works as a datum surface of wafer planarization and pad asperities can dominate the microscopic pad-slurry-wafer interaction. However, pad topography can be changed by related mechanism factors of CMP and it needs to be re-conditioned or dressed by a diamond dresser of well-distributed diamond grits on a disc surface. It is still very complicated to analyze and understand kinematic of diamond dressing process under the effects of input variables including oscillatory of diamond dresser and rotation speed ratio between the pad and the diamond dresser. This paper has developed a generic geometric model to clarify the kinematic modeling of diamond dressing processes such as dresser/pad motion, pad cutting locus, the relative velocity of the diamond abrasive grits on pad surface, and overlap of cutting for prediction of pad surface topography. Simulation results focus on comparing and analysis kinematics of the diamond dressing on certain CMP tools. Results have shown the significant parameters for diamond dressing process and also discussed. Future study can apply on diamond dresser design and experimental verification of pad dressing process. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=kinematic%20modeling" title="kinematic modeling">kinematic modeling</a>, <a href="https://publications.waset.org/abstracts/search?q=diamond%20dresser" title=" diamond dresser"> diamond dresser</a>, <a href="https://publications.waset.org/abstracts/search?q=pad%20cutting%20locus" title=" pad cutting locus"> pad cutting locus</a>, <a href="https://publications.waset.org/abstracts/search?q=CMP" title=" CMP"> CMP</a> </p> <a href="https://publications.waset.org/abstracts/50957/modeling-and-simulation-of-pad-surface-topography-by-diamond-dressing-in-chemical-mechanical-polishing-process" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/50957.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">255</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15843</span> Structural Reliability of Existing Structures: A Case Study</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Z.%20Sakka">Z. Sakka</a>, <a href="https://publications.waset.org/abstracts/search?q=I.%20Assakkaf"> I. Assakkaf</a>, <a href="https://publications.waset.org/abstracts/search?q=T.%20Al-Yaqoub"> T. Al-Yaqoub</a>, <a href="https://publications.waset.org/abstracts/search?q=J.%20Parol"> J. Parol</a> </p> <p class="card-text"><strong>Abstract:</strong></p> A reliability-based methodology for the analysis assessment and evaluation of reinforced concrete structural elements of concrete structures is presented herein. The results of the reliability analysis and assessment for structural elements are verified by the results obtained from the deterministic methods. The analysis outcomes of reliability-based analysis are compared against the safety limits of the required reliability index β according to international standards and codes. The methodology is based on probabilistic analysis using reliability concepts and statistics of the main random variables that are relevant to the subject matter, and for which they are to be used in the performance-function equation(s) related to the structural elements under study. These methodology techniques can result in reliability index β, which is commonly known as the reliability index or reliability measure value that can be utilized to assess and evaluate the safety, human risk, and functionality of the structural component. Also, these methods can result in revised partial safety factor values for certain target reliability indices that can be used for the purpose of redesigning the reinforced concrete elements of the building and in which they could assist in considering some other remedial actions to improve the safety and functionality of the member. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=structural%20reliability" title="structural reliability">structural reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=concrete%20structures" title=" concrete structures"> concrete structures</a>, <a href="https://publications.waset.org/abstracts/search?q=FORM" title=" FORM"> FORM</a>, <a href="https://publications.waset.org/abstracts/search?q=Monte%20Carlo%20simulation" title=" Monte Carlo simulation"> Monte Carlo simulation</a> </p> <a href="https://publications.waset.org/abstracts/13796/structural-reliability-of-existing-structures-a-case-study" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/13796.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">518</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15842</span> Effect of Correlation of Random Variables on Structural Reliability Index</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Agnieszka%20Dudzik">Agnieszka Dudzik</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The problem of correlation between random variables in the structural reliability analysis has been extensively discussed in literature on the subject. The cases taken under consideration were usually related to correlation between random variables from one side of ultimate limit state: correlation between particular loads applied on structure or correlation between resistance of particular members of a structure as a system. It has been proved that positive correlation between these random variables reduces the reliability of structure and increases the probability of failure. In the paper, the problem of correlation between random variables from both side of the limit state equation will be taken under consideration. The simplest case where these random variables are of the normal distributions will be concerned. The case when a degree of that correlation is described by the covariance or the coefficient of correlation will be used. Special attention will be paid on questions: how much that correlation changes the reliability level and can it be ignored. In reliability analysis will be used well-known methods for assessment of the failure probability: based on the Hasofer-Lind reliability index and Monte Carlo method adapted to the problem of correlation. The main purpose of this work will be a presentation how correlation of random variables influence on reliability index of steel bar structures. Structural design parameters will be defined as deterministic values and random variables. The latter will be correlated. The criterion of structural failure will be expressed by limit functions related to the ultimate and serviceability limit state. In the description of random variables will be used only for the normal distribution. Sensitivity of reliability index to the random variables will be defined. If the reliability index sensitivity due to the random variable X will be low when compared with other variables, it can be stated that the impact of this variable on failure probability is small. Therefore, in successive computations, it can be treated as a deterministic parameter. Sensitivity analysis leads to simplify the description of the mathematical model, determine the new limit functions and values of the Hasofer-Lind reliability index. In the examples, the NUMPRESS software will be used in the reliability analysis. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=correlation%20of%20random%20variables" title="correlation of random variables">correlation of random variables</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability%20index" title=" reliability index"> reliability index</a>, <a href="https://publications.waset.org/abstracts/search?q=sensitivity%20of%20reliability%20index" title=" sensitivity of reliability index"> sensitivity of reliability index</a>, <a href="https://publications.waset.org/abstracts/search?q=steel%20structure" title=" steel structure"> steel structure</a> </p> <a href="https://publications.waset.org/abstracts/95343/effect-of-correlation-of-random-variables-on-structural-reliability-index" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/95343.pdf" target="_blank" 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