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charset=utf-8"/> <title>Signal Integrity Engineer at Multitest to Present PCB Material Analysis at IEEE Semiconductor Workshop in San Diego | SEMI TAIWAN</title> <meta http-equiv="Content-Type" content="text/html; charset=utf-8"/> <link rel="shortcut icon" href="/web/20141112071652im_/http://www.semi.org/ch/sites/all/themes/semiorg/favicon.ico" type="image/x-icon"/> <meta name="description" content="Signal Integrity Engineer at Multitest to Present PCB Material Analysis at IEEE Semiconductor Workshop in San Diego"/> <link rel="canonical" href="https://web.archive.org/web/20141112071652/http://www.semi.org/ch/node/41936"/>  <meta property="og:image" content="https://web.archive.org/web/20141112071652im_/http://www.semi.org/en/sites/semi.org/files/images/SEMI_logo_share.jpg"/> <link type="text/css" rel="stylesheet" media="all" href="https://web.archive.org/web/20141112071652cs_/http://www.semi.org/ch/sites/semi.org/files/css/css_d6e4c4c007fa72bb1d7869d9711863ec.css"/> <link type="text/css" rel="stylesheet" media="print" href="https://web.archive.org/web/20141112071652cs_/http://www.semi.org/ch/sites/semi.org/files/css/css_365a81531babc14c098cb803cb2308a2.css"/> <script type="text/javascript" src="https://web.archive.org/web/20141112071652js_/http://www.semi.org/ch/sites/semi.org/files/js/js_aec135b9c76f3b30c9a481d1140d4005.js"></script> <script type="text/javascript"> <![CDATA[//><!]]> </script> <script type="text/javascript"> <![CDATA[//><!]]> </script> </head>  <body class="page not-front not-logged-in node-type-page no-sidebars page-node-41936 section-node page-panels"> <div class="semi"> <div id="page-wrapper"><div id="page"> <div id="header"><div class="section clearfix"> <a href="/web/20141112071652/http://www.semi.org/ch/" title="Home" rel="home" id="logo"> <img src="/web/20141112071652im_/http://www.semi.org/ch/sites/all/themes/semiorg/logo_semiorg.png" alt="Home"/></a> <div id="utility-nav"> <div class="region region-utility-nav"> <div id="block-menu-menu-member-link" class="block block-menu first region-odd odd region-count-1 count-3"> <div class="content"> <ul class="menu"><li class="leaf first last"><a href="/web/20141112071652/http://www.semi.org/ch/SEMIMemberOnly" id="link-member-resources">SEMI Members</a></li> </ul> </div> </div>  <div id="block-google_cse-0" class="block block-google_cse region-even even region-count-2 count-4"> <div class="content"> <form action="/web/20141112071652/http://www.semi.org/ch/search/google" accept-charset="UTF-8" method="get" id="google-cse-searchbox-form"> <div><input type="hidden" name="cx" id="edit-cx" value="002814452048722863797:apdw-y0-nyy"/> <input type="hidden" name="cof" id="edit-cof" value="FORID:11"/> <div class="form-item" id="edit-query-wrapper"> <input type="text" maxlength="128" name="query" id="edit-query" size="15" value="" title="Enter the terms you wish to search for." class="form-text"/> </div> <input type="submit" name="op" id="edit-sa" value="Search" class="form-submit"/> <input type="hidden" name="form_build_id" id="form-YErlwsQ6VO-xIQ_5EJNwW_y4Vx6QcLc29SwpRbnkLWg" value="form-YErlwsQ6VO-xIQ_5EJNwW_y4Vx6QcLc29SwpRbnkLWg"/> <input type="hidden" name="form_id" id="edit-google-cse-searchbox-form" value="google_cse_searchbox_form"/> </div></form> </div> </div>  <div id="block-menu-menu-menu-utility-nav" class="block block-menu last region-odd odd region-count-3 count-5"> <div class="content"> <ul class="menu"><li class="leaf first"><a href="https://web.archive.org/web/20141112071652/http://ams.semi.org/ebusiness/LoginWrapper.aspx">Log On</a></li> <li class="leaf last"><a href="/web/20141112071652/http://www.semi.org/ch/About/ContactUs">聯絡我們</a></li> </ul> </div> </div>  </div> </div> </div></div>  <div id="main-wrapper"><div id="main" class="clearfix with-navigation"> <div id="content" class="column"><div class="section">  <div id="content-area"> <div class="panel-display zen-two-sidebars clearfix"> <div class="panel-content"><div class="panel-content-inner inside panel-panel"> <div id="rightcorner"></div> <div class="panel-pane pane-node-content"> <h2 class="title">Signal Integrity Engineer at Multitest to Present PCB Material Analysis at IEEE Semiconductor Workshop in San Diego</h2> <div id="node-41936" class="node node-type-page build-mode-full clearfix"> <div class="content"> <p style="text-align: center;"><span style="font-size: large; color: #333399;"><b>Signal Integrity Engineer at Multitest to Present PCB Material Analysis at IEEE Semiconductor Workshop in San Diego</b></span></p><p style="text-align: center;"><span style="font-size: large; color: #333399;"><b><br/></b></span></p> <p><img src="/web/20141112071652im_/http://www.semi.org/ch/sites/semi.org/files/images/Mroczkowski-Jason.jpg" width="80" height="120" style="float: right; margin: 3px;"/>Rosenheim, Germany, May 2013: Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Jason Mroczkowski, Signal Integrity Engineer will present at the upcoming The IEEE Semiconductor Wafer Test Workshop in San Diego, CA. The presentation entitled, “High Frequency PCB Material Analysis,” is scheduled to take place Wednesday, June 12, 2013 from 10:30 – 11 a.m. </p> <p>The increasing operating frequency of many of today’s devices magnifies the importance of accurately characterizing the electrical performance of PCB materials used in test boards. Characterization not only ensures that the correct PCB materials are used for each application, but also that the performance is predictable.</p> <p>Over the past year, Multitest launched an extensive PCB materials characterization study.  The project scope included fabricating multiple PCBs from a dozen different PCB materials.  Each PCB included 50 Ω microstrip and stripline traces on various core thicknesses. Measurements evaluated dielectric constants, loss tangents, repeatability, surface roughness, and the effect of soldermask on performance. </p> <p>Results of the project have been presented previously, but little detail was provided regarding the analysis of those results. This presentation will focus on explaining the findings and describing the next steps required to improve high-frequency simulation and characterization.</p> <p><b>About Multitest</b></p> <p>Multitest (headquartered in Rosenheim, Germany) is one of the world’s leading manufacturers of test equipment for semiconductors. Multitest markets test handlers, contactors and ATE printed circuit boards. Multitest has more than 30 years of experience in the semiconductor industry, providing solutions to the automotive, consumer and communication but also to the sensor market. Globally, more than 900 employees serve the company’s customers in offices and branches in North America, Singapore, Malaysia, the Philippines, Taiwan, China and Thailand. </p> <p><b><a href="https://web.archive.org/web/20141112071652/http://www.multitest.com/">www.multitest.com</a> </b></p> </div> </div>  </div> </div></div>  <div class="panel-sidebar-first"><div class="panel-sidebar-first-inner inside panel-panel"> <div id="left-navigation" class="panel-pane pane-block pane-menu-primary-links"> <div class="pane-content"> <div id="submenu-tree-left"> <div class="menu_block_wrapper menu-block-1 menu-name-primary-links parent-mlid-0 menu-level-1"> <ul class="menu"><li class="expanded first menu-mlid-1656"><a href="/web/20141112071652/http://www.semi.org/ch/About">關於SEMI</a><ul class="menu"><li class="leaf first menu-mlid-1661"><a href="/web/20141112071652/http://www.semi.org/ch/About/Regions">全球據點</a></li> <li class="leaf menu-mlid-1666"><a 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