TY - JFULL AU - Le Chi Cuong PY - 2014/3/ TI - Development of Material Analyzing Software Using X-Ray Diffraction T2 - International Journal of Mechanical and Mechatronics Engineering SP - 463 EP - 467 VL - 8 SN - 1307-6892 UR - https://publications.waset.org/pdf/9997851 PU - World Academy of Science, Engineering and Technology NX - Open Science Index 86, 2014 N2 - X-ray diffraction is an effective mean for analyzing material properties. This paper developed a new computational software for determining the properties of crystalline materials such as elastic constants, residual stresses, surface hardness, phase components, and etc. The results computed from the X-ray diffraction method were compared to those from the traditional methods and they are in the 95% confidential limits, showing that the newly developed software has high reproducibility, opening a possibility of its commercialization. ER -