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class="grve-column-wrapper-inner"><div class="grve-element grve-box-icon grve-small grve-side-icon grve-align-left quick-link jssc-submission" style=""><a href="/publications/ieee-open-journal-of-the-solid-state-circuits-society/oj-sscs-submission/" title="OJ-SSCS Submission"><div class="grve-wrapper-icon grve-no-shape" style=""><i class="grve-text-primary-1 fas fa-edit"></i></div><div class="grve-box-content"><div class="grve-box-title-wrapper"><h3 class="grve-box-title grve-link-text">OJ-SSCS Submission</h3></div></div></a></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3 grve-tablet-column-1-2 grve-tablet-sm-column-1-2"><div class="grve-column-wrapper-inner"><div class="grve-element grve-box-icon grve-small grve-side-icon grve-align-left quick-link jssc-editorial-board" style=""><a href="/publications/ieee-open-journal-of-the-solid-state-circuits-society/oj-sscs-editorial-board/" title="OJ-SSCS Editorial Board"><div class="grve-wrapper-icon grve-no-shape" style=""><i class="grve-text-primary-1 fas fa-users"></i></div><div class="grve-box-content"><div class="grve-box-title-wrapper"><h3 class="grve-box-title grve-link-text">OJ-SSCS Editorial Board</h3></div></div></a></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3 grve-tablet-column-1-2 grve-tablet-sm-column-1-2"><div class="grve-column-wrapper-inner"><div class="grve-element grve-box-icon grve-small grve-side-icon grve-align-left quick-link jssc-special-issues" style=""><a href="/publications/ieee-open-journal-of-the-solid-state-circuits-society/special-issues/" title="Special Issues"><div class="grve-wrapper-icon grve-no-shape" style=""><i class="grve-text-primary-1 fas fa-book"></i></div><div class="grve-box-content"><div class="grve-box-title-wrapper"><h3 class="grve-box-title grve-link-text">Special Issues</h3></div></div></a></div></div></div></div></div></div></div></div><div class="grve-background-wrapper"><div class="grve-bg-image grve-bg-center-center grve-bg-image-id-1269" style="background-image: url(https://sscs.ieee.org/wp-content/uploads/circuit-bg-artwork_1920x620.png);"></div></div></div><div class="grve-section grve-row-section grve-fullwidth-background grve-padding-top-3x grve-padding-bottom-4x grve-bg-none"><div class="grve-container"><div class="grve-row grve-bookmark grve-columns-gap-30"><div class="grve-column wpb_column grve-column-2-3" ><div class="grve-column-wrapper" ><h3 class="grve-element grve-title grve-align-left grve-h5" style=""><span>Aims and Scope</span></h3><div class="grve-element grve-text"><p>The IEEE Open Journal of the Solid-State CircuitsSociety (OJ-SSCS) is a fully open access journal that publishes papers in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as systems design, novel technologies, circuit modeling, and testing in areas of importance for integrated circuit design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.</p><p>The OJ-SSCS Editorial Board also wants to foster publications in novel areas of integrated circuits design. For this reason, we will propose regularly special issues on relevant and timely topics.</p><p>Our extensive review process and high-quality manuscript standards identical to the subscription-based JSSC will allow authors to benefit from the 50 years of reputation build up by the Solid-State Circuits Society in integrated circuit design. Authors of open access papers published in the OJ-SSC will obtain an equally-valid appreciation by their peers, and their research will be exposed to 5 million unique monthly users of the IEEE <em>Xplore</em> Digital Library without paywalls.</p></div><h3 class="grve-element grve-title grve-align-left grve-h5" style=""><span>Open Access</span></h3><div class="grve-element grve-text"><p>This journal is 100% open access, which means that all content is freely available without charge to users or their institutions. All articles accepted after 12 June 2019 are published under a CC BY 4.0 license*, and the author retains copyright. Users are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, as long as proper attribution is given.</p><p>All open access articles will be published under either the Creative Commons Attribution License (CC BY) or the Creative Commons Attribution, NonCommercial, No Derivatives License (CCBY-NC-ND).</p><p>CC BY and CCBY-NC-ND allow authors to retain copyright of their article and permit a very broad range of reuse. Under CC BY, reuse for commercial purposes or to create derivative works is permitted, whereas under CCBY-NC-ND, reuse cannot be for commercial purposes or change the work in any way. Under the CC BY licenses, authors are responsible for protecting their content from possible abuses such as infringement and plagiarism.”</p><p>Open access is provided through the payment of an article processing charge (APC) paid after acceptance. APCs are often financed by an author’s institution or the funder supporting their research.</p><p>The articles in this journal are peer reviewed in accordance with the requirements set forth in the <a href="https://pspb.ieee.org/images/files/files/opsmanual.pdf" target="_blank" rel="noopener">IEEE PSPB Operations Manual</a> (sections 8.2.1.C & 8.2.2.A). Each published article was reviewed by a minimum of two independent reviewers using a single-anonymous peer review process, where the identities of the reviewers are not known to the authors, but the reviewers know the identities of the authors. Articles will be screened for plagiarism before acceptance.</p><p>Corresponding authors from low-income countries are eligible for <a href="https://open.ieee.org/index.php/about-ieee-open-access/faqs/" target="_blank" rel="noopener">waived or reduced APCs</a>.</p></div><h3 class="grve-element grve-title grve-align-left grve-h5" style=""><span>Article Processing Charges (APCs)</span></h3><div class="grve-element grve-text"><p><strong>Article Processing Charge (APC): US $1995 – effective 1 January 2024</strong></p><p><strong>In 2024, 15 papers accepted for publication in the OJ-SSCS will be chosen by the Editor-in-Chief to receive a full waiver of the APC.</strong></p><p>The following subsequent discounts apply:</p><ul><li>IEEE Members receive a 5% discount.</li><li>IEEE Solid-State Circuits Society Members receive a 20% discount.</li></ul><p>(5% and 20% discounts do not apply to undergraduate and graduate students. Discounts cannot be combined.)</p></div><h3 class="grve-element grve-title grve-align-left grve-h5" style=""><span>Ethics</span></h3><div class="grve-element grve-text"><p>All IEEE authors are expected to adhere to IEEE’s publishing ethics, including <a href="https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/ethical-requirements/" target="_blank" rel="noopener">the definition of authorship, the appropriate citation of sources, the accurate reporting of data, and the publishing of original research</a>. Visit the <a href="https://journals.ieeeauthorcenter.ieee.org/become-an-ieee-journal-author/publishing-ethics/publish-original-research/" target="_blank" rel="noopener">IEEE Author Center</a> to learn more. All articles submitted for publication should be original and not under consideration elsewhere.</p><p>During submission, all related prior publications and related current submissions in other journals or conferences should be fully declared. Include a pdf copy of those papers, as well as a prepublication statement explaining the overlap and differences of the submitted manuscripts for the convenience of the reviewers. Furthermore, authors should inform the Editor-in-Chief of any related submissions made while their OJ-SSCS submission is in review.</p><p>Prior and related publications obviously refer to e.g. earlier conference papers on which the OJ-SSCS manuscript elaborates. But also other publications where (part of) the submitted work was disclosed, earlier work of you or your group in the same field on which the submitted manuscript builds further, etc. must be included.</p><p>Please consider this list carefully. An automated plagiarism check is performed on each submission, and violations of this prepublication policy detected during the review process may result in a publication ban.</p></div><h3 class="grve-element grve-title grve-align-left grve-h5" style=""><span>Submission Information</span></h3><div class="grve-element grve-text"><p>Detailed author information can be found <a href="/publications/ieee-open-journal-of-the-solid-state-circuits-society/oj-sscs-submission/">here</a>.</p></div></div></div><div class="grve-column wpb_column grve-column-1-3" ><div class="grve-column-wrapper" ><div class="grve-element grve-image mw-270 grve-hover-item grve-hover-style-1 grve-full-image" style=""><div class="grve-image-wrapper"><figure class="grve-image-hover grve-media grve-zoom-none"><a href="javascript:;" data-enc-email="jeurr[at]znvy.gfvatuhn.rqh.pa" title="Email Woogeun" class="grve-item-url mail-link" data-wpel-link="ignore"></a><div class="grve-bg-dark grve-hover-overlay grve-opacity-0"></div><img fetchpriority="high" decoding="async" width="270" height="300" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-editor-in-chief-woogeun-rhee.jpg" class="" alt="Woogeun Rhee" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-editor-in-chief-woogeun-rhee.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-editor-in-chief-woogeun-rhee2x.jpg 2x" /><figcaption></figcaption></figure><div class="grve-content grve-align-center"><h4 class="grve-title grve-h5 grve-text-inherit">Woogeun Rhee</h4><span class="grve-description grve-link-text grve-text-content">OJ-SSCS Editor-in-Chief</span></div></div></div></div></div></div></div><div class="grve-background-wrapper"></div></div></div></div></div></div></div><footer id="grve-footer" data-sticky-footer="no" class="grve-border grve-bookmark"><div id="grve-bottom-bar" class="grve-bookmark"><div class="grve-section grve-row-section grve-fullwidth-background grve-padding-top-3x grve-padding-bottom-3x grve-bg-none bg-red-gradient" id="join-sscs"><div class="grve-container"><div class="grve-row grve-bookmark grve-columns-gap-30"><div class="grve-column wpb_column grve-column-1 grve-align-center" ><div class="grve-column-wrapper mw-770" ><h2 class="grve-element grve-title grve-align-center grve-subtitle-text" style=""><span>Join IEEE Solid-State Circuits Society</span></h2><div class="grve-element grve-text"><p>As a member of the IEEE SSCS Society, you will receive communications about networking opportunities, conferences, meetings, special events, exclusive content, and so much more.</p></div><div class="grve-element grve-align-center ieee-btn"><a href="https://www.ieee.org/membership-catalog/productdetail/showProductDetailPage.html?product=MEMSSC037" title="Learn More" class="grve-btn grve-btn-medium grve-extra-round grve-bg-white grve-bg-hover-primary-2"><span>Learn More</span></a></div></div></div></div></div><div class="grve-background-wrapper"></div></div></div><div class="grve-footer-wrapper"><div class="grve-widget-area"><div class="grve-container grve-padding-top-2x grve-padding-bottom-1x "><div class="grve-row grve-columns-gap-30"><div class="wpb_column grve-column grve-column-1-2 grve-tablet-column-1-2"><div class="grve-column-wrapper"><div id="media_image-2" class="grve-widget widget widget_media_image"><a href="/"><img width="476" height="128" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-sm-ko-logo2x.png" class="image wp-image-1260 attachment-full size-full" alt="IEEE Solid-State Circuits Society logo" style="max-width: 100%; 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