TY - JFULL AU - Pedro M. A. Vitoriano and Tito. G. Amaral PY - 2017/5/ TI - Improved Pattern Matching Applied to Surface Mounting Devices Components Localization on Automated Optical Inspection T2 - International Journal of Computer and Information Engineering SP - 434 EP - 439 VL - 11 SN - 1307-6892 UR - https://publications.waset.org/pdf/10006692 PU - World Academy of Science, Engineering and Technology NX - Open Science Index 124, 2017 N2 - Automated Optical Inspection (AOI) Systems are commonly used on Printed Circuit Boards (PCB) manufacturing. The use of this technology has been proven as highly efficient for process improvements and quality achievements. The correct extraction of the component for posterior analysis is a critical step of the AOI process. Nowadays, the Pattern Matching Algorithm is commonly used, although this algorithm requires extensive calculations and is time consuming. This paper will present an improved algorithm for the component localization process, with the capability of implementation in a parallel execution system. ER -