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solder</title> <meta name="description" content="Search results for: lead-free solder"> <meta name="keywords" content="lead-free solder"> <meta name="viewport" content="width=device-width, initial-scale=1, minimum-scale=1, maximum-scale=1, user-scalable=no"> <meta charset="utf-8"> <link href="https://cdn.waset.org/favicon.ico" type="image/x-icon" rel="shortcut icon"> <link href="https://cdn.waset.org/static/plugins/bootstrap-4.2.1/css/bootstrap.min.css" rel="stylesheet"> <link href="https://cdn.waset.org/static/plugins/fontawesome/css/all.min.css" rel="stylesheet"> <link href="https://cdn.waset.org/static/css/site.css?v=150220211555" rel="stylesheet"> </head> <body> <header> <div class="container"> <nav class="navbar navbar-expand-lg navbar-light"> <a class="navbar-brand" href="https://waset.org"> <img src="https://cdn.waset.org/static/images/wasetc.png" alt="Open Science Research Excellence" title="Open Science Research Excellence" /> </a> <button class="d-block d-lg-none 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action="https://publications.waset.org/abstracts/search"> <div id="custom-search-input"> <div class="input-group"> <i class="fas fa-search"></i> <input type="text" class="search-query" name="q" placeholder="Author, Title, Abstract, Keywords" value="lead-free solder"> <input type="submit" class="btn_search" value="Search"> </div> </div> </form> </div> </div> <div class="row mt-3"> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Commenced</strong> in January 2007</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Frequency:</strong> Monthly</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Edition:</strong> International</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Paper Count:</strong> 21</div> </div> </div> </div> <h1 class="mt-3 mb-3 text-center" style="font-size:1.6rem;">Search results for: lead-free solder</h1> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">21</span> Electrokinetics and Stability of Solder Powders in Aqueous Media</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Terence%20Lucero%20F.%20Menor">Terence Lucero F. Menor</a>, <a href="https://publications.waset.org/abstracts/search?q=Manolo%20G.%20Mena"> Manolo G. Mena</a>, <a href="https://publications.waset.org/abstracts/search?q=Herman%20D.%20Mendoza"> Herman D. Mendoza</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Solder pastes are widely used in creating mechanical, thermal and electrical connection between electronic components. Continued miniaturization of consumer electronics drives manufacturers to achieve smaller, lighter, and faster electronic packages at low cost. This faces them to the difficult challenge of dispensing solder pastes in extremely precise and repeatable manner. The most common problem in solder paste dispensing is the clogging of dispensers which results from agglomeration and settling of solder powders leading to increase on the effective particle size and uneven distribution of particles in the mixture. In this work, microelectrophoresis was employed to investigate the effect of pH and KNO₃ concentration on the electrokinetic behavior and stability of SAC305, PbSn5Ag2.5 and Sn powders in aqueous media. Results revealed that the electrokinetic behavior of the three types of solder powders are similar, which was attributed to high SnO₂ content on the surface of the particles. Electrokinetic measurements showed that the zeta potentials of the solder powders are highly dependent on pH and KNO₃ concentration with isoelectric points ranging from 3.5 to 5.5. Results were verified using stability tests. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=electrokinetic%20behavior" title="electrokinetic behavior">electrokinetic behavior</a>, <a href="https://publications.waset.org/abstracts/search?q=isoelectric%20point" title=" isoelectric point"> isoelectric point</a>, <a href="https://publications.waset.org/abstracts/search?q=solder%20powder" title=" solder powder"> solder powder</a>, <a href="https://publications.waset.org/abstracts/search?q=stability" title=" stability"> stability</a>, <a href="https://publications.waset.org/abstracts/search?q=surface%20analysis" title=" surface analysis"> surface analysis</a> </p> <a href="https://publications.waset.org/abstracts/74846/electrokinetics-and-stability-of-solder-powders-in-aqueous-media" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/74846.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">230</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">20</span> Effect of Relative Humidity on Corrosion Behavior of SN-0.7Cu Solder under Polyvinyl Chloride Fire Smoke Atmosphere</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Qian%20Li">Qian Li</a>, <a href="https://publications.waset.org/abstracts/search?q=Shouxiang%20Lu"> Shouxiang Lu</a> </p> <p class="card-text"><strong>Abstract:</strong></p> With the rapid increase in electric power use, wire and cable fire occur more and more frequent. The fire smoke has a corrosive effect on the solders, which seriously affects the function of electronic equipment. In this research, the effect of environment relative humidity on corrosion behavior of Sn-0.7Cu solder has been researched under 140 g·m⁻³ polyvinyl chloride (PVC) fire smoke atmosphere. The mass loss of Sn-0.7Cu solder increased with the relative humidity. Furthermore, the microstructures and corrosion mechanism were analyzed by using SEM, EDS, XRD, and XPS. The result shows that Sn₂₁Cl₁₆(OH)₁₄O₆ is the main corrosion products and the corrosion process is an electrochemical reaction. The present work could provide guidance to the risk assessment for electronic equipment rescue after a fire. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=corrosion" title="corrosion">corrosion</a>, <a href="https://publications.waset.org/abstracts/search?q=fire%20smoke" title=" fire smoke"> fire smoke</a>, <a href="https://publications.waset.org/abstracts/search?q=relative%20humidity" title=" relative humidity"> relative humidity</a>, <a href="https://publications.waset.org/abstracts/search?q=Sn-0.7Cu%20solder" title=" Sn-0.7Cu solder"> Sn-0.7Cu solder</a> </p> <a href="https://publications.waset.org/abstracts/108764/effect-of-relative-humidity-on-corrosion-behavior-of-sn-07cu-solder-under-polyvinyl-chloride-fire-smoke-atmosphere" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/108764.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">365</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">19</span> Automatic Adjustment of Thresholds via Closed-Loop Feedback Mechanism for Solder Paste Inspection</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Chia-Chen%20Wei">Chia-Chen Wei</a>, <a href="https://publications.waset.org/abstracts/search?q=Pack%20Hsieh"> Pack Hsieh</a>, <a href="https://publications.waset.org/abstracts/search?q=Jeffrey%20Chen"> Jeffrey Chen</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Surface Mount Technology (SMT) is widely used in the area of the electronic assembly in which the electronic components are mounted to the surface of the printed circuit board (PCB). Most of the defects in the SMT process are mainly related to the quality of solder paste printing. These defects lead to considerable manufacturing costs in the electronics assembly industry. Therefore, the solder paste inspection (SPI) machine for controlling and monitoring the amount of solder paste printing has become an important part of the production process. So far, the setting of the SPI threshold is based on statistical analysis and experts’ experiences to determine the appropriate threshold settings. Because the production data are not normal distribution and there are various variations in the production processes, defects related to solder paste printing still occur. In order to solve this problem, this paper proposes an online machine learning algorithm, called the automatic threshold adjustment (ATA) algorithm, and closed-loop architecture in the SMT process to determine the best threshold settings. Simulation experiments prove that our proposed threshold settings improve the accuracy from 99.85% to 100%. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=big%20data%20analytics" title="big data analytics">big data analytics</a>, <a href="https://publications.waset.org/abstracts/search?q=Industry%204.0" title=" Industry 4.0"> Industry 4.0</a>, <a href="https://publications.waset.org/abstracts/search?q=SPI%20threshold%20setting" title=" SPI threshold setting"> SPI threshold setting</a>, <a href="https://publications.waset.org/abstracts/search?q=surface%20mount%20technology" title=" surface mount technology"> surface mount technology</a> </p> <a href="https://publications.waset.org/abstracts/114158/automatic-adjustment-of-thresholds-via-closed-loop-feedback-mechanism-for-solder-paste-inspection" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/114158.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">116</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">18</span> Phase Equilibria in Zn-Al-Sn Alloy for Lead-free Solder Application</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Ji%20Chan%20Kim">Ji Chan Kim</a>, <a href="https://publications.waset.org/abstracts/search?q=Seok%20Hong%20Min"> Seok Hong Min</a>, <a href="https://publications.waset.org/abstracts/search?q=Tae%20Kwon%20Ha"> Tae Kwon Ha</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The effect of Yttrium addition on the microstructure and mechanical properties of Sn-Zn eutectic alloy, which has been attracting intensive focus as a Pb-free solder material, was investigated in this study. Phase equilibrium has been calculated by using FactSage® to evaluate the composition and fraction of equilibrium intermetallic compounds and construct a phase diagram. In the case of Sn-8.8 Zn eutectic alloy, the as-cast microstructure was typical lamellar. With addition of 0.25 wt. %Y, a large amount of pro-eutectic phases have been observed and various YZnx intermetallic compounds were expected to successively form during cooling. Hardness of Sn-8.8 Zn alloy was not affected by Y-addition and both alloys could be rolled by 90% at room temperature. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=lead-free%20solder" title="lead-free solder">lead-free solder</a>, <a href="https://publications.waset.org/abstracts/search?q=zn-al-sn%20alloy" title=" zn-al-sn alloy"> zn-al-sn alloy</a>, <a href="https://publications.waset.org/abstracts/search?q=phase%20equilibrium" title=" phase equilibrium"> phase equilibrium</a>, <a href="https://publications.waset.org/abstracts/search?q=rolling" title=" rolling"> rolling</a>, <a href="https://publications.waset.org/abstracts/search?q=microstructure" title=" microstructure"> microstructure</a>, <a href="https://publications.waset.org/abstracts/search?q=hardness" title=" hardness"> hardness</a> </p> <a href="https://publications.waset.org/abstracts/35718/phase-equilibria-in-zn-al-sn-alloy-for-lead-free-solder-application" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/35718.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">308</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">17</span> The Effectiveness of Bismuth Addition to Retard the Intermetallic Compound Formation</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=I.%20Siti%20Rabiatull%20Aisha">I. Siti Rabiatull Aisha</a>, <a href="https://publications.waset.org/abstracts/search?q=A.%20Ourdjini"> A. Ourdjini</a>, <a href="https://publications.waset.org/abstracts/search?q=O.%20Saliza%20Azlina"> O. Saliza Azlina</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The aim of this paper is to study the effectiveness of bismuth addition in the solder alloy to retard the intermetallic compound formation and growth. In this study, three categories of solders such as Sn-4Ag-<em>x</em>Cu (<em>x</em> = 0.5, 0.7, 1.0) and Sn-4Ag-0.5Cu-<em>x</em>Bi (<em>x</em> = 0.1, 0.2, 0.4) were used. Ni/Au surface finish substrates were dipped into the molten solder at a temperature of 180-190 <sup>o</sup>C and allowed to cool at room temperature. The intermetallic compound (IMCs) were subjected to the characterization in terms of composition and morphology. The IMC phases were identified by energy dispersive x-ray (EDX), whereas the optical microscope and scanning electron microscopy (SEM) were used to observe microstructure evolution of the solder joint. The results clearly showed that copper concentration dependency was high during the reflow stage. Besides, only Ni<sub>3</sub>Sn<sub>4</sub> and Ni<sub>3</sub>Sn<sub>2</sub> were detected for all copper concentrations. The addition of Bi was found to have no significant effect on the type of IMCs formed, but yet the grain became further refined. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=Bismuth%20addition" title="Bismuth addition">Bismuth addition</a>, <a href="https://publications.waset.org/abstracts/search?q=intermetallic%20compound" title=" intermetallic compound"> intermetallic compound</a>, <a href="https://publications.waset.org/abstracts/search?q=composition" title=" composition"> composition</a>, <a href="https://publications.waset.org/abstracts/search?q=morphology" title=" morphology"> morphology</a> </p> <a href="https://publications.waset.org/abstracts/46079/the-effectiveness-of-bismuth-addition-to-retard-the-intermetallic-compound-formation" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/46079.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">303</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">16</span> Optical Imaging Based Detection of Solder Paste in Printed Circuit Board Jet-Printing Inspection</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=D.%20Heinemann">D. Heinemann</a>, <a href="https://publications.waset.org/abstracts/search?q=S.%20Schramm"> S. Schramm</a>, <a href="https://publications.waset.org/abstracts/search?q=S.%20Knabner"> S. Knabner</a>, <a href="https://publications.waset.org/abstracts/search?q=D.%20Baumgarten"> D. Baumgarten</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Purpose: Applying solder paste to printed circuit boards (PCB) with stencils has been the method of choice over the past years. A new method uses a jet printer to deposit tiny droplets of solder paste through an ejector mechanism onto the board. This allows for more flexible PCB layouts with smaller components. Due to the viscosity of the solder paste, air blisters can be trapped in the cartridge. This can lead to missing solder joints or deviations in the applied solder volume. Therefore, a built-in and real-time inspection of the printing process is needed to minimize uncertainties and increase the efficiency of the process by immediate correction. The objective of the current study is the design of an optimal imaging system and the development of an automatic algorithm for the detection of applied solder joints from optical from the captured images. Methods: In a first approach, a camera module connected to a microcomputer and LED strips are employed to capture images of the printed circuit board under four different illuminations (white, red, green and blue). Subsequently, an improved system including a ring light, an objective lens, and a monochromatic camera was set up to acquire higher quality images. The obtained images can be divided into three main components: the PCB itself (i.e., the background), the reflections induced by unsoldered positions or screw holes and the solder joints. Non-uniform illumination is corrected by estimating the background using a morphological opening and subtraction from the input image. Image sharpening is applied in order to prevent error pixels in the subsequent segmentation. The intensity thresholds which divide the main components are obtained from the multimodal histogram using three probability density functions. Determining the intersections delivers proper thresholds for the segmentation. Remaining edge gradients produces small error areas which are removed by another morphological opening. For quantitative analysis of the segmentation results, the dice coefficient is used. Results: The obtained PCB images show a significant gradient in all RGB channels, resulting from ambient light. Using different lightings and color channels 12 images of a single PCB are available. A visual inspection and the investigation of 27 specific points show the best differentiation between those points using a red lighting and a green color channel. Estimating two thresholds from analyzing the multimodal histogram of the corrected images and using them for segmentation precisely extracts the solder joints. The comparison of the results to manually segmented images yield high sensitivity and specificity values. Analyzing the overall result delivers a Dice coefficient of 0.89 which varies for single object segmentations between 0.96 for a good segmented solder joints and 0.25 for single negative outliers. Conclusion: Our results demonstrate that the presented optical imaging system and the developed algorithm can robustly detect solder joints on printed circuit boards. Future work will comprise a modified lighting system which allows for more precise segmentation results using structure analysis. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=printed%20circuit%20board%20jet-printing" title="printed circuit board jet-printing">printed circuit board jet-printing</a>, <a href="https://publications.waset.org/abstracts/search?q=inspection" title=" inspection"> inspection</a>, <a href="https://publications.waset.org/abstracts/search?q=segmentation" title=" segmentation"> segmentation</a>, <a href="https://publications.waset.org/abstracts/search?q=solder%20paste%20detection" title=" solder paste detection"> solder paste detection</a> </p> <a href="https://publications.waset.org/abstracts/29447/optical-imaging-based-detection-of-solder-paste-in-printed-circuit-board-jet-printing-inspection" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/29447.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">336</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">15</span> Microvoid Growth in the Interfaces during Aging</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Jae-Yong%20Park">Jae-Yong Park</a>, <a href="https://publications.waset.org/abstracts/search?q=Gwancheol%20Seo"> Gwancheol Seo</a>, <a href="https://publications.waset.org/abstracts/search?q=Young-Ho%20Kim"> Young-Ho Kim</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Microvoids, sometimes called Kikendall voids, generally form in the interfaces between Sn-based solders and Cu and degrade the mechanical and electrical properties of the solder joints. The microvoid formation is known as the rapid interdiffusion between Sn and Cu and impurity content in the Cu. Cu electroplating from the acid solutions has been widely used by microelectronic packaging industry for both printed circuit board (PCB) and integrated circuit (IC) applications. The quality of electroplated Cu that can be optimized by the electroplating conditions is critical for the solder joint reliability. In this paper, the influence of electroplating conditions on the microvoid growth in the interfaces between Sn-3.0Ag-0.5Cu (SAC) solder and Cu layer was investigated during isothermal aging. The Cu layers were electroplated by controlling the additive of electroplating bath and current density to induce various microvoid densities. The electroplating bath consisted of sulfate, sulfuric acid, and additives and the current density of 5-15 mA/cm2 for each bath was used. After aging at 180 °C for up to 250 h, typical bi-layer of Cu6Sn5 and Cu3Sn intermetallic compounds (IMCs) was gradually growth at the SAC/Cu interface and microvoid density in the Cu3Sn showed disparities in the electroplating conditions. As the current density increased, the microvoid formation was accelerated in all electroplating baths. The higher current density induced, the higher impurity content in the electroplated Cu. When the polyethylene glycol (PEG) and Cl- ion were mixed in an electroplating bath, the microvoid formation was the highest compared to other electroplating baths. On the other hand, the overall IMC thickness was similar in all samples irrespective of the electroplating conditions. Impurity content in electroplated Cu influenced the microvoid growth, but the IMC growth was not affected by the impurity content. In conclusion, the electroplated conditions are properly optimized to avoid the excessive microvoid formation that results in brittle fracture of solder joint under high strain rate loading. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=electroplating" title="electroplating">electroplating</a>, <a href="https://publications.waset.org/abstracts/search?q=additive" title=" additive"> additive</a>, <a href="https://publications.waset.org/abstracts/search?q=microvoid" title=" microvoid"> microvoid</a>, <a href="https://publications.waset.org/abstracts/search?q=intermetallic%20compound" title=" intermetallic compound"> intermetallic compound</a> </p> <a href="https://publications.waset.org/abstracts/54612/microvoid-growth-in-the-interfaces-during-aging" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/54612.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">259</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">14</span> Effects of Fourth Alloying Additive on Microstructure and Mechanical Properties of Sn-Ag-Cu Alloy</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Ugur%20Buyuk">Ugur Buyuk</a>, <a href="https://publications.waset.org/abstracts/search?q=Sevda%20Engin"> Sevda Engin</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Among the various alloy systems being considered as lead-free solder candidates, Sn-Ag-Cu alloys have been recognized as the most promising because of their excellent reliability and compatibility with current components. Thus, Sn-Ag-Cu alloys have recently attracted considerable attention and have been proposed by the Japanese, the EU and the US consortiums to replace conventional Sn-Pb eutectic solder. However, many problems or unknown characteristics of the Sn-Ag-Cu alloy system such as the best composition, the large undercooling in solidification, and the formation of large intermetallics still exist. It is expected that the addition of some solidification nuclei for Sn-Ag-Cu alloys will refine the solidification microstructure and will suppress undercooling.In the present work, the effects of the fourth elements, i.e., Zn, Ni, Bi, In and Co, on microstructural and mechanical properties of Sn-3.5Ag-0.9Cu lead-free solder were investigated. Sn-3.5Ag-0.9Cu-0.5X (X= Zn, Ni, Bi, In, Co (wt.)) alloys were prepared in a graphite crucible under vacuum atmosphere. The samples were directionally solidified upward at a constant temperature gradient and growth rates by using a Bridgman type directional solidification furnace. The microstructure, microhardness and ultimate tensile strength of alloys were measured. The effects of fourth elements on the microstructure and mechanical properties of Sn–Ag-Cu eutectic alloys were investigated. The results obtained in the present work were compared with the previous experimental results. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=lead-free%20solders" title="lead-free solders">lead-free solders</a>, <a href="https://publications.waset.org/abstracts/search?q=microhardness" title=" microhardness"> microhardness</a>, <a href="https://publications.waset.org/abstracts/search?q=microstructure" title=" microstructure"> microstructure</a>, <a href="https://publications.waset.org/abstracts/search?q=tensile%20strength" title=" tensile strength"> tensile strength</a> </p> <a href="https://publications.waset.org/abstracts/27064/effects-of-fourth-alloying-additive-on-microstructure-and-mechanical-properties-of-sn-ag-cu-alloy" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/27064.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">413</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">13</span> Investigation of the Growth Kinetics of Phases in Ni–Sn System</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Varun%20A%20Baheti">Varun A Baheti</a>, <a href="https://publications.waset.org/abstracts/search?q=Sanjay%20Kashyap"> Sanjay Kashyap</a>, <a href="https://publications.waset.org/abstracts/search?q=Kamanio%20Chattopadhyay"> Kamanio Chattopadhyay</a>, <a href="https://publications.waset.org/abstracts/search?q=Praveen%20Kumar"> Praveen Kumar</a>, <a href="https://publications.waset.org/abstracts/search?q=Aloke%20Paul"> Aloke Paul</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Ni–Sn system finds applications in the microelectronics industry, especially with respect to flip–chip or direct chip, attach technology. Here the region of interest is under bump metallization (UBM), and solder bump (Sn) interface due to the formation of brittle intermetallic phases there. Understanding the growth of these phases at UBM/Sn interface is important, as in many cases it controls the electro–mechanical properties of the product. Cu and Ni are the commonly used UBM materials. Cu is used for good bonding because of fast reaction with solder and Ni often acts as a diffusion barrier layer due to its inherently slower reaction kinetics with Sn–based solders. Investigation on the growth kinetics of phases in Ni–Sn system is reported in this study. Just for simplicity, Sn being major solder constituent is chosen. Ni–Sn electroplated diffusion couples are prepared by electroplating pure Sn on Ni substrate. Bulk diffusion couples prepared by the conventional method are also studied along with Ni–Sn electroplated diffusion couples. Diffusion couples are annealed for 25–1000 h at 50–215°C to study the phase evolutions and growth kinetics of various phases. The interdiffusion zone was analysed using field emission gun equipped scanning electron microscope (FE–SEM) for imaging. Indexing of selected area diffraction (SAD) patterns obtained from transmission electron microscope (TEM) and composition measurements done in electron probe micro−analyser (FE–EPMA) confirms the presence of various product phases grown across the interdiffusion zone. Time-dependent experiments indicate diffusion controlled growth of the product phase. The estimated activation energy in the temperature range 125–215°C for parabolic growth constants (and hence integrated interdiffusion coefficients) of the Ni₃Sn₄ phase shed light on the growth mechanism of the phase; whether its grain boundary controlled or lattice controlled diffusion. The location of the Kirkendall marker plane indicates that the Ni₃Sn₄ phase grows mainly by diffusion of Sn in the binary Ni–Sn system. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=diffusion" title="diffusion">diffusion</a>, <a href="https://publications.waset.org/abstracts/search?q=equilibrium%20phase" title=" equilibrium phase"> equilibrium phase</a>, <a href="https://publications.waset.org/abstracts/search?q=metastable%20phase" title=" metastable phase"> metastable phase</a>, <a href="https://publications.waset.org/abstracts/search?q=the%20Ni-Sn%20system" title=" the Ni-Sn system"> the Ni-Sn system</a> </p> <a href="https://publications.waset.org/abstracts/65844/investigation-of-the-growth-kinetics-of-phases-in-ni-sn-system" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/65844.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">307</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">12</span> Solid State Drive End to End Reliability Prediction, Characterization and Control</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Mohd%20Azman%20Abdul%20Latif">Mohd Azman Abdul Latif</a>, <a href="https://publications.waset.org/abstracts/search?q=Erwan%20Basiron"> Erwan Basiron</a> </p> <p class="card-text"><strong>Abstract:</strong></p> A flaw or drift from expected operational performance in one component (NAND, PMIC, controller, DRAM, etc.) may affect the reliability of the entire Solid State Drive (SSD) system. Therefore, it is important to ensure the required quality of each individual component through qualification testing specified using standards or user requirements. Qualification testing is time-consuming and comes at a substantial cost for product manufacturers. A highly technical team, from all the eminent stakeholders is embarking on reliability prediction from beginning of new product development, identify critical to reliability parameters, perform full-blown characterization to embed margin into product reliability and establish control to ensure the product reliability is sustainable in the mass production. The paper will discuss a comprehensive development framework, comprehending SSD end to end from design to assembly, in-line inspection, in-line testing and will be able to predict and to validate the product reliability at the early stage of new product development. During the design stage, the SSD will go through intense reliability margin investigation with focus on assembly process attributes, process equipment control, in-process metrology and also comprehending forward looking product roadmap. Once these pillars are completed, the next step is to perform process characterization and build up reliability prediction modeling. Next, for the design validation process, the reliability prediction specifically solder joint simulator will be established. The SSD will be stratified into Non-Operating and Operating tests with focus on solder joint reliability and connectivity/component latent failures by prevention through design intervention and containment through Temperature Cycle Test (TCT). Some of the SSDs will be subjected to the physical solder joint analysis called Dye and Pry (DP) and Cross Section analysis. The result will be feedbacked to the simulation team for any corrective actions required to further improve the design. Once the SSD is validated and is proven working, it will be subjected to implementation of the monitor phase whereby Design for Assembly (DFA) rules will be updated. At this stage, the design change, process and equipment parameters are in control. Predictable product reliability at early product development will enable on-time sample qualification delivery to customer and will optimize product development validation, effective development resource and will avoid forced late investment to bandage the end-of-life product failures. Understanding the critical to reliability parameters earlier will allow focus on increasing the product margin that will increase customer confidence to product reliability. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=e2e%20reliability%20prediction" title="e2e reliability prediction">e2e reliability prediction</a>, <a href="https://publications.waset.org/abstracts/search?q=SSD" title=" SSD"> SSD</a>, <a href="https://publications.waset.org/abstracts/search?q=TCT" title=" TCT"> TCT</a>, <a href="https://publications.waset.org/abstracts/search?q=solder%20joint%20reliability" title=" solder joint reliability"> solder joint reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=NUDD" title=" NUDD"> NUDD</a>, <a href="https://publications.waset.org/abstracts/search?q=connectivity%20issues" title=" connectivity issues"> connectivity issues</a>, <a href="https://publications.waset.org/abstracts/search?q=qualifications" title=" qualifications"> qualifications</a>, <a href="https://publications.waset.org/abstracts/search?q=characterization%20and%20control" title=" characterization and control "> characterization and control </a> </p> <a href="https://publications.waset.org/abstracts/135316/solid-state-drive-end-to-end-reliability-prediction-characterization-and-control" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/135316.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">174</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">11</span> Virtual Prototyping of LED Chip Scale Packaging Using Computational Fluid Dynamic and Finite Element Method</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=R.%20C.%20Law">R. C. Law</a>, <a href="https://publications.waset.org/abstracts/search?q=Shirley%20Kang"> Shirley Kang</a>, <a href="https://publications.waset.org/abstracts/search?q=T.%20Y.%20Hin"> T. Y. Hin</a>, <a href="https://publications.waset.org/abstracts/search?q=M.%20Z.%20Abdullah"> M. Z. Abdullah</a> </p> <p class="card-text"><strong>Abstract:</strong></p> LED technology has been evolving aggressively in recent years from incandescent bulb during older days to as small as chip scale package. It will continue to stay bright in future. As such, there is tremendous pressure to stay competitive in the market by optimizing products to next level of performance and reliability with the shortest time to market. This changes the conventional way of product design and development to virtual prototyping by means of Computer Aided Engineering (CAE). It comprises of the deployment of Finite Element Method (FEM) and Computational Fluid Dynamic (CFD). FEM accelerates the investigation for early detection of failures such as crack, improve the thermal performance of system and enhance solder joint reliability. CFD helps to simulate the flow pattern of molding material as a function of different temperature, molding parameters settings to evaluate failures like voids and displacement. This paper will briefly discuss the procedures and applications of FEM in thermal stress, solder joint reliability and CFD of compression molding in LED CSP. Integration of virtual prototyping in product development had greatly reduced the time to market. Many successful achievements with minimized number of evaluation iterations required in the scope of material, process setting, and package architecture variant have been materialized with this approach. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=LED" title="LED">LED</a>, <a href="https://publications.waset.org/abstracts/search?q=chip%20scale%20packaging%20%28CSP%29" title=" chip scale packaging (CSP)"> chip scale packaging (CSP)</a>, <a href="https://publications.waset.org/abstracts/search?q=computational%20fluid%20dynamic%20%28CFD%29" title=" computational fluid dynamic (CFD)"> computational fluid dynamic (CFD)</a>, <a href="https://publications.waset.org/abstracts/search?q=virtual%20prototyping" title=" virtual prototyping "> virtual prototyping </a> </p> <a href="https://publications.waset.org/abstracts/74429/virtual-prototyping-of-led-chip-scale-packaging-using-computational-fluid-dynamic-and-finite-element-method" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/74429.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">287</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">10</span> Thermal Evaluation of Printed Circuit Board Design Options and Voids in Solder Interface by a Simulation Tool</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=B.%20Arzhanov">B. Arzhanov</a>, <a href="https://publications.waset.org/abstracts/search?q=A.%20Correia"> A. Correia</a>, <a href="https://publications.waset.org/abstracts/search?q=P.%20Delgado"> P. Delgado</a>, <a href="https://publications.waset.org/abstracts/search?q=J.%20Meireles"> J. Meireles</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Quad Flat No-Lead (QFN) packages have become very popular for turners, converters and audio amplifiers, among others applications, needing efficient power dissipation in small footprints. Since semiconductor junction temperature (TJ) is a critical parameter in the product quality. And to ensure that die temperature does not exceed the maximum allowable TJ, a thermal analysis conducted in an earlier development phase is essential to avoid repeated re-designs process with huge losses in cost and time. A simulation tool capable to estimate die temperature of components with QFN package was developed. Allow establish a non-empirical way to define an acceptance criterion for amount of voids in solder interface between its exposed pad and Printed Circuit Board (PCB) to be applied during industrialization process, and evaluate the impact of PCB designs parameters. Targeting PCB layout designer as an end user for the application, a user-friendly interface (GUI) was implemented allowing user to introduce design parameters in a convenient and secure way and hiding all the complexity of finite element simulation process. This cost effective tool turns transparent a simulating process and provides useful outputs after acceptable time, which can be adopted by PCB designers, preventing potential risks during the design stage and make product economically efficient by not oversizing it. This article gathers relevant information related to the design and implementation of the developed tool, presenting a parametric study conducted with it. The simulation tool was experimentally validated using a Thermal-Test-Chip (TTC) in a QFN open-cavity, in order to measure junction temperature (TJ) directly on the die under controlled and knowing conditions. Providing a short overview about standard thermal solutions and impacts in exposed pad packages (i.e. QFN), accurately describe the methods and techniques that the system designer should use to achieve optimum thermal performance, and demonstrate the effect of system-level constraints on the thermal performance of the design. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=QFN%20packages" title="QFN packages">QFN packages</a>, <a href="https://publications.waset.org/abstracts/search?q=exposed%20pads" title=" exposed pads"> exposed pads</a>, <a href="https://publications.waset.org/abstracts/search?q=junction%20temperature" title=" junction temperature"> junction temperature</a>, <a href="https://publications.waset.org/abstracts/search?q=thermal%20management%20and%20measurements" title=" thermal management and measurements"> thermal management and measurements</a> </p> <a href="https://publications.waset.org/abstracts/38551/thermal-evaluation-of-printed-circuit-board-design-options-and-voids-in-solder-interface-by-a-simulation-tool" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/38551.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">255</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">9</span> Manufacturing of Vacuum Glazing with Metal Edge Seal</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Won%20Kyeong%20Kang">Won Kyeong Kang</a>, <a href="https://publications.waset.org/abstracts/search?q=Tae-Ho%20Song"> Tae-Ho Song</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Vacuum glazing (VG) is a super insulator, which is able to greatly improve the energy efficiency of building. However, a significant amount of heat loss occurs through the welded edge of conventional VG. The joining method should be improved for further application and commercialization. For this purpose VG with metal edge seal is conceived. In this paper, the feasibility of joining stainless steel and soda lime glass using glass solder is assessed numerically and experimentally. In the case of very thin stainless steel, partial joining with glass is identified, which need further improvement for practical application. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=VG" title="VG">VG</a>, <a href="https://publications.waset.org/abstracts/search?q=metal%20edge%20seal" title=" metal edge seal"> metal edge seal</a>, <a href="https://publications.waset.org/abstracts/search?q=vacuum%20glazing" title=" vacuum glazing"> vacuum glazing</a>, <a href="https://publications.waset.org/abstracts/search?q=manufacturing" title=" manufacturing"> manufacturing</a>, <a href="https://publications.waset.org/abstracts/search?q=" title=""></a> </p> <a href="https://publications.waset.org/abstracts/19368/manufacturing-of-vacuum-glazing-with-metal-edge-seal" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/19368.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">605</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">8</span> An Integrated Tailoring Method for Thermal Cycling Tests of Spacecraft Electronics</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Xin-Yan%20Ji">Xin-Yan Ji</a>, <a href="https://publications.waset.org/abstracts/search?q=Jing%20Wang"> Jing Wang</a>, <a href="https://publications.waset.org/abstracts/search?q=Chang%20Liu"> Chang Liu</a>, <a href="https://publications.waset.org/abstracts/search?q=Yan-Qiang%20Bi"> Yan-Qiang Bi</a>, <a href="https://publications.waset.org/abstracts/search?q=Zhong-Xu%20Xu"> Zhong-Xu Xu</a>, <a href="https://publications.waset.org/abstracts/search?q=Xi-Yuan%20Li"> Xi-Yuan Li</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Thermal tests of electronic units are critically important for the reliability validation and performance demonstration of the spacecraft hard-wares. The tailoring equation in MIL-STD-1540 is based on fatigue of solder date. In the present paper, a new test condition tailoring expression is proposed to fit different thermo-mechanical fatigue and different subsystems, by introducing an integrated evaluating method for the fatigue acceleration exponent. The validate test has been accomplished and the data has been analyzed and compared with that from the MIL-STD-1540 tailoring equations. The results are encouraging and reasonable. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=thermal%20cycling%20test" title="thermal cycling test">thermal cycling test</a>, <a href="https://publications.waset.org/abstracts/search?q=thermal%20fatigue" title=" thermal fatigue"> thermal fatigue</a>, <a href="https://publications.waset.org/abstracts/search?q=tailoring%20equation" title=" tailoring equation"> tailoring equation</a>, <a href="https://publications.waset.org/abstracts/search?q=test%20condition%20planning" title=" test condition planning"> test condition planning</a> </p> <a href="https://publications.waset.org/abstracts/63335/an-integrated-tailoring-method-for-thermal-cycling-tests-of-spacecraft-electronics" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/63335.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">459</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">7</span> Effect of Y Addition on the Microstructure and Mechanical Properties of Sn-Zn Eutectic Alloy</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Jung-Ho%20Moon">Jung-Ho Moon</a>, <a href="https://publications.waset.org/abstracts/search?q=Tae%20Kwon%20Ha"> Tae Kwon Ha</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The effect of Yttrium addition on the microstructure and mechanical properties of Sn-Zn eutectic alloy, which has been attracting intensive focus as a Pb-free solder material, was investigated in this study. Phase equilibrium has been calculated by using FactSage® to evaluate the composition and fraction of equilibrium intermetallic compounds and construct a phase diagram. In the case of Sn-8.8 Zn eutectic alloy, the as-cast microstructure was typical lamellar. With addition of 0.25 wt. %Y, a large amount of pro-eutectic phases have been observed and various YZnx intermetallic compounds were expected to successively form during cooling. Hardness of Sn-8.8 Zn alloy was not affected by Y-addition and both alloys could be rolled by 90% at room temperature. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=Sn-Zn%20eutectic%20alloy" title="Sn-Zn eutectic alloy">Sn-Zn eutectic alloy</a>, <a href="https://publications.waset.org/abstracts/search?q=yttrium" title=" yttrium"> yttrium</a>, <a href="https://publications.waset.org/abstracts/search?q=FactSage%C2%AE" title=" FactSage®"> FactSage®</a>, <a href="https://publications.waset.org/abstracts/search?q=microstructure" title=" microstructure"> microstructure</a>, <a href="https://publications.waset.org/abstracts/search?q=mechanical%20properties" title=" mechanical properties"> mechanical properties</a> </p> <a href="https://publications.waset.org/abstracts/7127/effect-of-y-addition-on-the-microstructure-and-mechanical-properties-of-sn-zn-eutectic-alloy" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/7127.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">469</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">6</span> Effect of Vibration Amplitude and Welding Force on Weld Strength of Ultrasonic Metal Welding</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Ziad.%20Sh.%20Al%20Sarraf">Ziad. Sh. Al Sarraf</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Ultrasonic metal welding has been the subject of ongoing research and development, most recently concentrating on metal joining in miniature devices, for example to allow solder-free wire bonding. As well as at the small scale, there are also opportunities to research the joining of thicker sheet metals and to widen the range of similar and dissimilar materials that can be successfully joined using this technology. This study presents the design, characterisation and test of a lateral-drive ultrasonic metal spot welding device. The ultrasonic metal spot welding horn is modelled using finite element analysis (FEA) and its vibration behaviour is characterised experimentally to ensure ultrasonic energy is delivered effectively to the weld coupon. The welding stack and fixtures are then designed and mounted on a test machine to allow a series of experiments to be conducted for various welding and ultrasonic parameters. Weld strength is subsequently analysed using tensile-shear tests. The results show how the weld strength is particularly sensitive to the combination of clamping force and ultrasonic vibration amplitude of the welding tip, but there are optimal combinations of these and also limits that must be clearly identified. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=ultrasonic%20welding" title="ultrasonic welding">ultrasonic welding</a>, <a href="https://publications.waset.org/abstracts/search?q=vibration%20amplitude" title=" vibration amplitude"> vibration amplitude</a>, <a href="https://publications.waset.org/abstracts/search?q=welding%20force" title=" welding force"> welding force</a>, <a href="https://publications.waset.org/abstracts/search?q=weld%20strength" title=" weld strength"> weld strength</a> </p> <a href="https://publications.waset.org/abstracts/41161/effect-of-vibration-amplitude-and-welding-force-on-weld-strength-of-ultrasonic-metal-welding" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/41161.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">368</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">5</span> PVMODREL© Development Based on Reliability Evaluation of a PV Module Using Accelerated Degradation Testing</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Abderafi%20Charki">Abderafi Charki</a>, <a href="https://publications.waset.org/abstracts/search?q=David%20Bigaud"> David Bigaud </a> </p> <p class="card-text"><strong>Abstract:</strong></p> The aim of this oral speach is to present the PVMODREL© (PhotoVoltaic MODule RELiability) new software developed in the University of Angers. This new tool permits us to evaluate the lifetime and reliability of a PV module whatever its geographical location and environmental conditions. The electrical power output of a PV module decreases with time mainly as a result of the effects of corrosion, encapsulation discoloration, and solder bond failure. The failure of a PV module is defined as the point where the electrical power degradation reaches a given threshold value. Accelerated life tests (ALTs) are commonly used to assess the reliability of a PV module. However, ALTs provide limited data on the failure of a module and these tests are expensive to carry out. One possible solution is to conduct accelerated degradation tests. The Wiener process in conjunction with the accelerated failure time model makes it possible to carry out numerous simulations and thus to determine the failure time distribution based on the aforementioned threshold value. By this means, the failure time distribution and the lifetime (mean and uncertainty) can be evaluated. An example using the damp heat test is shown to demonstrate the usefulness PVMODREL. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=lifetime" title="lifetime">lifetime</a>, <a href="https://publications.waset.org/abstracts/search?q=reliability" title=" reliability"> reliability</a>, <a href="https://publications.waset.org/abstracts/search?q=PV%20Module" title=" PV Module"> PV Module</a>, <a href="https://publications.waset.org/abstracts/search?q=accelerated%20life%20testing" title=" accelerated life testing"> accelerated life testing</a>, <a href="https://publications.waset.org/abstracts/search?q=accelerated%20degradation%20testing" title=" accelerated degradation testing"> accelerated degradation testing</a> </p> <a href="https://publications.waset.org/abstracts/23546/pvmodrel-development-based-on-reliability-evaluation-of-a-pv-module-using-accelerated-degradation-testing" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/23546.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">574</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">4</span> Investigation on Corrosion Behavior of Copper Brazed Joints</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=A.%20M.%20Aminazad">A. M. Aminazad</a>, <a href="https://publications.waset.org/abstracts/search?q=A.%20M.%20Hadian"> A. M. Hadian</a>, <a href="https://publications.waset.org/abstracts/search?q=F.%20Ghasimakbari"> F. Ghasimakbari</a> </p> <p class="card-text"><strong>Abstract:</strong></p> DHP (Deoxidized High Phosphorus )copper is widely used in various heat transfer units such as, air conditioners refrigerators, evaporators and condensers. Copper sheets and tubes (ISODHP) were brazed with four different brazing alloys. Corrosion resistances of the joints were examined by polarization and salt spray tests. The selected fillers consisted of three silver-based brazing alloys (hard solder); AWS-BCu5 BAg8, DINLAg30, and a copper-based filler AWS BCuP2. All the joints were brazed utilizing four different brazing processes including furnace brazing under argon, vacuum, air atmosphere and torch brazing. All of the fillers were used with and without flux. The microstructure of the brazed sheets was examined using both optical and scanning electron microscope (SEM). Hardness and leak tests were carried out on all the brazed tubes. In all three silver brazing alloys selective and galvanic corrosion were observed in filler metals, but in copper phosphor alloys the copper adjacent to the joints were noticeably corroded by pitting method. Microstructure of damaged area showed selective attack of copper lamellae as well. Interfacial attack was observed along boundaries as well as copper attack within the filler metal itself. It was found that the samples brazed with BAg5 filler metal using vacuum furnace show a higher resistance to corrosion. They also have a good ductility in the brazed zone. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=copper" title="copper">copper</a>, <a href="https://publications.waset.org/abstracts/search?q=brazing" title=" brazing"> brazing</a>, <a href="https://publications.waset.org/abstracts/search?q=corrosion" title=" corrosion"> corrosion</a>, <a href="https://publications.waset.org/abstracts/search?q=filler%20metal" title=" filler metal"> filler metal</a> </p> <a href="https://publications.waset.org/abstracts/24596/investigation-on-corrosion-behavior-of-copper-brazed-joints" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/24596.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">470</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">3</span> Monitorization of Junction Temperature Using a Thermal-Test-Device</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=B.%20Arzhanov">B. Arzhanov</a>, <a href="https://publications.waset.org/abstracts/search?q=A.%20Correia"> A. Correia</a>, <a href="https://publications.waset.org/abstracts/search?q=P.%20Delgado"> P. Delgado</a>, <a href="https://publications.waset.org/abstracts/search?q=J.%20Meireles"> J. Meireles</a> </p> <p class="card-text"><strong>Abstract:</strong></p> Due to the higher power loss levels in electronic components, the thermal design of PCBs (Printed Circuit Boards) of an assembled device becomes one of the most important quality factors in electronics. Nonetheless, some of leading causes of the microelectronic component failures are due to higher temperatures, the leakages or thermal-mechanical stress, which is a concern, is the reliability of microelectronic packages. This article presents an experimental approach to measure the junction temperature of exposed pad packages. The implemented solution is in a prototype phase, using a temperature-sensitive parameter (TSP) to measure temperature directly on the die, validating the numeric results provided by the Mechanical APDL (Ansys Parametric Design Language) under same conditions. The physical device-under-test is composed by a Thermal Test Chip (TTC-1002) and assembly in a QFN cavity, soldered to a test-board according to JEDEC Standards. Monitoring the voltage drop across a forward-biased diode, is an indirectly method but accurate to obtain the junction temperature of QFN component with an applied power range between 0,3W to 1.5W. The temperature distributions on the PCB test-board and QFN cavity surface were monitored by an infra-red thermal camera (Goby-384) controlled and images processed by the Xeneth software. The article provides a set-up to monitorize in real-time the junction temperature of ICs, namely devices with the exposed pad package (i.e. QFN). Presenting the PCB layout parameters that the designer should use to improve thermal performance, and evaluate the impact of voids in solder interface in the device junction temperature. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=quad%20flat%20no-Lead%20packages" title="quad flat no-Lead packages">quad flat no-Lead packages</a>, <a href="https://publications.waset.org/abstracts/search?q=exposed%20pads" title=" exposed pads"> exposed pads</a>, <a href="https://publications.waset.org/abstracts/search?q=junction%20temperature" title=" junction temperature"> junction temperature</a>, <a href="https://publications.waset.org/abstracts/search?q=thermal%20management%20and%20measurements" title=" thermal management and measurements"> thermal management and measurements</a> </p> <a href="https://publications.waset.org/abstracts/39505/monitorization-of-junction-temperature-using-a-thermal-test-device" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/39505.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">286</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">2</span> Reliability of Dissimilar Metal Soldered Joint in Fabrication of Electromagnetic Interference Shielded Door Frame </h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Rehan%20Waheed">Rehan Waheed</a>, <a href="https://publications.waset.org/abstracts/search?q=Hasan%20Aftab%20Saeed"> Hasan Aftab Saeed</a>, <a href="https://publications.waset.org/abstracts/search?q=Wasim%20Tarar"> Wasim Tarar</a>, <a href="https://publications.waset.org/abstracts/search?q=Khalid%20Mahmood"> Khalid Mahmood</a>, <a href="https://publications.waset.org/abstracts/search?q=Sajid%20Ullah%20Butt"> Sajid Ullah Butt </a> </p> <p class="card-text"><strong>Abstract:</strong></p> Electromagnetic Interference (EMI) shielded doors made from brass extruded channels need to be welded with shielded enclosures to attain optimum shielding performance. Control of welding induced distortion is a problem in welding dissimilar metals like steel and brass. In this research, soldering of the steel-brass joint has been proposed to avoid weld distortion. The material used for brass channel is UNS C36000. The thickness of brass is defined by the manufacturing process, i.e. extrusion. The thickness of shielded enclosure material (ASTM A36) can be varied to produce joint between the dissimilar metals. Steel sections of different gauges are soldered using (91% tin, 9% zinc) solder to the brass, and strength of joint is measured by standard test procedures. It is observed that thin steel sheets produce a stronger bond with brass. The steel sections further require to be welded with shielded enclosure steel sheets through TIG welding process. Stresses and deformation in the vicinity of soldered portion is calculated through FE simulation. Crack formation in soldered area is also studied through experimental work. It has been found that in thin sheets deformation produced due to applied force is localized and has no effect on soldered joint area whereas in thick sheets profound cracks have been observed in soldered joint. The shielding effectiveness of EMI shielded door is compromised due to these cracks. The shielding effectiveness of the specimens is tested and results are compared. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=dissimilar%20metal" title="dissimilar metal">dissimilar metal</a>, <a href="https://publications.waset.org/abstracts/search?q=EMI%20shielding" title=" EMI shielding"> EMI shielding</a>, <a href="https://publications.waset.org/abstracts/search?q=joint%20strength" title=" joint strength"> joint strength</a>, <a href="https://publications.waset.org/abstracts/search?q=soldering" title=" soldering"> soldering</a> </p> <a href="https://publications.waset.org/abstracts/94980/reliability-of-dissimilar-metal-soldered-joint-in-fabrication-of-electromagnetic-interference-shielded-door-frame" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/94980.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">163</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">1</span> Thermal Securing of Electrical Contacts inside Oil Power Transformers</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Ioan%20Rusu">Ioan Rusu</a> </p> <p class="card-text"><strong>Abstract:</strong></p> In the operation of power transformers of 110 kV/MV from substations, these are traveled by fault current resulting from MV line damage. Defect electrical contacts are heated when they are travelled from fault currents. In the case of high temperatures when 135 °C is reached, the electrical insulating oil in the vicinity of the electrical faults comes into contact with these contacts releases gases, and activates the electrical protection. To avoid auto-flammability of electro-insulating oil, we designed a security system thermal of electrical contact defects by pouring fire-resistant polyurethane foam, mastic or mortar fire inside a cardboard electro-insulating cylinder. From practical experience, in the exploitation of power transformers of 110 kV/MT in oil electro-insulating were recorded some passing disconnecting commanded by the gas protection at internal defects. In normal operation and in the optimal load, nominal currents do not require thermal secure contacts inside electrical transformers, contacts are made at the fabrication according to the projects or to repair by solder. In the case of external short circuits close to the substation, the contacts inside electrical transformers, even if they are well made in sizes of Rcontact = 10<sup>‑6</sup> Ω, are subjected to short-circuit currents of the order of 10 kA-20 kA which lead to the dissipation of some significant second-order electric powers, 100 W-400 W, on contact. At some internal or external factors which action on electrical contacts, including electrodynamic efforts at short-circuits, these factors could be degraded over time to values in the range of 10<sup>-4</sup> Ω to 10<sup>-5 </sup>Ω and if the action time of protection is great, on the order of seconds, power dissipation on electrical contacts achieve high values of 1,0 kW to 40,0 kW. This power leads to strong local heating, hundreds of degrees Celsius and can initiate self-ignition and burning oil in the vicinity of electro-insulating contacts with action the gas relay. Degradation of electrical contacts inside power transformers may not be limited for the duration of their operation. In order to avoid oil burn with gas release near electrical contacts, at short-circuit currents 10 kA-20 kA, we have outlined the following solutions: covering electrical contacts in fireproof materials that would avoid direct burn oil at short circuit and transmission of heat from electrical contact along the conductors with heat dissipation gradually over time, in a large volume of cooling. Flame retardant materials are: polyurethane foam, mastic, cement (concrete). In the normal condition of operation of transformer, insulating of conductors coils is with paper and insulating oil. Ignition points of its two components respectively are approximated: 135 °C heat for oil and 200 <sup>0</sup>C for paper. In the case of a faulty electrical contact, about 10<sup>-3 </sup>Ω, at short-circuit; the temperature can reach for a short time, a value of 300 °C-400 °C, which ignite the paper and also the oil. By burning oil, there are local gases that disconnect the power transformer. Securing thermal electrical contacts inside the transformer, in cardboard tube with polyurethane foams, mastik or cement, ensures avoiding gas release and also gas protection working. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=power%20transformer" title="power transformer">power transformer</a>, <a href="https://publications.waset.org/abstracts/search?q=oil%20insulatation" title=" oil insulatation"> oil insulatation</a>, <a href="https://publications.waset.org/abstracts/search?q=electric%20contacts" title=" electric contacts"> electric contacts</a>, <a href="https://publications.waset.org/abstracts/search?q=Bucholtz%20relay" title=" Bucholtz relay"> Bucholtz relay</a> </p> <a href="https://publications.waset.org/abstracts/84051/thermal-securing-of-electrical-contacts-inside-oil-power-transformers" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/84051.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">158</span> </span> </div> </div> </div> </main> <footer> <div id="infolinks" class="pt-3 pb-2"> <div class="container"> <div style="background-color:#f5f5f5;" class="p-3"> <div class="row"> <div class="col-md-2"> <ul class="list-unstyled"> About <li><a href="https://waset.org/page/support">About Us</a></li> <li><a href="https://waset.org/page/support#legal-information">Legal</a></li> <li><a target="_blank" rel="nofollow" href="https://publications.waset.org/static/files/WASET-16th-foundational-anniversary.pdf">WASET celebrates its 16th foundational anniversary</a></li> </ul> </div> <div class="col-md-2"> <ul class="list-unstyled"> Account <li><a href="https://waset.org/profile">My Account</a></li> </ul> </div> <div class="col-md-2"> <ul class="list-unstyled"> Explore <li><a href="https://waset.org/disciplines">Disciplines</a></li> <li><a href="https://waset.org/conferences">Conferences</a></li> <li><a href="https://waset.org/conference-programs">Conference Program</a></li> <li><a href="https://waset.org/committees">Committees</a></li> <li><a href="https://publications.waset.org">Publications</a></li> </ul> </div> <div class="col-md-2"> <ul class="list-unstyled"> Research <li><a href="https://publications.waset.org/abstracts">Abstracts</a></li> <li><a href="https://publications.waset.org">Periodicals</a></li> <li><a href="https://publications.waset.org/archive">Archive</a></li> </ul> </div> <div class="col-md-2"> <ul class="list-unstyled"> Open Science <li><a target="_blank" rel="nofollow" href="https://publications.waset.org/static/files/Open-Science-Philosophy.pdf">Open Science Philosophy</a></li> <li><a target="_blank" rel="nofollow" href="https://publications.waset.org/static/files/Open-Science-Award.pdf">Open Science Award</a></li> <li><a target="_blank" rel="nofollow" href="https://publications.waset.org/static/files/Open-Society-Open-Science-and-Open-Innovation.pdf">Open Innovation</a></li> <li><a target="_blank" rel="nofollow" href="https://publications.waset.org/static/files/Postdoctoral-Fellowship-Award.pdf">Postdoctoral Fellowship Award</a></li> <li><a target="_blank" rel="nofollow" href="https://publications.waset.org/static/files/Scholarly-Research-Review.pdf">Scholarly Research Review</a></li> </ul> </div> <div class="col-md-2"> <ul class="list-unstyled"> Support <li><a href="https://waset.org/page/support">Support</a></li> <li><a href="https://waset.org/profile/messages/create">Contact Us</a></li> <li><a href="https://waset.org/profile/messages/create">Report Abuse</a></li> </ul> </div> </div> </div> </div> </div> <div class="container text-center"> <hr style="margin-top:0;margin-bottom:.3rem;"> <a href="https://creativecommons.org/licenses/by/4.0/" target="_blank" class="text-muted small">Creative Commons Attribution 4.0 International License</a> <div id="copy" class="mt-2">© 2024 World Academy of Science, Engineering and Technology</div> </div> </footer> <a href="javascript:" id="return-to-top"><i class="fas fa-arrow-up"></i></a> <div class="modal" id="modal-template"> <div class="modal-dialog"> <div class="modal-content"> <div class="row m-0 mt-1"> <div class="col-md-12"> <button type="button" class="close" data-dismiss="modal" aria-label="Close"><span aria-hidden="true">×</span></button> </div> </div> <div class="modal-body"></div> </div> </div> </div> <script src="https://cdn.waset.org/static/plugins/jquery-3.3.1.min.js"></script> <script src="https://cdn.waset.org/static/plugins/bootstrap-4.2.1/js/bootstrap.bundle.min.js"></script> <script src="https://cdn.waset.org/static/js/site.js?v=150220211556"></script> <script> jQuery(document).ready(function() { /*jQuery.get("https://publications.waset.org/xhr/user-menu", function (response) { jQuery('#mainNavMenu').append(response); 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