<?xml version="1.0" encoding="UTF-8"?> <article key="pdf/10002143" mdate="2015-07-02 00:00:00"> <author>Jaibir Sharma and Lee JaeWung and Merugu Srinivas and Navab Singh</author> <title>Preparation of Porous Metal Membrane by Thermal Annealing for Thin Film Encapsulation</title> <pages>1092 - 1095</pages> <year>2015</year> <volume>9</volume> <number>9</number> <journal>International Journal of Materials and Metallurgical Engineering</journal> <ee>https://publications.waset.org/pdf/10002143</ee> <url>https://publications.waset.org/vol/105</url> <publisher>World Academy of Science, Engineering and Technology</publisher> <abstract>This paper presents thermal annealing dewetting technique for the preparation of porous metal membrane for Thin Film Encapsulation (TFE) application. Thermal annealing dewetting experimental results reveal that pore size formation in porous metal membrane depend upon i.e. 1. The substrate at which metal is deposited, 2. Melting point of metal used for porous metal cap layer membrane formation, 3. Thickness of metal used for cap layer, 4. Temperature used for formation of porous metal membrane. In order to demonstrate this technique, Silver (Ag) was used as a metal for preparation of porous metal membrane on amorphous silicon (aSi) and silicon oxide. The annealing of the silver thin film of various thicknesses was performed at different temperature. Pores in porous silver film were analyzed using Scanning Electron Microscope (SEM). In order to check the usefulness of porous metal film for TFE application, the porous silver film prepared on amorphous silicon (a Si) and silicon oxide was released using XeF2 and VHF, respectively. Finally, guide line and structures are suggested to use this porous membrane for robust TFE application.</abstract> <index>Open Science Index 105, 2015</index> </article>