{"title":"A Methodological Approach for Detecting Burst Noise in the Time Domain","authors":"Liu Dan, Wang Xue, Wang Guiqin, Qian Zhihong","volume":34,"journal":"International Journal of Electronics and Communication Engineering","pagesStart":1883,"pagesEnd":1888,"ISSN":"1307-6892","URL":"https:\/\/publications.waset.org\/pdf\/4247","abstract":"The burst noise is a kind of noises that are destructive\r\nand frequently found in semiconductor devices and ICs, yet detecting\r\nand removing the noise has proved challenging for IC designers or users. According to the properties of burst noise, a methodological\r\napproach is presented (proposed) in the paper, by which the burst noise\r\ncan be analysed and detected in time domain. In this paper, principles\r\nand properties of burst noise are expounded first, Afterwards,\r\nfeasibility (viable) of burst noise detection by means of wavelet\r\ntransform in the time domain is corroborated in the paper, and the multi-resolution characters of Gaussian noise, burst noise and blurred\r\nburst noise are discussed in details by computer emulation. Furthermore, the practical method to decide parameters of wavelet\r\ntransform is acquired through a great deal of experiment and data statistics. The methodology may yield an expectation in a wide variety of applications.","references":"[1] Yasuo Ebara, Hideaki Sone and Yoshiaki Nemoto. Correlation between\r\narcing phenomena and electromagnetic noise of opening electric contacts.\r\nProceedings of the Forty-Sixth IEEE Holm Conference on 25-27 Sept.\r\n2000 Page(s):191 - 197.\r\n[2] S T Hsu, R J Whitter, C A Mead. Physical model for burst noise in semiconductor devices. 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