TY - JFULL AU - Ki-Young Kim and Jae-Ho Lim and Deok-Min Kim and Seok-Yoon Kim PY - 2010/12/ TI - Average Current Estimation Technique for Reliability Analysis of Multiple Semiconductor Interconnects T2 - International Journal of Computer and Information Engineering SP - 1682 EP - 1687 VL - 4 SN - 1307-6892 UR - https://publications.waset.org/pdf/509 PU - World Academy of Science, Engineering and Technology NX - Open Science Index 47, 2010 N2 - Average current analysis checking the impact of current flow is very important to guarantee the reliability of semiconductor systems. As semiconductor process technologies improve, the coupling capacitance often become bigger than self capacitances. In this paper, we propose an analytic technique for analyzing average current on interconnects in multi-conductor structures. The proposed technique has shown to yield the acceptable errors compared to HSPICE results while providing computational efficiency. ER -