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var $lessLink = $(".js-mobile-nav-collapse-trigger"); var $section = $('.js-mobile-nav-expand-section'); $moreLink.click(function(ev){ ev.preventDefault(); $moreLink.hide(); $lessLink.show(); $section.collapse('show'); }); $lessLink.click(function(ev){ ev.preventDefault(); $moreLink.show(); $lessLink.hide(); $section.collapse('hide'); }); })() if ($a.is_logged_in() || false) { new Aedu.NavigationController({ el: '.js-main-nav', showHighlightedNotification: false }); } else { $(".js-header-login-url").attr("href", $a.loginUrlWithRedirect()); } Aedu.autocompleteSearch = new AutocompleteSearch({el: '.js-SiteSearch-form'});</script></div></div> <div id='site' class='fixed'> <div id="content" class="clearfix"> <script>document.addEventListener('DOMContentLoaded', function(){ var $dismissible = $(".dismissible_banner"); $dismissible.click(function(ev) { $dismissible.hide(); }); });</script> <div class="DesignSystem" style="margin-top:-40px"><div class="PageHeader"><div class="container"><div class="row"><div class="col-xs-12 clearfix"><div class="u-floatLeft u-fs24 u-tcGrayDarkest"><span class="PageHeader-title u-m0x u-fw700 u-mr5x u-pr5x u-borderColorGrayLight u-borderRight1"><a href="https://nrc-ca.academia.edu/"><span class="u-linkUnstyled u-tcGrayDarkest">National Research Council Canada</span></a></span><h1 class="u-m0x u-fw300 u-fs24 u-displayInline">National Institute for Nanotechnology</h1></div><div class="u-floatRight u-mt1x"></div></div></div></div></div><div class="TabbedNavigation"><div class="container"><div class="row"><div class="col-xs-12 clearfix"><ul class="nav u-m0x u-p0x list-inline"><li class="u-floatLeft u-pr5x u-mr5x u-borderColorGrayLight u-borderRight1"><a href="https://nrc-ca.academia.edu/"><span><i class="fa fa-arrow-left"></i>  All Departments</span></a></li><li class="u-floatLeft active"><a href="https://nrc-ca.academia.edu/Departments/National_Institute_for_Nanotechnology/Documents">88 Papers</a></li><li class="u-floatLeft"><a href="https://nrc-ca.academia.edu/Departments/National_Institute_for_Nanotechnology">2 Researchers</a></li></ul></div></div></div></div><div class="container"><div class="row"><div class="col-xs-12"><div class="u-displayFlex"><div class="u-flexGrow1"><div class="u-ph0x"><div class="works"><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18049812 coauthored" data-work_id="18049812" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18049812/Multilayer_route_to_iron_nanoparticle_formation_in_an_insulating_matrix">Multilayer route to iron nanoparticle formation in an insulating matrix</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">Well-protected, isolated bcc-iron nanoparticles embedded in silicon dioxide were prepared by e-beam evaporation and postannealing of multilayers in an ultrahigh vacuum system. The spherical shape and isolation of the particles were... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18049812" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">Well-protected, isolated bcc-iron nanoparticles embedded in silicon dioxide were prepared by e-beam evaporation and postannealing of multilayers in an ultrahigh vacuum system. The spherical shape and isolation of the particles were confirmed by plan-view and cross-sectional transmission electron microscopy. Oxidation was evaluated from the electron energy-loss near edge structure. In this technique, a postedge peak of 40 eV above the iron L 3 threshold, originating from backscattering of oxygen atoms, provides a clear indication of iron oxide. The white-line ratio ͑WLR͒, measuring the 3d-orbital occupancy, is used to estimate the oxidation-layer thickness. In the samples of large iron nanoparticles ͑with average diameter larger than 10 nm͒, a very thin surface layer appears to be the oxide maghemite, approximately one atomic layer according to the WLR evaluations. The evolution of the coercivity with particle size, as measured by the magneto-optical Kerr effect, shows that the reversal process is dominated by the surface anisotropy and is also affected by the dipole interaction, particularly in samples with large volume-filling factor.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18049812" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="3ef87de5cf3dc6ce97aeb7571f988d96" rel="nofollow" data-download="{"attachment_id":39848575,"asset_id":18049812,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/39848575/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="37991116" href="https://independent.academia.edu/RayEgerton">Ray Egerton</a><script data-card-contents-for-user="37991116" type="text/json">{"id":37991116,"first_name":"Ray","last_name":"Egerton","domain_name":"independent","page_name":"RayEgerton","display_name":"Ray Egerton","profile_url":"https://independent.academia.edu/RayEgerton","photo":"https://0.academia-photos.com/37991116/20230684/19951353/s65_ray.egerton.jpg"}</script></span></span><span class="u-displayInlineBlock InlineList-item-text"> and <span class="u-textDecorationUnderline u-clickable InlineList-item-text js-work-more-authors-18049812">+1</span><div class="hidden js-additional-users-18049812"><div><span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a></span></div></div></span><script>(function(){ var popoverSettings = { el: $('.js-work-more-authors-18049812'), placement: 'bottom', hide_delay: 200, html: true, content: function(){ return $('.js-additional-users-18049812').html(); 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The evolution of the coercivity with particle size, as measured by the magneto-optical Kerr effect, shows that the reversal process is dominated by the surface anisotropy and is also affected by the dipole interaction, particularly in samples with large volume-filling factor.","publication":"Journal of Applied Physics","publication_with_fallback":"Journal of Applied 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})();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18049817 coauthored" data-work_id="18049817" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18049817/Controlled_Growth_of_Silicon_Oxide_Nanowires_from_a_Patterned_Reagent">Controlled Growth of Silicon Oxide Nanowires from a Patterned Reagent</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">A new process to fabricate silicon oxide nanowires (NWs) from a patterned reagent is reported. Arrays of NWs grow on patterned nanodots containing exposed hydrogen silsesquioxane (HSQ)/Fe-SiO 2 nanocomposites during annealing at 900°C.... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18049817" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">A new process to fabricate silicon oxide nanowires (NWs) from a patterned reagent is reported. Arrays of NWs grow on patterned nanodots containing exposed hydrogen silsesquioxane (HSQ)/Fe-SiO 2 nanocomposites during annealing at 900°C. The NWs were seeded by metallic iron nanoparticles, and the resulting microstructure and morphology of the NWs is directly related to the size of the individual iron nanoparticles. The growth process could be dominated by a solid-state transformation mechanism in which iron nanoparticles, originally embedded in a SiO 2 matrix, diffuse to the surface and act as nucleation sites, the exposed HSQ being the source for the growing NWs.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18049817" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="e86585bc3e10854387e453b5164e65ba" rel="nofollow" data-download="{"attachment_id":39848569,"asset_id":18049817,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/39848569/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="37991116" href="https://independent.academia.edu/RayEgerton">Ray Egerton</a><script data-card-contents-for-user="37991116" type="text/json">{"id":37991116,"first_name":"Ray","last_name":"Egerton","domain_name":"independent","page_name":"RayEgerton","display_name":"Ray Egerton","profile_url":"https://independent.academia.edu/RayEgerton","photo":"https://0.academia-photos.com/37991116/20230684/19951353/s65_ray.egerton.jpg"}</script></span></span><span class="u-displayInlineBlock InlineList-item-text"> and <span class="u-textDecorationUnderline u-clickable InlineList-item-text js-work-more-authors-18049817">+2</span><div class="hidden js-additional-users-18049817"><div><span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a></span></div><div><span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a href="https://independent.academia.edu/JVeinot">J. 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Arrays of NWs grow on patterned nanodots containing exposed hydrogen silsesquioxane (HSQ)/Fe-SiO 2 nanocomposites during annealing at 900°C. The NWs were seeded by metallic iron nanoparticles, and the resulting microstructure and morphology of the NWs is directly related to the size of the individual iron nanoparticles. 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u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18049821/Electron_beam_patterning_with_sub_2_nm_line_edge_roughness">Electron-beam patterning with sub-2 nm line edge roughness</a></div></div><div class="u-pb4x u-mt3x"></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18049821" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="82debd7023514ae80d803ef8bb0e42a3" rel="nofollow" data-download="{"attachment_id":39848570,"asset_id":18049821,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" 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u-tcGrayDarkest"><div class="summarized">Minimizing the electron irradiation dose is crucial for radiation sensitive (biological) samples. A (Zernike) phase plate (PP) in a TEM reduces the irradiation dose needed to obtain a desired signal to noise ratio (SNR) . This is achieved... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18049822" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">Minimizing the electron irradiation dose is crucial for radiation sensitive (biological) samples. A (Zernike) phase plate (PP) in a TEM reduces the irradiation dose needed to obtain a desired signal to noise ratio (SNR) . This is achieved mainly by efficient transfer of low spatial frequencies that have large contribution to intensity in phase imaging.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18049822" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="7acb396e10d9bbc0d9203a8d482228c6" rel="nofollow" data-download="{"attachment_id":39848573,"asset_id":18049822,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/39848573/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="37991116" href="https://independent.academia.edu/RayEgerton">Ray Egerton</a><script data-card-contents-for-user="37991116" type="text/json">{"id":37991116,"first_name":"Ray","last_name":"Egerton","domain_name":"independent","page_name":"RayEgerton","display_name":"Ray Egerton","profile_url":"https://independent.academia.edu/RayEgerton","photo":"https://0.academia-photos.com/37991116/20230684/19951353/s65_ray.egerton.jpg"}</script></span></span><span class="u-displayInlineBlock InlineList-item-text"> and <span class="u-textDecorationUnderline u-clickable InlineList-item-text js-work-more-authors-18049822">+2</span><div class="hidden js-additional-users-18049822"><div><span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a></span></div><div><span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a href="https://dtu.academia.edu/MarcoBeleggia">Marco Beleggia</a></span></div></div></span><script>(function(){ var popoverSettings = { el: $('.js-work-more-authors-18049822'), placement: 'bottom', hide_delay: 200, html: true, content: function(){ return $('.js-additional-users-18049822').html(); 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The synthetic approach uses galvanic displacement, a type of electroless... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736448" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">This work focuses on the synthesis and interfacial characterization of gold nanostructures on silicon surfaces, including Si(111), Si(100), and Si nanowires. The synthetic approach uses galvanic displacement, a type of electroless deposition that takes place in an efficient manner under aqueous, room-temperature conditions. The case of gold-on-silicon has been widely studied and used for several applications and yet, a number of important, fundamental questions remain as to the nature of the interface. Some studies are suggestive of heteroepitaxial growth of gold on the silicon surface, whereas others point to the existence of a silicon؊gold intermetallic sandwiched between the metallic gold and the underlying silicon substrate. Through detailed high resolution transmission electron microscopy (TEM), combined with selected area electron diffraction (SAED) and nanobeam diffraction (NBD), heteroepitaxial gold that is grown by galvanic displacement is confirmed on both Si(100) and Si(111), as well as silicon nanowires. The coincident site lattice (CSL) of gold-on-silicon results in a very small 0.2% lattice mismatch due to the coincidence of four gold lattices to three of silicon. The presence of gold؊silicon intermetallics is suggested by the appearance of additional spots in the electron diffraction data. The gold؊silicon interfaces appear heterogeneous with distinct areas of heteroepitaxial gold on silicon, and others, less well-defined, where intermetallics may reside. The high resolution cross-sectional TEM images reveal a roughened silicon interface under these aqueous galvanic displacement conditions, which most likely promotes nucleation of metallic gold islands that merge over time: a Volmer؊Weber growth mechanism in the initial stages.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736448" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="2fd6c61653aa3b02a7bb371e3b1600b1" rel="nofollow" data-download="{"attachment_id":42066029,"asset_id":18736448,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/42066029/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736448 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736448"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736448, container: ".js-paper-rank-work_18736448", }); 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The synthetic approach uses galvanic displacement, a type of electroless deposition that takes place in an efficient manner under aqueous, room-temperature conditions. The case of gold-on-silicon has been widely studied and used for several applications and yet, a number of important, fundamental questions remain as to the nature of the interface. Some studies are suggestive of heteroepitaxial growth of gold on the silicon surface, whereas others point to the existence of a silicon؊gold intermetallic sandwiched between the metallic gold and the underlying silicon substrate. Through detailed high resolution transmission electron microscopy (TEM), combined with selected area electron diffraction (SAED) and nanobeam diffraction (NBD), heteroepitaxial gold that is grown by galvanic displacement is confirmed on both Si(100) and Si(111), as well as silicon nanowires. The coincident site lattice (CSL) of gold-on-silicon results in a very small 0.2% lattice mismatch due to the coincidence of four gold lattices to three of silicon. The presence of gold؊silicon intermetallics is suggested by the appearance of additional spots in the electron diffraction data. The gold؊silicon interfaces appear heterogeneous with distinct areas of heteroepitaxial gold on silicon, and others, less well-defined, where intermetallics may reside. The high resolution cross-sectional TEM images reveal a roughened silicon interface under these aqueous galvanic displacement conditions, which most likely promotes nucleation of metallic gold islands that merge over time: a Volmer؊Weber growth mechanism in the initial stages.","publication":"ACS Nano","publication_with_fallback":"ACS Nano","downloadable_attachments":[{"id":42066029,"asset_id":18736448,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/42066029/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/42066029/Heteroepitaxial_Growth_of_Gold_Nanostruc20160204-30232-1ec1ps8-libre.pdf?1454610198=\u0026response-content-disposition=attachment%3B+filename%3DHeteroepitaxial_Growth_of_Gold_Nanostruc.pdf\u0026Expires=1739813678\u0026Signature=bjKUBsT3LjKMtw8UCL6zL5s9XXiyTjpe89sMTHGnaJQIjxGdx20KFx5SUSOkKLzU-jgExh4VlDfCqfm99iHdSCkf7N6QXx0GrHQIQWappwqX2YA0sweMr7UlO~CbErjFCtCb41uWILDshZrWU5dWmr1E31muPjtgcGtwy9MuGlvKdkkAOOmAn9vxeM7EyHQdSo91101Edj7s748MnlRScBLLFKoI6Oqq4tpD6C7y2-A81X4UUHc5Y~j4UinWW6fSsVxYOloZ3Ire~1C7uEACNrxA096x8ZcxJjlg-H5L~7K2jyeIhgRMYxftLK9dTY4POTh4LkNw7OK1owDj7YW3KQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/42066029/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/42066029/mini_magick20190218-4899-1cbqpzt.png?1550494916"}],"downloadable_attachments_with_full_thumbnails":[{"id":42066029,"asset_id":18736448,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/42066029/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/42066029/Heteroepitaxial_Growth_of_Gold_Nanostruc20160204-30232-1ec1ps8-libre.pdf?1454610198=\u0026response-content-disposition=attachment%3B+filename%3DHeteroepitaxial_Growth_of_Gold_Nanostruc.pdf\u0026Expires=1739813678\u0026Signature=bjKUBsT3LjKMtw8UCL6zL5s9XXiyTjpe89sMTHGnaJQIjxGdx20KFx5SUSOkKLzU-jgExh4VlDfCqfm99iHdSCkf7N6QXx0GrHQIQWappwqX2YA0sweMr7UlO~CbErjFCtCb41uWILDshZrWU5dWmr1E31muPjtgcGtwy9MuGlvKdkkAOOmAn9vxeM7EyHQdSo91101Edj7s748MnlRScBLLFKoI6Oqq4tpD6C7y2-A81X4UUHc5Y~j4UinWW6fSsVxYOloZ3Ire~1C7uEACNrxA096x8ZcxJjlg-H5L~7K2jyeIhgRMYxftLK9dTY4POTh4LkNw7OK1owDj7YW3KQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/42066029/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/42066029/mini_magick20190218-4899-1cbqpzt.png?1550494916"}],"has_pdf":true,"has_fulltext":true,"page_count":10,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}],"research_interests":[{"id":28235,"name":"Multidisciplinary","url":"https://www.academia.edu/Documents/in/Multidisciplinary","nofollow":true}],"publication_year":2009,"publication_year_with_fallback":2009,"paper_rank":null,"all_time_views":98,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736450" data-work_id="18736450" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736450/Preparation_and_evaluation_of_hydrotreating_catalysts_based_on_activated_carbon_derived_from_oil_sand_petroleum_coke">Preparation and evaluation of hydrotreating catalysts based on activated carbon derived from oil sand petroleum coke</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">Novel Ni-Mo/activated carbon (AC) hydrotreating catalysts were prepared and evaluated for upgrading heavy vacuum gas oil (HVGO). The AC supports were derived from Alberta oil sand petroleum coke, i.e. fluid coke and/or delayed coke,... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736450" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">Novel Ni-Mo/activated carbon (AC) hydrotreating catalysts were prepared and evaluated for upgrading heavy vacuum gas oil (HVGO). The AC supports were derived from Alberta oil sand petroleum coke, i.e. fluid coke and/or delayed coke, hereafter referred to as OSP coke, through a chemical process. The BET surface area was as high as 2194 m 2 /g for the fluid coke derived AC and 2357 m 2 /g for the delayed coke derived AC. Both ACs contained a large number of micropores with pore volume as high as 1.2 cm 3 /g. Ni and Mo based active component precursors could be easily loaded on the activated carbon supports by chemical impregnation of nickel nitrate and ammonium molybdate followed by calcination in nitrogen at 773 K without further modification or oxidation treatment to the activated carbons. Scanning electron microscopy (SEM) observation showed highly porous surface structure of the bare activated carbon supports and well dispersed metal (oxide) precursor nanoparticles of 30-50 nm loaded on the AC supports. For comparison, two reference catalysts were also prepared by the same procedure but using commercial activated carbon and porous alumina as supports. After catalyst activation by sulfiding, the hydrotreating performance of the prepared catalysts was evaluated in a magnetically stirred autoclave with a HVGO feedstock to examine their hydrodesulfurization (HDS) and hydrodenitrogenation (HDN) activities. Two commercial hydrotreating catalysts were also tested and compared under similar conditions with the same feed. The results showed that the catalysts based on the activated carbon supports prepared from OSP coke had better hydrotreating performance than the other catalysts. Scanning transmission electron microscopy (STEM) characterization of the catalysts after activation showed that small particles of nanostructure (2-5 nm in size) were evenly embedded in the carbon matrix except for some bigger particles that were located on the catalyst surface. Energy dispersive X-ray (EDX) spectroscopy revealed that these particles were composed of Ni, Mo and S elements. The dispersed nanoparticles formed the active sites and were responsible for the observed high HDS and HDN activity. Elemental analysis and surface characterization of the spent catalysts showed that the formation of coke precursors was favored on the alumina supported catalyst, which resulted in catalyst deactivation.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736450" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="376aa0390d27c4de8c7e6819df377ce6" rel="nofollow" data-download="{"attachment_id":40227427,"asset_id":18736450,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227427/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736450 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736450"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736450, container: ".js-paper-rank-work_18736450", }); 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$(".js-view-count[data-work-id=18736450]").text(description); $(".js-view-count-work_18736450").attr('title', description).tooltip(); }); });</script></span><script>$(function() { $(".js-view-count-work_18736450").removeClass('hidden') })</script></div></li><li class="InlineList-item u-positionRelative" style="max-width: 250px"><div class="u-positionAbsolute" data-has-card-for-ri-list="18736450"><i class="fa fa-tag InlineList-item-icon u-positionRelative"></i></div><span class="InlineList-item-text u-textTruncate u-pl6x"><a class="InlineList-item-text" data-has-card-for-ri="72" rel="nofollow" href="https://www.academia.edu/Documents/in/Chemical_Engineering">Chemical Engineering</a><script data-card-contents-for-ri="72" type="text/json">{"id":72,"name":"Chemical Engineering","url":"https://www.academia.edu/Documents/in/Chemical_Engineering","nofollow":true}</script></span></li><script>(function(){ if (false) { new Aedu.ResearchInterestListCard({ el: $('*[data-has-card-for-ri-list=18736450]'), work: {"id":18736450,"title":"Preparation and evaluation of hydrotreating catalysts based on activated carbon derived from oil sand petroleum coke","created_at":"2015-11-20T21:20:23.951-08:00","owner_id":38806773,"url":"https://www.academia.edu/18736450/Preparation_and_evaluation_of_hydrotreating_catalysts_based_on_activated_carbon_derived_from_oil_sand_petroleum_coke","slug":"Preparation_and_evaluation_of_hydrotreating_catalysts_based_on_activated_carbon_derived_from_oil_sand_petroleum_coke","dom_id":"work_18736450","summary":"Novel Ni-Mo/activated carbon (AC) hydrotreating catalysts were prepared and evaluated for upgrading heavy vacuum gas oil (HVGO). The AC supports were derived from Alberta oil sand petroleum coke, i.e. fluid coke and/or delayed coke, hereafter referred to as OSP coke, through a chemical process. The BET surface area was as high as 2194 m 2 /g for the fluid coke derived AC and 2357 m 2 /g for the delayed coke derived AC. Both ACs contained a large number of micropores with pore volume as high as 1.2 cm 3 /g. Ni and Mo based active component precursors could be easily loaded on the activated carbon supports by chemical impregnation of nickel nitrate and ammonium molybdate followed by calcination in nitrogen at 773 K without further modification or oxidation treatment to the activated carbons. Scanning electron microscopy (SEM) observation showed highly porous surface structure of the bare activated carbon supports and well dispersed metal (oxide) precursor nanoparticles of 30-50 nm loaded on the AC supports. For comparison, two reference catalysts were also prepared by the same procedure but using commercial activated carbon and porous alumina as supports. After catalyst activation by sulfiding, the hydrotreating performance of the prepared catalysts was evaluated in a magnetically stirred autoclave with a HVGO feedstock to examine their hydrodesulfurization (HDS) and hydrodenitrogenation (HDN) activities. Two commercial hydrotreating catalysts were also tested and compared under similar conditions with the same feed. The results showed that the catalysts based on the activated carbon supports prepared from OSP coke had better hydrotreating performance than the other catalysts. Scanning transmission electron microscopy (STEM) characterization of the catalysts after activation showed that small particles of nanostructure (2-5 nm in size) were evenly embedded in the carbon matrix except for some bigger particles that were located on the catalyst surface. Energy dispersive X-ray (EDX) spectroscopy revealed that these particles were composed of Ni, Mo and S elements. The dispersed nanoparticles formed the active sites and were responsible for the observed high HDS and HDN activity. Elemental analysis and surface characterization of the spent catalysts showed that the formation of coke precursors was favored on the alumina supported catalyst, which resulted in catalyst deactivation.","publication":"Applied Catalysis A: General","publication_with_fallback":"Applied Catalysis A: General","downloadable_attachments":[{"id":40227427,"asset_id":18736450,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227427/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227427/Preparation_and_evaluation_of_hydrotreat20151120-9647-1wb3kf2-libre.pdf?1448083385=\u0026response-content-disposition=attachment%3B+filename%3DPreparation_and_evaluation_of_hydrotreat.pdf\u0026Expires=1739813678\u0026Signature=Vmwvc~D-snHP~Xr5CD9MEbbDKAWacoQVIbY7itJj4RODzKgatzC8m-fC-XCBJHfRCMluapkEtUdch1WfCn91PW5JwpnlhIAhkALbeckbcFL0fmHyDvCr9blGY-NjYX5GZsUvOA50AhSB2dNkQ8jE~98OGFbAJEpywW6r9eYVF2UDADFIxH57Hqfj3lFkwfgB1JQwPj78S0QuD2OpVTYBwscQ~WddIte9aO1Keb1UVhNRW1F1vwmYMADom4NazvlGeimScwC94fscxHQa9x~m2SBn6esAyN8JgYGHXh42HVQMkgspaZx2jUMa0eduzSPsz313N7Vj8wg~-DT9~ohAmw__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227427/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227427/mini_magick20190221-4568-60g2he.png?1550789148"}],"downloadable_attachments_with_full_thumbnails":[{"id":40227427,"asset_id":18736450,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227427/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227427/Preparation_and_evaluation_of_hydrotreat20151120-9647-1wb3kf2-libre.pdf?1448083385=\u0026response-content-disposition=attachment%3B+filename%3DPreparation_and_evaluation_of_hydrotreat.pdf\u0026Expires=1739813678\u0026Signature=Vmwvc~D-snHP~Xr5CD9MEbbDKAWacoQVIbY7itJj4RODzKgatzC8m-fC-XCBJHfRCMluapkEtUdch1WfCn91PW5JwpnlhIAhkALbeckbcFL0fmHyDvCr9blGY-NjYX5GZsUvOA50AhSB2dNkQ8jE~98OGFbAJEpywW6r9eYVF2UDADFIxH57Hqfj3lFkwfgB1JQwPj78S0QuD2OpVTYBwscQ~WddIte9aO1Keb1UVhNRW1F1vwmYMADom4NazvlGeimScwC94fscxHQa9x~m2SBn6esAyN8JgYGHXh42HVQMkgspaZx2jUMa0eduzSPsz313N7Vj8wg~-DT9~ohAmw__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227427/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227427/mini_magick20190221-4568-60g2he.png?1550789148"}],"has_pdf":true,"has_fulltext":true,"page_count":9,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}],"research_interests":[{"id":72,"name":"Chemical Engineering","url":"https://www.academia.edu/Documents/in/Chemical_Engineering","nofollow":true}],"publication_year":2012,"publication_year_with_fallback":2012,"paper_rank":null,"all_time_views":98,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736454" data-work_id="18736454" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736454/The_dielectric_response_of_the_H_sub_2_Ti_sub_3_O_sub_7_nanotube_investigated_by_valence_electron_energy_loss_spectroscopy">The dielectric response of the H[sub 2]Ti[sub 3]O[sub 7] nanotube investigated by valence electron energy loss spectroscopy</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">The dielectric response of an anisotropic nanostructure, individual H 2 Ti 3 O 7 nanotube with ϳ8 -10 nm diameter, has been investigated using both momentum transfer dependent and spatially resolved valence electron energy loss... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736454" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">The dielectric response of an anisotropic nanostructure, individual H 2 Ti 3 O 7 nanotube with ϳ8 -10 nm diameter, has been investigated using both momentum transfer dependent and spatially resolved valence electron energy loss spectroscopies. The dielectric response of an individual nanotube is found to be dominated by several surface related excitations and defect states, although its basic electronic structure ͑such as the band gap and single electron interband transitions͒ is similar to that of TiO 2 . The possible origins of the surface excitations in such a tubular structure are also discussed.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736454" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="f820c0ee5db13eb3e2565426affea32b" rel="nofollow" data-download="{"attachment_id":40227449,"asset_id":18736454,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227449/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736454 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736454"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736454, container: ".js-paper-rank-work_18736454", }); 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The dielectric response of an individual nanotube is found to be dominated by several surface related excitations and defect states, although its basic electronic structure ͑such as the band gap and single electron interband transitions͒ is similar to that of TiO 2 . The possible origins of the surface excitations in such a tubular structure are also discussed.","publication":"Applied Physics Letters","publication_with_fallback":"Applied Physics Letters","downloadable_attachments":[{"id":40227449,"asset_id":18736454,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227449/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227449/The_dielectric_response_of_the_H2Ti3O7_n20151120-9647-1gmvwa7-libre.pdf?1448083414=\u0026response-content-disposition=attachment%3B+filename%3DThe_dielectric_response_of_the_H_sub_2_T.pdf\u0026Expires=1738970856\u0026Signature=C~x7bVlYXQFGwg9R~-q29aVrXfGEQAwsAizstYh0TTUPLGucIDRCTbKTMM7gXABO9AvVQ8P-raCWiwa55huBx24X04bTgseJuRmEU7z3rousVQzxiUsDVkBmDnGcbjHZrdtigMMaQFh7isl9zUs72oc2BW3D--oyAYQfrtRtRI~NouI2S3kppJbSzfN7E24lK5e2xUWMTrDT5sDnsVyamxISs8sx3A5vX~dCF5e~hLGICibAFDn5qDDZG7tzp3Kze908bMPBNy~ZYlNyFQdL6BosgPl-5Q~kEiK3mlNl-E3C57~0f1jks2aT4NHwaGyIvDsGSZb~CKW421dB-FO5dg__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227449/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227449/mini_magick20190221-22248-kortag.png?1550789163"}],"downloadable_attachments_with_full_thumbnails":[{"id":40227449,"asset_id":18736454,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227449/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227449/The_dielectric_response_of_the_H2Ti3O7_n20151120-9647-1gmvwa7-libre.pdf?1448083414=\u0026response-content-disposition=attachment%3B+filename%3DThe_dielectric_response_of_the_H_sub_2_T.pdf\u0026Expires=1738970856\u0026Signature=C~x7bVlYXQFGwg9R~-q29aVrXfGEQAwsAizstYh0TTUPLGucIDRCTbKTMM7gXABO9AvVQ8P-raCWiwa55huBx24X04bTgseJuRmEU7z3rousVQzxiUsDVkBmDnGcbjHZrdtigMMaQFh7isl9zUs72oc2BW3D--oyAYQfrtRtRI~NouI2S3kppJbSzfN7E24lK5e2xUWMTrDT5sDnsVyamxISs8sx3A5vX~dCF5e~hLGICibAFDn5qDDZG7tzp3Kze908bMPBNy~ZYlNyFQdL6BosgPl-5Q~kEiK3mlNl-E3C57~0f1jks2aT4NHwaGyIvDsGSZb~CKW421dB-FO5dg__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227449/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227449/mini_magick20190221-22248-kortag.png?1550789163"}],"has_pdf":true,"has_fulltext":true,"page_count":3,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}],"research_interests":[{"id":48,"name":"Engineering","url":"https://www.academia.edu/Documents/in/Engineering","nofollow":true},{"id":118582,"name":"Physical sciences","url":"https://www.academia.edu/Documents/in/Physical_sciences","nofollow":true}],"publication_year":2009,"publication_year_with_fallback":2009,"paper_rank":null,"all_time_views":9,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736455 coauthored" data-work_id="18736455" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736455/From_nanoparticle_to_nanocable_Impact_of_size_and_geometrical_constraints_on_the_optical_modes_of_Si_SiO_sub_2_core_shell_nanostructures">From nanoparticle to nanocable: Impact of size and geometrical constraints on the optical modes of Si/SiO[sub 2] core/shell nanostructures</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">In the extinction spectra of Si/ SiO 2 core/shell nanostructures, peak features in the near UV region ͑3-5 eV͒ appear when the nanostructure geometrical configuration changes from spherical nanoparticles to cylindrical nanocables, with... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736455" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">In the extinction spectra of Si/ SiO 2 core/shell nanostructures, peak features in the near UV region ͑3-5 eV͒ appear when the nanostructure geometrical configuration changes from spherical nanoparticles to cylindrical nanocables, with the peak features become more intense in the nanocables of smaller core diameter. Similar feature at ϳ4.2 eV is also observed in the spatially resolved electron energy loss spectra ͑SREELS͒ of individual nanocable, but not in the nanoparticle. The EELS simulations unravel the origin of such excitation as the monopolar interface plasmon in cylindrical nano-objects, being responsible for the observed near UV extinction modes in nanocables.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736455" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="c20ce07aa7359375a35294d8c7887a8a" rel="nofollow" data-download="{"attachment_id":40227430,"asset_id":18736455,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227430/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span><span class="u-displayInlineBlock InlineList-item-text"> and <span class="u-textDecorationUnderline u-clickable InlineList-item-text js-work-more-authors-18736455">+1</span><div class="hidden js-additional-users-18736455"><div><span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a href="https://independent.academia.edu/MingwenChu">Ming-wen Chu</a></span></div></div></span><script>(function(){ var popoverSettings = { el: $('.js-work-more-authors-18736455'), placement: 'bottom', hide_delay: 200, html: true, content: function(){ return $('.js-additional-users-18736455').html(); 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Similar feature at ϳ4.2 eV is also observed in the spatially resolved electron energy loss spectra ͑SREELS͒ of individual nanocable, but not in the nanoparticle. The EELS simulations unravel the origin of such excitation as the monopolar interface plasmon in cylindrical nano-objects, being responsible for the observed near UV extinction modes in nanocables.","publication":"Applied Physics Letters","publication_with_fallback":"Applied Physics Letters","downloadable_attachments":[{"id":40227430,"asset_id":18736455,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227430/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227430/From_nanoparticle_to_nanocable_Impact_of20151120-9629-1h6mf9m-libre.pdf?1448083384=\u0026response-content-disposition=attachment%3B+filename%3DFrom_nanoparticle_to_nanocable_Impact_of.pdf\u0026Expires=1739813678\u0026Signature=TBxGPjyskIjS8UuVfC3xh8Mw6OAe8b9EXOoK-7pDmAZh2Ry~scxmsHAl1l8o1UFdohyGPwWBoqEziJrZR3dSUF7n~LEqhKedMwwTOOpuoq6rd6HgQTd~5M8EVDc4pWuk24laDlNI3sAOXot2FiHtjrdH9-0IN2Yal4Wz697Y0aPSBNW4kPCh8HCM7HF7JgkoiDB9-Qt4~IZKxDE8H87CcB77B2gK2-zFUQ6p06prMhpWB7ztZieyWHp68tzaAc5dgRzKaGf2IcehEgdFRQ9sFQVylIrM7ekE2r1-bbgoCvkN21oOfJmA9xcbcSXJ-pyBQSF1Pn134D8~iL~NseIlFQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227430/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227430/mini_magick20190221-19746-6hnrhn.png?1550789147"}],"downloadable_attachments_with_full_thumbnails":[{"id":40227430,"asset_id":18736455,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227430/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227430/From_nanoparticle_to_nanocable_Impact_of20151120-9629-1h6mf9m-libre.pdf?1448083384=\u0026response-content-disposition=attachment%3B+filename%3DFrom_nanoparticle_to_nanocable_Impact_of.pdf\u0026Expires=1739813678\u0026Signature=TBxGPjyskIjS8UuVfC3xh8Mw6OAe8b9EXOoK-7pDmAZh2Ry~scxmsHAl1l8o1UFdohyGPwWBoqEziJrZR3dSUF7n~LEqhKedMwwTOOpuoq6rd6HgQTd~5M8EVDc4pWuk24laDlNI3sAOXot2FiHtjrdH9-0IN2Yal4Wz697Y0aPSBNW4kPCh8HCM7HF7JgkoiDB9-Qt4~IZKxDE8H87CcB77B2gK2-zFUQ6p06prMhpWB7ztZieyWHp68tzaAc5dgRzKaGf2IcehEgdFRQ9sFQVylIrM7ekE2r1-bbgoCvkN21oOfJmA9xcbcSXJ-pyBQSF1Pn134D8~iL~NseIlFQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227430/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227430/mini_magick20190221-19746-6hnrhn.png?1550789147"}],"has_pdf":true,"has_fulltext":true,"page_count":3,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek 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Properties","url":"https://www.academia.edu/Documents/in/Optical_Properties"},{"id":1251963,"name":"Surface Plasmon","url":"https://www.academia.edu/Documents/in/Surface_Plasmon"},{"id":1332241,"name":"Electron Energy Loss Spectroscopy","url":"https://www.academia.edu/Documents/in/Electron_Energy_Loss_Spectroscopy"}],"publication_year":2009,"publication_year_with_fallback":2009,"paper_rank":null,"all_time_views":12,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736459" data-work_id="18736459" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736459/Electron_microscopy_study_of_CeO_sub_x_Pd_%CE%B1_Al_sub_2_O_sub_3_catalysts_for_methane_dry_reforming">Electron microscopy study of CeO[sub x]–Pd/α-Al[sub 2]O[sub 3] catalysts for methane dry reforming</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">We have investigated the interaction between Pd and Ce in a ͑0.47 wt %͒ CeO x -Pd͑1 wt %͒ / ␣-Al 2 O 3 catalyst that is used in the reforming reaction of CH 4 with CO 2 . The freshly reduced catalyst was characterized by various electron... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736459" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">We have investigated the interaction between Pd and Ce in a ͑0.47 wt %͒ CeO x -Pd͑1 wt %͒ / ␣-Al 2 O 3 catalyst that is used in the reforming reaction of CH 4 with CO 2 . The freshly reduced catalyst was characterized by various electron microscopy techniques, such as elemental mapping, Z-contrast imaging, and electron energy-loss spectroscopy to understand the role of Ce on a microscopic scale. The high spatial resolution elemental mapping indicates that CeO x is located in close proximity of the palladium nanoparticles. High-resolution lattice images and energy-loss spectra obtained in the vicinity of the Pd particles show an anisotropic distribution of CeO x crystallites limited to the interface region between Pd and the substrate but not covering the surface of the Pd nanoparticles. Energy-loss near edge fine structure of Pd M edges reveals that the Pd nanoparticles are not oxidized.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736459" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="aee8bc595ea00fc16ea80b82c58f4145" rel="nofollow" data-download="{"attachment_id":40227435,"asset_id":18736459,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227435/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736459 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736459"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736459, container: ".js-paper-rank-work_18736459", }); 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The freshly reduced catalyst was characterized by various electron microscopy techniques, such as elemental mapping, Z-contrast imaging, and electron energy-loss spectroscopy to understand the role of Ce on a microscopic scale. The high spatial resolution elemental mapping indicates that CeO x is located in close proximity of the palladium nanoparticles. High-resolution lattice images and energy-loss spectra obtained in the vicinity of the Pd particles show an anisotropic distribution of CeO x crystallites limited to the interface region between Pd and the substrate but not covering the surface of the Pd nanoparticles. Energy-loss near edge fine structure of Pd M edges reveals that the Pd nanoparticles are not oxidized.","publication":"Journal of Applied Physics","publication_with_fallback":"Journal of Applied Physics","downloadable_attachments":[{"id":40227435,"asset_id":18736459,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227435/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227435/Electron_microscopy_study_of_CeOxPd-Al2O20151120-24776-1dc9hhl-libre.pdf?1448083384=\u0026response-content-disposition=attachment%3B+filename%3DElectron_microscopy_study_of_CeO_sub_x_P.pdf\u0026Expires=1739813678\u0026Signature=WHmYcx0ATDiTSZw76Sj-Ele5Jp0z1ZR9OPodRVo041OBxaStBxrhnDapAdnHd2tcUCwTiPNL-z6COmlP4mZf2oDVp5cRLaFXKZwu4T8vBDkVuJuKrbzMpaZDrdGRpK4fNd2ZHPGZVbrIW-jrfz826N0TudTj0ebTnwTBjvMheOsLwkOSujYDVZhIzDGj7h5P6fqYwcaLxCrtZYVeE2G8jWexwd3HhJMWrNjsr3VnhJYzoLgZR9FXzLD8RAaJ--6UzqcpezRHMLnSnS78CoyG1nS4p3J~qegfb6LlwdOWXKRc9Y~l8b3inZq5k~MgJvfbyOzw2P02jzG9rMpPabCnqQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227435/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227435/mini_magick20190221-4571-vlrdiw.png?1550789142"}],"downloadable_attachments_with_full_thumbnails":[{"id":40227435,"asset_id":18736459,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227435/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227435/Electron_microscopy_study_of_CeOxPd-Al2O20151120-24776-1dc9hhl-libre.pdf?1448083384=\u0026response-content-disposition=attachment%3B+filename%3DElectron_microscopy_study_of_CeO_sub_x_P.pdf\u0026Expires=1739813678\u0026Signature=WHmYcx0ATDiTSZw76Sj-Ele5Jp0z1ZR9OPodRVo041OBxaStBxrhnDapAdnHd2tcUCwTiPNL-z6COmlP4mZf2oDVp5cRLaFXKZwu4T8vBDkVuJuKrbzMpaZDrdGRpK4fNd2ZHPGZVbrIW-jrfz826N0TudTj0ebTnwTBjvMheOsLwkOSujYDVZhIzDGj7h5P6fqYwcaLxCrtZYVeE2G8jWexwd3HhJMWrNjsr3VnhJYzoLgZR9FXzLD8RAaJ--6UzqcpezRHMLnSnS78CoyG1nS4p3J~qegfb6LlwdOWXKRc9Y~l8b3inZq5k~MgJvfbyOzw2P02jzG9rMpPabCnqQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227435/download_file?st=MTczOTgzMDA2NCw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227435/mini_magick20190221-4571-vlrdiw.png?1550789142"}],"has_pdf":true,"has_fulltext":true,"page_count":6,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}],"research_interests":[{"id":48,"name":"Engineering","url":"https://www.academia.edu/Documents/in/Engineering","nofollow":true},{"id":2184,"name":"Electron Microscopy","url":"https://www.academia.edu/Documents/in/Electron_Microscopy","nofollow":true},{"id":9138,"name":"Applied Physics","url":"https://www.academia.edu/Documents/in/Applied_Physics","nofollow":true},{"id":80414,"name":"Mathematical Sciences","url":"https://www.academia.edu/Documents/in/Mathematical_Sciences","nofollow":true},{"id":118582,"name":"Physical sciences","url":"https://www.academia.edu/Documents/in/Physical_sciences"},{"id":156347,"name":"Methane","url":"https://www.academia.edu/Documents/in/Methane"},{"id":309086,"name":"High Resolution","url":"https://www.academia.edu/Documents/in/High_Resolution"},{"id":317484,"name":"Fine Structure Constant","url":"https://www.academia.edu/Documents/in/Fine_Structure_Constant"},{"id":1127444,"name":"High Spatial Resolution","url":"https://www.academia.edu/Documents/in/High_Spatial_Resolution"},{"id":1332241,"name":"Electron Energy Loss Spectroscopy","url":"https://www.academia.edu/Documents/in/Electron_Energy_Loss_Spectroscopy"}],"publication_year":2009,"publication_year_with_fallback":2009,"paper_rank":null,"all_time_views":13,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736460" data-work_id="18736460" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736460/The_spatial_resolution_of_electron_energy_loss_and_x_ray_absorption_fine_structure">The spatial resolution of electron energy loss and x-ray absorption fine structure</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">We have investigated the factors that determine the degree of localization of the information obtainable from electron energy loss or x-ray absorption fine structure. Inelastic scattering of the excited core electron limits the volume of... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736460" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">We have investigated the factors that determine the degree of localization of the information obtainable from electron energy loss or x-ray absorption fine structure. Inelastic scattering of the excited core electron limits the volume of specimen contributing to the backscattered intensity to a diameter in the range of 1-2 nm, dependent on the excited-electron energy and the composition and crystal structure of the sample. Phase cancellation between the backscattered waves further reduces the effective diameter that determines the observed fine structure to below 1 nm. Since the spatial resolution attainable by transmission electron microscopy can approach 0.2 nm or can even be below 0.1 nm ͑with aberration correction͒, we predict that delocalization arising from the excited-electron range may limit the resolution of images based on changes in core-loss fine structure.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736460" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="b41455caea26b170bc54078e62c70c9b" rel="nofollow" data-download="{"attachment_id":40227426,"asset_id":18736460,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227426/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736460 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736460"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736460, container: ".js-paper-rank-work_18736460", }); 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Inelastic scattering of the excited core electron limits the volume of specimen contributing to the backscattered intensity to a diameter in the range of 1-2 nm, dependent on the excited-electron energy and the composition and crystal structure of the sample. Phase cancellation between the backscattered waves further reduces the effective diameter that determines the observed fine structure to below 1 nm. Since the spatial resolution attainable by transmission electron microscopy can approach 0.2 nm or can even be below 0.1 nm ͑with aberration correction͒, we predict that delocalization arising from the excited-electron range may limit the resolution of images based on changes in core-loss fine structure.","publication":"Journal of Applied Physics","publication_with_fallback":"Journal of Applied Physics","downloadable_attachments":[{"id":40227426,"asset_id":18736460,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227426/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227426/The_spatial_resolution_of_electron_energ20151120-9629-ont560-libre.pdf?1448083385=\u0026response-content-disposition=attachment%3B+filename%3DThe_spatial_resolution_of_electron_energ.pdf\u0026Expires=1739702109\u0026Signature=MwN~xXH56qyfgacVeI03eR4U6Z64-wacy4O~bwmmATn7-s3qSkDo715OWBbH2V9fPVJCRLaSgzpGbkO-bbdD2hvGEUhiSfNcG-TgSpHhx2LB0qS7Nwo2VsTJADExR1UPdFAk0DJGfUnv7Pf7PdrvowKkM46xdzQr7xOgEkD0QkRXgLoTltbpHn2JYY5kFAYNcV4Fk8KK-SMGkbVzEEpfh~oMf8pb4wBVkCn1N3RFUpw4Cxfs8wOP7pj~uMbIFgT1jJMgOc9pIGdWChiZY3NxSV-OVHmy9XawxzVYdGXVp54DZLPJmSOZsRDkwGA6~bJ~60Ps9f5sN35P5rcdPfQeMg__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227426/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227426/mini_magick20190221-11042-1gwfb68.png?1550789186"}],"downloadable_attachments_with_full_thumbnails":[{"id":40227426,"asset_id":18736460,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227426/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227426/The_spatial_resolution_of_electron_energ20151120-9629-ont560-libre.pdf?1448083385=\u0026response-content-disposition=attachment%3B+filename%3DThe_spatial_resolution_of_electron_energ.pdf\u0026Expires=1739702109\u0026Signature=MwN~xXH56qyfgacVeI03eR4U6Z64-wacy4O~bwmmATn7-s3qSkDo715OWBbH2V9fPVJCRLaSgzpGbkO-bbdD2hvGEUhiSfNcG-TgSpHhx2LB0qS7Nwo2VsTJADExR1UPdFAk0DJGfUnv7Pf7PdrvowKkM46xdzQr7xOgEkD0QkRXgLoTltbpHn2JYY5kFAYNcV4Fk8KK-SMGkbVzEEpfh~oMf8pb4wBVkCn1N3RFUpw4Cxfs8wOP7pj~uMbIFgT1jJMgOc9pIGdWChiZY3NxSV-OVHmy9XawxzVYdGXVp54DZLPJmSOZsRDkwGA6~bJ~60Ps9f5sN35P5rcdPfQeMg__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227426/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227426/mini_magick20190221-11042-1gwfb68.png?1550789186"}],"has_pdf":true,"has_fulltext":true,"page_count":8,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}],"research_interests":[{"id":48,"name":"Engineering","url":"https://www.academia.edu/Documents/in/Engineering","nofollow":true},{"id":9138,"name":"Applied Physics","url":"https://www.academia.edu/Documents/in/Applied_Physics","nofollow":true},{"id":80414,"name":"Mathematical Sciences","url":"https://www.academia.edu/Documents/in/Mathematical_Sciences","nofollow":true},{"id":96502,"name":"Applied","url":"https://www.academia.edu/Documents/in/Applied","nofollow":true},{"id":118582,"name":"Physical sciences","url":"https://www.academia.edu/Documents/in/Physical_sciences"}],"publication_year":2008,"publication_year_with_fallback":2008,"paper_rank":null,"all_time_views":21,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736463" data-work_id="18736463" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736463/Radiation_damage_in_the_TEM_and_SEM">Radiation damage in the TEM and SEM</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">We review the various ways in which an electron beam can adversely affect an organic or inorganic sample during examination in an electron microscope. The effects considered are: heating, electrostatic charging, ionization damage... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736463" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">We review the various ways in which an electron beam can adversely affect an organic or inorganic sample during examination in an electron microscope. The effects considered are: heating, electrostatic charging, ionization damage (radiolysis), displacement damage, sputtering and hydrocarbon contamination. In each case, strategies to minimise the damage are identified. In the light of recent experimental evidence, we re-examine two common assumptions: that the amount of radiation damage is proportional to the electron dose and is independent of beam diameter; and that the extent of the damage is proportional to the amount of energy deposited in the specimen. q</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736463" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="f7e964d2f7f94427e6e68956a1845af5" rel="nofollow" data-download="{"attachment_id":40227424,"asset_id":18736463,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227424/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736463 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736463"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736463, container: ".js-paper-rank-work_18736463", }); 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$(".js-view-count[data-work-id=18736463]").text(description); $(".js-view-count-work_18736463").attr('title', description).tooltip(); }); });</script></span><script>$(function() { $(".js-view-count-work_18736463").removeClass('hidden') })</script></div></li><li class="InlineList-item u-positionRelative" style="max-width: 250px"><div class="u-positionAbsolute" data-has-card-for-ri-list="18736463"><i class="fa fa-tag InlineList-item-icon u-positionRelative"></i>  <a class="InlineList-item-text u-positionRelative">14</a>  </div><span class="InlineList-item-text u-textTruncate u-pl10x"><a class="InlineList-item-text" data-has-card-for-ri="56" rel="nofollow" href="https://www.academia.edu/Documents/in/Materials_Engineering">Materials Engineering</a>, <script data-card-contents-for-ri="56" type="text/json">{"id":56,"name":"Materials Engineering","url":"https://www.academia.edu/Documents/in/Materials_Engineering","nofollow":true}</script><a class="InlineList-item-text" data-has-card-for-ri="505" rel="nofollow" href="https://www.academia.edu/Documents/in/Condensed_Matter_Physics">Condensed Matter Physics</a>, <script data-card-contents-for-ri="505" type="text/json">{"id":505,"name":"Condensed Matter Physics","url":"https://www.academia.edu/Documents/in/Condensed_Matter_Physics","nofollow":true}</script><a class="InlineList-item-text" data-has-card-for-ri="640" rel="nofollow" href="https://www.academia.edu/Documents/in/Radiology">Radiology</a>, <script data-card-contents-for-ri="640" type="text/json">{"id":640,"name":"Radiology","url":"https://www.academia.edu/Documents/in/Radiology","nofollow":true}</script><a class="InlineList-item-text" data-has-card-for-ri="2184" rel="nofollow" href="https://www.academia.edu/Documents/in/Electron_Microscopy">Electron Microscopy</a><script data-card-contents-for-ri="2184" type="text/json">{"id":2184,"name":"Electron Microscopy","url":"https://www.academia.edu/Documents/in/Electron_Microscopy","nofollow":true}</script></span></li><script>(function(){ if (true) { new Aedu.ResearchInterestListCard({ el: $('*[data-has-card-for-ri-list=18736463]'), work: {"id":18736463,"title":"Radiation damage in the TEM and SEM","created_at":"2015-11-20T21:20:25.066-08:00","owner_id":38806773,"url":"https://www.academia.edu/18736463/Radiation_damage_in_the_TEM_and_SEM","slug":"Radiation_damage_in_the_TEM_and_SEM","dom_id":"work_18736463","summary":"We review the various ways in which an electron beam can adversely affect an organic or inorganic sample during examination in an electron microscope. The effects considered are: heating, electrostatic charging, ionization damage (radiolysis), displacement damage, sputtering and hydrocarbon contamination. In each case, strategies to minimise the damage are identified. In the light of recent experimental evidence, we re-examine two common assumptions: that the amount of radiation damage is proportional to the electron dose and is independent of beam diameter; and that the extent of the damage is proportional to the amount of energy deposited in the specimen. q","publication":"Micron","publication_with_fallback":"Micron","downloadable_attachments":[{"id":40227424,"asset_id":18736463,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227424/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227424/Radiation_damage_in_the_TEM_and_SEM._Mic20151120-9629-1wxbuc1-libre.pdf?1448083384=\u0026response-content-disposition=attachment%3B+filename%3DRadiation_damage_in_the_TEM_and_SEM.pdf\u0026Expires=1739565819\u0026Signature=YFTv9PGqTBRvOiq89O6sft2TEZ8oc010gbt4RhbwDsZSqoThdbXvOtcio-gNl3Ioj4d4BFEKFrkTKD0Yz0G8P7UVOhpws62lxX1YUe4FZbuz~6AxgHfuzikaLQE4L-UxiQCuW2QNXbVNGFqLg7yo1~-wympV6KNInfetHLotcDF4k95O-NS72UjFQ~YNFmUD~RaBHUPrPi0MnpB29~UBKkuJES2IA5FlTFKaC6dMa5zhZfg4jMtf4kSFMiJM9gnfdfXTWUj27zINhQx0h6J5rNHN1w7PSWT94SIAOvXoTy-iZndUZlB4yMrEFI~T5K-YPWZv4lrQSipZ9vRYLUVksQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227424/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227424/mini_magick20180817-13046-czf3pw.png?1534551595"}],"downloadable_attachments_with_full_thumbnails":[{"id":40227424,"asset_id":18736463,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227424/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227424/Radiation_damage_in_the_TEM_and_SEM._Mic20151120-9629-1wxbuc1-libre.pdf?1448083384=\u0026response-content-disposition=attachment%3B+filename%3DRadiation_damage_in_the_TEM_and_SEM.pdf\u0026Expires=1739565819\u0026Signature=YFTv9PGqTBRvOiq89O6sft2TEZ8oc010gbt4RhbwDsZSqoThdbXvOtcio-gNl3Ioj4d4BFEKFrkTKD0Yz0G8P7UVOhpws62lxX1YUe4FZbuz~6AxgHfuzikaLQE4L-UxiQCuW2QNXbVNGFqLg7yo1~-wympV6KNInfetHLotcDF4k95O-NS72UjFQ~YNFmUD~RaBHUPrPi0MnpB29~UBKkuJES2IA5FlTFKaC6dMa5zhZfg4jMtf4kSFMiJM9gnfdfXTWUj27zINhQx0h6J5rNHN1w7PSWT94SIAOvXoTy-iZndUZlB4yMrEFI~T5K-YPWZv4lrQSipZ9vRYLUVksQ__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227424/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227424/mini_magick20180817-13046-czf3pw.png?1534551595"}],"has_pdf":true,"has_fulltext":true,"page_count":11,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek 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u-pv7x u-mb0x js-work-card work_18736464" data-work_id="18736464" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736464/Improving_the_energy_resolution_of_X_ray_and_electron_energy_loss_spectra">Improving the energy resolution of X-ray and electron energy-loss spectra</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">We discuss some practical problems of improving the resolution of x-ray and electron spectra. Iterative Bayesian methods promise greater resolution enhancement than Fourier methods but they do give rise to spectral artifacts. Satellite... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736464" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">We discuss some practical problems of improving the resolution of x-ray and electron spectra. Iterative Bayesian methods promise greater resolution enhancement than Fourier methods but they do give rise to spectral artifacts. Satellite peaks are generated adjacent to strong peaks in the original spectrum; in the case of valence-electron energy-loss spectra, these wing peaks can be controlled by removing the zero-loss peak prior to resolution enhancement. Oscillatory artifacts become prominent after a large number of iterations, particularly for spectra with high noise content.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736464" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="6ab01794afacb2b6f67866c01a0632eb" rel="nofollow" data-download="{"attachment_id":40227460,"asset_id":18736464,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227460/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736464 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736464"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736464, container: ".js-paper-rank-work_18736464", }); 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Iterative Bayesian methods promise greater resolution enhancement than Fourier methods but they do give rise to spectral artifacts. Satellite peaks are generated adjacent to strong peaks in the original spectrum; in the case of valence-electron energy-loss spectra, these wing peaks can be controlled by removing the zero-loss peak prior to resolution enhancement. Oscillatory artifacts become prominent after a large number of iterations, particularly for spectra with high noise content.","publication":"Micron","publication_with_fallback":"Micron","downloadable_attachments":[{"id":40227460,"asset_id":18736464,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227460/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227460/Improving_the_energy_resolution_of_X-ray20151120-24776-3lrpud-libre.pdf?1448083413=\u0026response-content-disposition=attachment%3B+filename%3DImproving_the_energy_resolution_of_X_ray.pdf\u0026Expires=1739813678\u0026Signature=W7GNDJf40gKxVRJRISMyxdeaxTYioSPDZulw-g~-YXf7aJC5LNIkNEgpAr9zuV0MAST8cKubmAMNdQ9D0zNsf-FYaUkAjgs~3a6v5O8fvXR5bExSl5g-PbRtnOIFB3mHzs5t~HBjbndOb2w4xxFmiU7OF4ngdtQQkG9dz0do5A8cCsfJTYb53BTg9V6zfBR2ujoIO9~kOWc2N5OMoFODOhfuwJjEmIHzW~s0Jbp8F4~goo2X85pL3QyXlQ5B-U9yFwEEPMK3mjUzmXE18kw9PwB0Ct7U5q50gcgfr5GmOdakJZzIrA-UNOatzNjE4se4HlBpThssKusV4gAzF15MRg__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227460/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227460/mini_magick20190221-4565-1p7mzw5.png?1550789130"}],"downloadable_attachments_with_full_thumbnails":[{"id":40227460,"asset_id":18736464,"asset_type":"Work","always_allow_download":false,"scribd_thumbnail_url":"https://attachments.academia-assets.com/40227460/thumbnails/1.jpg","download_url":"https://d1wqtxts1xzle7.cloudfront.net/40227460/Improving_the_energy_resolution_of_X-ray20151120-24776-3lrpud-libre.pdf?1448083413=\u0026response-content-disposition=attachment%3B+filename%3DImproving_the_energy_resolution_of_X_ray.pdf\u0026Expires=1739813678\u0026Signature=W7GNDJf40gKxVRJRISMyxdeaxTYioSPDZulw-g~-YXf7aJC5LNIkNEgpAr9zuV0MAST8cKubmAMNdQ9D0zNsf-FYaUkAjgs~3a6v5O8fvXR5bExSl5g-PbRtnOIFB3mHzs5t~HBjbndOb2w4xxFmiU7OF4ngdtQQkG9dz0do5A8cCsfJTYb53BTg9V6zfBR2ujoIO9~kOWc2N5OMoFODOhfuwJjEmIHzW~s0Jbp8F4~goo2X85pL3QyXlQ5B-U9yFwEEPMK3mjUzmXE18kw9PwB0Ct7U5q50gcgfr5GmOdakJZzIrA-UNOatzNjE4se4HlBpThssKusV4gAzF15MRg__\u0026Key-Pair-Id=APKAJLOHF5GGSLRBV4ZA","download_file_url":"https://www.academia.edu/attachments/40227460/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&","full_thumbnail_url":"https://0.academia-photos.com/attachment_thumbnails/40227460/mini_magick20190221-4565-1p7mzw5.png?1550789130"}],"has_pdf":true,"has_fulltext":true,"page_count":14,"ordered_authors":[{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}],"research_interests":[{"id":56,"name":"Materials Engineering","url":"https://www.academia.edu/Documents/in/Materials_Engineering","nofollow":true},{"id":505,"name":"Condensed Matter Physics","url":"https://www.academia.edu/Documents/in/Condensed_Matter_Physics","nofollow":true},{"id":56001,"name":"X Rays","url":"https://www.academia.edu/Documents/in/X_Rays","nofollow":true},{"id":87364,"name":"Maximum Likelihood","url":"https://www.academia.edu/Documents/in/Maximum_Likelihood","nofollow":true},{"id":119138,"name":"Electronic Spectra","url":"https://www.academia.edu/Documents/in/Electronic_Spectra"},{"id":132784,"name":"Low Energy Buildngs","url":"https://www.academia.edu/Documents/in/Low_Energy_Buildngs"},{"id":214560,"name":"Electron Density","url":"https://www.academia.edu/Documents/in/Electron_Density"},{"id":321836,"name":"Spectrum","url":"https://www.academia.edu/Documents/in/Spectrum"},{"id":554780,"name":"Interdisciplinary Engineering","url":"https://www.academia.edu/Documents/in/Interdisciplinary_Engineering"},{"id":1523809,"name":"Maximum entropy","url":"https://www.academia.edu/Documents/in/Maximum_entropy"},{"id":2056468,"name":"Micron","url":"https://www.academia.edu/Documents/in/Micron"}],"publication_year":2006,"publication_year_with_fallback":2006,"paper_rank":null,"all_time_views":23,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736465" data-work_id="18736465" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736465/Fourier_ratio_deconvolution_and_its_Bayesian_equivalent">Fourier-ratio deconvolution and its Bayesian equivalent</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">We discuss how an inner-shell electron energy-loss spectrum can be processed using Bayesian (maximum-entropy or maximum-likelihood) deconvolution to simultaneously remove plural scattering and improve the energy resolution. As in... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736465" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">We discuss how an inner-shell electron energy-loss spectrum can be processed using Bayesian (maximum-entropy or maximum-likelihood) deconvolution to simultaneously remove plural scattering and improve the energy resolution. As in Fourier-ratio deconvolution, a low-loss spectrum (recorded from the same area of specimen) is used as a kernel or resolution function. This procedure avoids the need to record the zeroloss peak in the absence of a specimen and uncertainties related to the width of the zero-loss peak. Unlike the case of Fourier-ratio deconvolution, we find that core-loss data do not require pre-edge background subtraction and extrapolation towards zero intensity; simply matching the intensity at both ends of the region is usually sufficient to avoid oscillatory artifacts. Using the low-loss spectrum as both data and kernel yields a zero-loss peak whose width provides an indication of the energy resolution as a function of the number of iterations. Finally, we argue that Fourier-ratio deconvolution or its Bayesian equivalent is the correct way to remove the substrate or matrix contribution to an energy-loss spectrum recorded from a particle on a substrate or embedded in a matrix. #</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736465" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="b550188a4494117db139cdc539b0525f" rel="nofollow" data-download="{"attachment_id":40227425,"asset_id":18736465,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227425/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736465 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736465"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736465, container: ".js-paper-rank-work_18736465", }); 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As in Fourier-ratio deconvolution, a low-loss spectrum (recorded from the same area of specimen) is used as a kernel or resolution function. This procedure avoids the need to record the zeroloss peak in the absence of a specimen and uncertainties related to the width of the zero-loss peak. Unlike the case of Fourier-ratio deconvolution, we find that core-loss data do not require pre-edge background subtraction and extrapolation towards zero intensity; simply matching the intensity at both ends of the region is usually sufficient to avoid oscillatory artifacts. Using the low-loss spectrum as both data and kernel yields a zero-loss peak whose width provides an indication of the energy resolution as a function of the number of iterations. Finally, we argue that Fourier-ratio deconvolution or its Bayesian equivalent is the correct way to remove the substrate or matrix contribution to an energy-loss spectrum recorded from a particle on a substrate or embedded in a matrix. 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js-work-link" href="https://www.academia.edu/18736466/Local_thickness_measurement_through_scattering_contrast_and_electron_energy_loss_spectroscopy">Local thickness measurement through scattering contrast and electron energy-loss spectroscopy</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">Electron energy-loss spectroscopy (EELS) Inelastic mean free path (IMFP) Scattering cross section Thickness measurement in TEM a b s t r a c t Scattering contrast measurements were performed on thin films of amorphous carbon and... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736466" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">Electron energy-loss spectroscopy (EELS) Inelastic mean free path (IMFP) Scattering cross section Thickness measurement in TEM a b s t r a c t Scattering contrast measurements were performed on thin films of amorphous carbon and polycrystalline Au, as well as single-crystal MgO nanocubes. Based on the exponential absorption law, mass-thickness can be obtained within 10% accuracy by measuring the incident and transmitted intensities in the same image. For mass-thickness measurement of a thin amorphous specimen, a small collection semiangle improves the measurement sensitivity, whereas for the measurement of polycrystalline or single-crystal specimens, a large collection semiangle should be used to reduce diffraction-contrast effects. EELS thickness measurements on MgO nanocubes suggest that the Kramers-Kronig sum-rule method (with correction for plural and surface scattering) gives 10% accuracy at medium collection semiangles but overestimates the thickness at small collection semiangles, due to underestimation of the surface-mode scattering. The log-ratio method, with a formula for inelastic mean free path proposed by , provides 10% accuracy at small collection semiangle, while that proposed by is preferable for medium and large collection semiangles. As a result of this work, we provide recommendations of preferred methods and conditions for local-thickness measurement in the TEM.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736466" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="aae422e05db45c6b3e22a55c83eb2489" rel="nofollow" data-download="{"attachment_id":40227436,"asset_id":18736466,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227436/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span></li><li class="js-paper-rank-work_18736466 InlineList-item InlineList-item--bordered hidden"><span class="js-paper-rank-view hidden u-tcGrayDark" data-paper-rank-work-id="18736466"><i class="u-m1x fa fa-bar-chart"></i><strong class="js-paper-rank"></strong></span><script>$(function() { new Works.PaperRankView({ workId: 18736466, container: ".js-paper-rank-work_18736466", }); 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Based on the exponential absorption law, mass-thickness can be obtained within 10% accuracy by measuring the incident and transmitted intensities in the same image. For mass-thickness measurement of a thin amorphous specimen, a small collection semiangle improves the measurement sensitivity, whereas for the measurement of polycrystalline or single-crystal specimens, a large collection semiangle should be used to reduce diffraction-contrast effects. EELS thickness measurements on MgO nanocubes suggest that the Kramers-Kronig sum-rule method (with correction for plural and surface scattering) gives 10% accuracy at medium collection semiangles but overestimates the thickness at small collection semiangles, due to underestimation of the surface-mode scattering. The log-ratio method, with a formula for inelastic mean free path proposed by , provides 10% accuracy at small collection semiangle, while that proposed by is preferable for medium and large collection semiangles. As a result of this work, we provide recommendations of preferred methods and conditions for local-thickness measurement in the 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carbon","url":"https://www.academia.edu/Documents/in/Amorphous_carbon"},{"id":1332241,"name":"Electron Energy Loss Spectroscopy","url":"https://www.academia.edu/Documents/in/Electron_Energy_Loss_Spectroscopy"},{"id":2056468,"name":"Micron","url":"https://www.academia.edu/Documents/in/Micron"}],"publication_year":2012,"publication_year_with_fallback":2012,"paper_rank":null,"all_time_views":38,"active_discussion":{}}, }) } })();</script></ul></li></ul></div></div><div class="u-borderBottom1 u-borderColorGrayLighter"><div class="clearfix u-pv7x u-mb0x js-work-card work_18736468" data-work_id="18736468" itemscope="itemscope" itemtype="https://schema.org/ScholarlyArticle"><div class="header"><div class="title u-fontSerif u-fs22 u-lineHeight1_3"><a class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736468/Determination_of_Camera_Modulation_Transfer_Function_by_Electron_Holography">Determination of Camera Modulation-Transfer Function by Electron 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value of the surface-displacement energy E d and its angular dependence. 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class="u-tcGrayDarkest js-work-link" href="https://www.academia.edu/18736484/The_sources_of_contamination_of_TEM_samples_and_the_means_for_its_reduction">The sources of contamination of TEM samples and the means for its reduction</a></div></div><div class="u-pb4x u-mt3x"><div class="summary u-fs14 u-fw300 u-lineHeight1_5 u-tcGrayDarkest"><div class="summarized">Contamination is a long standing problem in electron microscopy . It can arise from poor vacuum, from sample handling and storage, or from the nature of the sample nature. We are systematically investigating candidate sources of... <a class="more_link u-tcGrayDark u-linkUnstyled" data-container=".work_18736484" data-show=".complete" data-hide=".summarized" data-more-link-behavior="true" href="#">more</a></div><div class="complete hidden">Contamination is a long standing problem in electron microscopy . It can arise from poor vacuum, from sample handling and storage, or from the nature of the sample nature. We are systematically investigating candidate sources of contamination using a common TEM substrate: 10-nm thick Si 3 N 4 membrane, with typical storage methods and practices. We use a dry-pumped Hitachi H 9500 ETEM whose base pressure is1.4x10 -5 Pa without liquid nitrogen (LN 2 ). The measured residual gas is composed mainly of water vapor (8x10 -7 Pa) and N2 (about 3x10 -7 Pa), both decreasing to about 2x10 -7 Pa with LN 2 . We use electron energy-loss spectroscopy (EELS), energy-filtering thickness maps and bright-field TEM imaging in the H9500 to characterize the contamination build up, and SEM imaging in Hitachi S 5500 to image the surface morphology of the contamination dots. The Si 3 N 4 membranes were examined in the TEM as received, after cleaning using a ZONE cleaner [4] with LN 2 trap of the microscope, either cooled (ZONE-LN 2 ) or at room temperature (ZONE-RT), or without LN 2 in the cold trap and after heating the Si 3 N 4 membrane on a hot plate at 50 ºC (Hot-50C) prior to inserting in the microscope. A new Si 3 N 4 membrane was used for each experiment and the variation of the contamination rate was evaluated for 5-min increments of the cleaning process. The membrane was irradiated by a probe of 37 nm FWHM with 0.83 nA total current for 300 seconds, resulting in a 250 C/cm 2 irradiation dose. Five areas were measured for each condition and a thickness map and a bright-field image was then collected from the irradiated area using a broad illumination. For each condition, the experiment was performed on five locations of the Si 3 N 4 membrane and the volume of resulting contamination measured in nm 3 by summing over a 134x134 nm 2 thickness map, subtracting the contribution of the SiN membrane.</div></div></div><ul class="InlineList u-ph0x u-fs13"><li class="InlineList-item logged_in_only"><div class="share_on_academia_work_button"><a class="academia_share Button Button--inverseBlue Button--sm js-bookmark-button" data-academia-share="Work/18736484" data-share-source="work_strip" data-spinner="small_white_hide_contents"><i class="fa fa-plus"></i><span class="work-strip-link-text u-ml1x" data-content="button_text">Bookmark</span></a></div></li><li class="InlineList-item"><div class="download"><a id="6e3073418215ef3c21d2fa7f932fa922" rel="nofollow" data-download="{"attachment_id":40227444,"asset_id":18736484,"asset_type":"Work","always_allow_download":false,"track":null,"button_location":"work_strip","source":null,"hide_modal":null}" class="Button Button--sm Button--inverseGreen js-download-button prompt_button doc_download" href="https://www.academia.edu/attachments/40227444/download_file?st=MTczOTgzMDA2NSw4LjIyMi4yMDguMTQ2&s=work_strip"><i class="fa fa-arrow-circle-o-down fa-lg"></i><span class="u-textUppercase u-ml1x" data-content="button_text">Download</span></a></div></li><li class="InlineList-item"><ul class="InlineList InlineList--bordered u-ph0x"><li class="InlineList-item InlineList-item--bordered"><span class="InlineList-item-text">by <span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a class="u-tcGrayDark u-fw700" data-has-card-for-user="38806773" href="https://nrc-ca.academia.edu/MarekMalac">Marek Malac</a><script data-card-contents-for-user="38806773" type="text/json">{"id":38806773,"first_name":"Marek","last_name":"Malac","domain_name":"nrc-ca","page_name":"MarekMalac","display_name":"Marek Malac","profile_url":"https://nrc-ca.academia.edu/MarekMalac","photo":"/images/s65_no_pic.png"}</script></span></span><span class="u-displayInlineBlock InlineList-item-text"> and <span class="u-textDecorationUnderline u-clickable InlineList-item-text js-work-more-authors-18736484">+1</span><div class="hidden js-additional-users-18736484"><div><span itemscope="itemscope" itemprop="author" itemtype="https://schema.org/Person"><a href="https://independent.academia.edu/CSoong">C. 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The Si 3 N 4 membranes were examined in the TEM as received, after cleaning using a ZONE cleaner [4] with LN 2 trap of the microscope, either cooled (ZONE-LN 2 ) or at room temperature (ZONE-RT), or without LN 2 in the cold trap and after heating the Si 3 N 4 membrane on a hot plate at 50 ºC (Hot-50C) prior to inserting in the microscope. A new Si 3 N 4 membrane was used for each experiment and the variation of the contamination rate was evaluated for 5-min increments of the cleaning process. The membrane was irradiated by a probe of 37 nm FWHM with 0.83 nA total current for 300 seconds, resulting in a 250 C/cm 2 irradiation dose. Five areas were measured for each condition and a thickness map and a bright-field image was then collected from the irradiated area using a broad illumination. 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