Search results for: MESFET

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MESFET</title> <meta name="description" content="Search results for: MESFET"> <meta name="keywords" content="MESFET"> <meta name="viewport" content="width=device-width, initial-scale=1, minimum-scale=1, maximum-scale=1, user-scalable=no"> <meta charset="utf-8"> <link href="https://cdn.waset.org/favicon.ico" type="image/x-icon" rel="shortcut icon"> <link href="https://cdn.waset.org/static/plugins/bootstrap-4.2.1/css/bootstrap.min.css" rel="stylesheet"> <link href="https://cdn.waset.org/static/plugins/fontawesome/css/all.min.css" rel="stylesheet"> <link href="https://cdn.waset.org/static/css/site.css?v=150220211555" rel="stylesheet"> </head> <body> <header> <div class="container"> <nav class="navbar navbar-expand-lg navbar-light"> <a class="navbar-brand" href="https://waset.org"> <img src="https://cdn.waset.org/static/images/wasetc.png" alt="Open Science Research Excellence" title="Open Science Research Excellence" /> </a> <button class="d-block d-lg-none navbar-toggler ml-auto" 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class="input-group"> <i class="fas fa-search"></i> <input type="text" class="search-query" name="q" placeholder="Author, Title, Abstract, Keywords" value="MESFET"> <input type="submit" class="btn_search" value="Search"> </div> </div> </form> </div> </div> <div class="row mt-3"> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Commenced</strong> in January 2007</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Frequency:</strong> Monthly</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Edition:</strong> International</div> </div> </div> <div class="col-sm-3"> <div class="card"> <div class="card-body"><strong>Paper Count:</strong> 4</div> </div> </div> </div> <h1 class="mt-3 mb-3 text-center" style="font-size:1.6rem;">Search results for: MESFET</h1> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">4</span> Current of Drain for Various Values of Mobility in the Gaas Mesfet</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=S.%20Belhour">S. Belhour</a>, <a href="https://publications.waset.org/abstracts/search?q=A.%20K.%20Ferouani"> A. K. Ferouani</a>, <a href="https://publications.waset.org/abstracts/search?q=C.%20Azizi"> C. Azizi</a> </p> <p class="card-text"><strong>Abstract:</strong></p> In recent years, a considerable effort (experience, numerical simulation, and theoretical prediction models) has characterised by high efficiency and low cost. Then an improved physics analytical model for simulating is proposed. The performance of GaAs MESFETs has been developed for use in device design for high frequency. This model is based on mathematical analysis, and a new approach for the standard model is proposed, this approach allowed to conceive applicable model for MESFET鈥檚 operating in the turn-one or pinch-off region and valid for the short-channel and the long channel MESFET鈥檚 in which the two dimensional potential distribution contributed by the depletion layer under the gate is obtained by conventional approximation. More ever, comparisons between the analytical models with different values of mobility are proposed, and a good agreement is obtained. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=analytical" title="analytical">analytical</a>, <a href="https://publications.waset.org/abstracts/search?q=gallium%20arsenide" title=" gallium arsenide"> gallium arsenide</a>, <a href="https://publications.waset.org/abstracts/search?q=MESFET" title=" MESFET"> MESFET</a>, <a href="https://publications.waset.org/abstracts/search?q=mobility" title=" mobility"> mobility</a>, <a href="https://publications.waset.org/abstracts/search?q=models" title=" models"> models</a> </p> <a href="https://publications.waset.org/abstracts/160245/current-of-drain-for-various-values-of-mobility-in-the-gaas-mesfet" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/160245.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">74</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">3</span> Modeling the Transport of Charge Carriers in the Active Devices MESFET Based of GaInP by the Monte Carlo Method</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=N.%20Massoum">N. Massoum</a>, <a href="https://publications.waset.org/abstracts/search?q=A.%20Guen.%20Bouazza"> A. Guen. Bouazza</a>, <a href="https://publications.waset.org/abstracts/search?q=B.%20Bouazza"> B. Bouazza</a>, <a href="https://publications.waset.org/abstracts/search?q=A.%20El%20Ouchdi"> A. El Ouchdi</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The progress of industry integrated circuits in recent years has been pushed by continuous miniaturization of transistors. With the reduction of dimensions of components at 0.1 micron and below, new physical effects come into play as the standard simulators of two dimensions (2D) do not consider. In fact the third dimension comes into play because the transverse and longitudinal dimensions of the components are of the same order of magnitude. To describe the operation of such components with greater fidelity, we must refine simulation tools and adapted to take into account these phenomena. After an analytical study of the static characteristics of the component, according to the different operating modes, a numerical simulation is performed of field-effect transistor with submicron gate MESFET GaInP. The influence of the dimensions of the gate length is studied. The results are used to determine the optimal geometric and physical parameters of the component for their specific applications and uses. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=Monte%20Carlo%20simulation" title="Monte Carlo simulation">Monte Carlo simulation</a>, <a href="https://publications.waset.org/abstracts/search?q=transient%20electron%20transport" title=" transient electron transport"> transient electron transport</a>, <a href="https://publications.waset.org/abstracts/search?q=MESFET%20device" title=" MESFET device"> MESFET device</a>, <a href="https://publications.waset.org/abstracts/search?q=GaInP" title=" GaInP"> GaInP</a> </p> <a href="https://publications.waset.org/abstracts/19250/modeling-the-transport-of-charge-carriers-in-the-active-devices-mesfet-based-of-gainp-by-the-monte-carlo-method" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/19250.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">419</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">2</span> Study of Transport in Electronic Devices with Stochastic Monte Carlo Method: Modeling and Simulation along with Submicron Gate (Lg=0.5um)</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=N.%20Massoum">N. Massoum</a>, <a href="https://publications.waset.org/abstracts/search?q=B.%20Bouazza"> B. Bouazza</a> </p> <p class="card-text"><strong>Abstract:</strong></p> In this paper, we have developed a numerical simulation model to describe the electrical properties of GaInP MESFET with submicron gate (Lg = 0.5 碌m). This model takes into account the three-dimensional (3D) distribution of the load in the short channel and the law effect of mobility as a function of electric field. Simulation software based on a stochastic method such as Monte Carlo has been established. The results are discussed and compared with those of the experiment. The result suggests experimentally that, in a very small gate length in our devices (smaller than 40 nm), short-channel tunneling explains the degradation of transistor performance, which was previously enhanced by velocity overshoot. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=Monte%20Carlo%20simulation" title="Monte Carlo simulation">Monte Carlo simulation</a>, <a href="https://publications.waset.org/abstracts/search?q=transient%20electron%20transport" title=" transient electron transport"> transient electron transport</a>, <a href="https://publications.waset.org/abstracts/search?q=MESFET%20device" title=" MESFET device"> MESFET device</a>, <a href="https://publications.waset.org/abstracts/search?q=simulation%20software" title=" simulation software"> simulation software</a> </p> <a href="https://publications.waset.org/abstracts/19931/study-of-transport-in-electronic-devices-with-stochastic-monte-carlo-method-modeling-and-simulation-along-with-submicron-gate-lg05um" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/19931.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">513</span> </span> </div> </div> <div class="card paper-listing mb-3 mt-3"> <h5 class="card-header" style="font-size:.9rem"><span class="badge badge-info">1</span> Electromagnetic Modeling of a MESFET Transistor Using the Moments Method Combined with Generalised Equivalent Circuit Method</h5> <div class="card-body"> <p class="card-text"><strong>Authors:</strong> <a href="https://publications.waset.org/abstracts/search?q=Takoua%20Soltani">Takoua Soltani</a>, <a href="https://publications.waset.org/abstracts/search?q=Imen%20Soltani"> Imen Soltani</a>, <a href="https://publications.waset.org/abstracts/search?q=Taoufik%20Aguili"> Taoufik Aguili</a> </p> <p class="card-text"><strong>Abstract:</strong></p> The communications' and radar systems' demands give rise to new developments in the domain of active integrated antennas (AIA) and arrays. The main advantages of AIA arrays are the simplicity of fabrication, low cost of manufacturing, and the combination between free space power and the scanner without a phase shifter. The integrated active antenna modeling is the coupling between the electromagnetic model and the transport model that will be affected in the high frequencies. Global modeling of active circuits is important for simulating EM coupling, interaction between active devices and the EM waves, and the effects of EM radiation on active and passive components. The current review focuses on the modeling of the active element which is a MESFET transistor immersed in a rectangular waveguide. The proposed EM analysis is based on the Method of Moments combined with the Generalised Equivalent Circuit method (MOM-GEC). The Method of Moments which is the most common and powerful software as numerical techniques have been used in resolving the electromagnetic problems. In the class of numerical techniques, MOM is the dominant technique in solving of Maxwell and Transport鈥檚 integral equations for an active integrated antenna. In this situation, the equivalent circuit is introduced to the development of an integral method formulation based on the transposition of field problems in a Generalised equivalent circuit that is simpler to treat. The method of Generalised Equivalent Circuit (MGEC) was suggested in order to represent integral equations circuits that describe the unknown electromagnetic boundary conditions. The equivalent circuit presents a true electric image of the studied structures for describing the discontinuity and its environment. The aim of our developed method is to investigate the antenna parameters such as the input impedance and the current density distribution and the electric field distribution. In this work, we propose a global EM modeling of the MESFET AsGa transistor using an integral method. We will begin by describing the modeling structure that allows defining an equivalent EM scheme translating the electromagnetic equations considered. Secondly, the projection of these equations on common-type test functions leads to a linear matrix equation where the unknown variable represents the amplitudes of the current density. Solving this equation resulted in providing the input impedance, the distribution of the current density and the electric field distribution. From electromagnetic calculations, we were able to present the convergence of input impedance for different test function number as a function of the guide mode numbers. This paper presents a pilot study to find the answer to map out the variation of the existing current evaluated by the MOM-GEC. The essential improvement of our method is reducing computing time and memory requirements in order to provide a sufficient global model of the MESFET transistor. <p class="card-text"><strong>Keywords:</strong> <a href="https://publications.waset.org/abstracts/search?q=active%20integrated%20antenna" title="active integrated antenna">active integrated antenna</a>, <a href="https://publications.waset.org/abstracts/search?q=current%20density" title=" current density"> current density</a>, <a href="https://publications.waset.org/abstracts/search?q=input%20impedance" title=" input impedance"> input impedance</a>, <a href="https://publications.waset.org/abstracts/search?q=MESFET%20transistor" title=" MESFET transistor"> MESFET transistor</a>, <a href="https://publications.waset.org/abstracts/search?q=MOM-GEC%20method" title=" MOM-GEC method"> MOM-GEC method</a> </p> <a href="https://publications.waset.org/abstracts/82843/electromagnetic-modeling-of-a-mesfet-transistor-using-the-moments-method-combined-with-generalised-equivalent-circuit-method" class="btn btn-primary btn-sm">Procedia</a> <a href="https://publications.waset.org/abstracts/82843.pdf" target="_blank" class="btn btn-primary btn-sm">PDF</a> <span class="bg-info text-light px-1 py-1 float-right rounded"> Downloads <span class="badge badge-light">198</span> </span> </div> </div> </div> </main> <footer> <div id="infolinks" class="pt-3 pb-2"> <div class="container"> <div style="background-color:#f5f5f5;" class="p-3"> <div class="row"> <div class="col-md-2"> <ul class="list-unstyled"> About <li><a href="https://waset.org/page/support">About Us</a></li> <li><a href="https://waset.org/page/support#legal-information">Legal</a></li> <li><a target="_blank" rel="nofollow" href="https://publications.waset.org/static/files/WASET-16th-foundational-anniversary.pdf">WASET celebrates its 16th foundational 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Search results for: MESFET