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clearfix grve-align-left"><div class="grve-breadcrumbs-wrapper"><div class="grve-container"><nav><span><span><a href="https://sscs.ieee.org/">Home</a></span> › <span><a href="https://sscs.ieee.org/publications/">Publications</a></span> › <span class="breadcrumb_last" aria-current="page">IEEE Periodicals on ICs</span></span></nav></div></div></div><div id="grve-content" class="clearfix "><div class="grve-content-wrapper"><div id="grve-main-content"><div class="grve-main-content-wrapper clearfix"><div id="page-167" class="post-167 page type-page status-publish hentry"><div class="grve-section grve-row-section grve-fullwidth-background grve-padding-bottom-1x grve-bg-none"><div class="grve-container"><div class="grve-row grve-bookmark grve-columns-gap-30"><div class="grve-column wpb_column grve-column-1" ><div class="grve-column-wrapper mw-870" ><div class="grve-element grve-text grve-margin-bottom-1x"><p>Besides the Society sponsored Journal of Solid-State Circuits, the SSCS points their members attention to other IEEE periodicals of interest to the integrated circuit engineer. SSCS participates in IEEE Councils and cooperates with other IEEE Societies to provide technical co-sponsorship of periodicals. These periodicals are not bundled with SSCS membership but may be subscribed to through your annual IEEE renewal or added to your services at any time during the year.</p><p>These links go to the periodical’s home page in IEEE <em>Xplore</em>. Access may be through your institution’s subscription, your individual subscription or through your Member Digital Library Cabinet. Individual articles are also available for purchase.</p><p>Authors should browse and understand the types of manuscripts these periodicals feature and use each title’s specific directions for submission.</p></div></div></div></div></div><div class="grve-background-wrapper"></div></div><div class="grve-section grve-row-section grve-fullwidth-background grve-padding-top-1x grve-padding-bottom-1x grve-bg-none"><div class="grve-container"><div class="grve-row grve-bookmark grve-columns-gap-30"><div class="grve-column wpb_column grve-column-1" ><div class="grve-column-wrapper" ><h2 class="grve-element grve-title grve-align-left grve-h3" style="margin-bottom: 48px;"><span>Quarterly</span></h2><div class="grve-row-inner grve-bookmark periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Transactions on Semiconductor Manufacturing</span></h3><div class="grve-element grve-text"><p>Addresses innovations of interest to the integrated circuit manufacturing researcher and professional. Includes advanced process control, equipment modeling and control, yield analysis and optimization, defect control, and manufacturability improvement. It also addresses factory modeling and simulation, production planning and scheduling, as well as environmental issues in semiconductor manufacturing.</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=66" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img fetchpriority="high" decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-1-transactions-on-semiconductor-manufacturing.jpg" class="attachment-full size-full" alt="Transactions on Semiconductor Manufacturing" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-1-transactions-on-semiconductor-manufacturing.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-1-transactions-on-semiconductor-manufacturing2x.jpg 2x" /></div></div></div></div></div><div class="grve-row-inner grve-bookmark grve-padding-top-2x periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Transactions on Engineering Management</span></h3><div class="grve-element grve-text"><p>The management sciences and technology applicable to individuals and organizations engaged in or overseeing the management of engineering or technology including: technology policy development, technology assessment, technology transfer, research, development, design, evaluation, production, commissioning, or decommissioning of technical, electrical or electronic equipment/systems and allied activities.</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=17" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-2-transactions-on-engineering-management.jpg" class="attachment-full size-full" alt="Transactions on Engineering Management" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-2-transactions-on-engineering-management.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-2-transactions-on-engineering-management2x.jpg 2x" /></div></div></div></div></div><div class="grve-row-inner grve-bookmark grve-padding-top-2x periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Engineering Management Review</span></h3><div class="grve-element grve-text"><p>Reprints articles from other publications of significant interest to members. The papers are aimed at those engaged in managing research, development, or engineering activities. Reprints make it possible for the readers to receive the best of today’s literature without having to subscribe to and read other periodicals.</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=46" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-3-engineering-management-review.jpg" class="attachment-full size-full" alt="Engineering Management Review" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-3-engineering-management-review.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-3-engineering-management-review2x.jpg 2x" /></div></div></div></div></div><div class="grve-row-inner grve-bookmark grve-padding-top-2x periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Selected Topics in Applied Earth Observation and Remote Sensing</span></h3><div class="grve-element grve-text"><p>The ‘IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing’ (JSTARS) is a new quarterly publication jointly sponsored by the Geoscience and Remote Sensing Society (GRSS) and the IEEE Committee on Earth Observations (ICEO).</p><p>The new Journal reflects the growing interest in application themes in the annual IEEE conferences as well as the increasing involvement of GRSS in the ICEO. A new journal was envisaged as a communication and outreach medium for these applications themes.</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4609443" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img loading="lazy" decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-4-selected-Topics-in-applied-earth-observation-and-remote-sensing.jpg" class="attachment-full size-full" alt="Selected Topics in Applied Earth Observation and Remote Sensing" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-4-selected-Topics-in-applied-earth-observation-and-remote-sensing.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-4-selected-Topics-in-applied-earth-observation-and-remote-sensing2x.jpg 2x" /></div></div></div></div></div><div class="grve-row-inner grve-bookmark grve-padding-top-2x periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Nanotechnology Magazine</span></h3><div class="grve-element grve-text"><p>The scope of the IEEE Nanotechnology Magazine is all aspects of nanotechnology including theory, analysis, design, implementation, and applications related to creation of materials, devices, structures, etc. by manipulating matter at the nanometer length scale and taking advantage of novel (physical, chemical, electrical, mechanical, optical, magnetic, biological..) properties which arise solely due to the nanometer scale. Contents are written at a general level aimed at a broad audience.</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4451717" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img loading="lazy" decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-5-nanotechnology-magazine.jpg" class="attachment-full size-full" alt="Nanotechnology Magazine" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-5-nanotechnology-magazine.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-5-nanotechnology-magazine2x.jpg 2x" /></div></div></div></div></div></div></div></div></div><div class="grve-background-wrapper"></div></div><div class="grve-section grve-row-section grve-fullwidth-background grve-padding-top-1x grve-padding-bottom-1x grve-bg-none"><div class="grve-container"><div class="grve-row grve-bookmark grve-columns-gap-30"><div class="grve-column wpb_column grve-column-1" ><div class="grve-column-wrapper" ><h2 class="grve-element grve-title grve-align-left grve-h3" style="margin-bottom: 48px;"><span>Monthly</span></h2><div class="grve-row-inner grve-bookmark periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Transactions on VLSI Systems</span></h3><div class="grve-element grve-text"><p>Includes all major aspects of the design and implementation of VLSI/ULSI and microelectronic systems. Topics of special interest include: systems specifications, design and partitioning, high performance computing and communication systems, neural networks, wafer-scale integration and multichip module systems and their applications.</p><p>SSCS Rep to Steering Committee Hideto Hidaka</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=92" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img loading="lazy" decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-6-transactions-on-vlsi-systems.jpg" class="attachment-full size-full" alt="Transactions on VLSI Systems" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-6-transactions-on-vlsi-systems.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-6-transactions-on-vlsi-systems2x.jpg 2x" /></div></div></div></div></div><div class="grve-row-inner grve-bookmark grve-padding-top-2x periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Transactions on Computer Aided Design of Integrated Circuits and Systems</span></h3><div class="grve-element grve-text"><p>Contains articles on methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=43" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img loading="lazy" decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-7-transactions-on-computer-aided-design-of-integrated-circuits-and-systems.jpg" class="attachment-full size-full" alt="Transactions on Computer Aided Design of Integrated Circuits and Systems" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-7-transactions-on-computer-aided-design-of-integrated-circuits-and-systems.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-7-transactions-on-computer-aided-design-of-integrated-circuits-and-systems2x.jpg 2x" /></div></div></div></div></div></div></div></div></div><div class="grve-background-wrapper"></div></div><div class="grve-section grve-row-section grve-fullwidth-background grve-padding-top-1x grve-padding-bottom-1x grve-bg-none"><div class="grve-container"><div class="grve-row grve-bookmark grve-columns-gap-30"><div class="grve-column wpb_column grve-column-1" ><div class="grve-column-wrapper" ><h2 class="grve-element grve-title grve-align-left grve-h3" style="margin-bottom: 48px;"><span>6 times per year</span></h2><div class="grve-row-inner grve-bookmark periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Journal of Display Technology</span></h3><div class="grve-element grve-text"><p>This publication covers the theory, material, design, fabrication, manufacturing and application of information displays and aspects of display technology that emphasize the progress in device engineering, design and simulation, materials, electronics, physics, and reliability aspects of displays and the application of displays. The Journal is sponsored by EDS, six other IEEE societies (BT, CPMT, IA, IM, LEO and SSC) and the Optical Society of America (OSA).</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9425" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img loading="lazy" decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-8-journal-of-display-technology.jpg" class="attachment-full size-full" alt="Journal of Display Technology" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-8-journal-of-display-technology.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-8-journal-of-display-technology2x.jpg 2x" /></div></div></div></div></div><div class="grve-row-inner grve-bookmark grve-padding-top-2x periodical"><div class="grve-column-inner wpb_column grve-column-2-3"><div class="grve-column-wrapper-inner"><h3 class="grve-element grve-title grve-align-left grve-h5 mw-870" style=""><span>Sensors Journal</span></h3><div class="grve-element grve-text"><p>The topics of interest include all types of sensing: mechanical, thermal, optical, magnetic, radiation, microwave, chemical, biological, mass, etc., both on the macro and micro levels. Also of interest are sensor packaging, interconnection, modeling, telemetry, CAD, stability (e.g., noise), characterization, sensor signal processing, sensor arrays (e.g., e-nose), sensor systems, intelligent sensors, sensor-actuators, and applications. The Journal was founded in part to create a high quality archival sensors publication whose subscription fees are within the reach of individual practitioners in the field.</p><p><a class="arrow-link" href="http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7361" target="_blank" rel="noopener">Learn More</a></p></div></div></div><div class="grve-column-inner wpb_column grve-column-1-3"><div class="grve-column-wrapper-inner"><div class="grve-element grve-image grve-align-center" style=""><div class="grve-image-wrapper"><img loading="lazy" decoding="async" width="229" height="311" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-9-sensors-journal.jpg" class="attachment-full size-full" alt="Sensors Journal" srcset="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-9-sensors-journal.jpg 1x,https://sscs.ieee.org/wp-content/uploads/ieee-sscs-periodicals-9-sensors-journal2x.jpg 2x" /></div></div></div></div></div></div></div></div></div><div class="grve-background-wrapper"></div></div></div></div></div></div></div><footer id="grve-footer" data-sticky-footer="no" class="grve-border grve-bookmark"><div id="grve-bottom-bar" class="grve-bookmark"><div class="grve-section grve-row-section grve-fullwidth-background grve-padding-top-3x grve-padding-bottom-3x grve-bg-none bg-red-gradient" id="join-sscs"><div class="grve-container"><div class="grve-row grve-bookmark grve-columns-gap-30"><div class="grve-column wpb_column grve-column-1 grve-align-center" ><div class="grve-column-wrapper mw-770" ><h2 class="grve-element grve-title grve-align-center grve-subtitle-text" style=""><span>Join IEEE Solid-State Circuits Society</span></h2><div class="grve-element grve-text"><p>As a member of the IEEE SSCS Society, you will receive communications about networking opportunities, conferences, meetings, special events, exclusive content, and so much more.</p></div><div class="grve-element grve-align-center ieee-btn"><a href="https://www.ieee.org/membership-catalog/productdetail/showProductDetailPage.html?product=MEMSSC037" title="Learn More" class="grve-btn grve-btn-medium grve-extra-round grve-bg-white grve-bg-hover-primary-2"><span>Learn More</span></a></div></div></div></div></div><div class="grve-background-wrapper"></div></div></div><div class="grve-footer-wrapper"><div class="grve-widget-area"><div class="grve-container grve-padding-top-2x grve-padding-bottom-1x "><div class="grve-row grve-columns-gap-30"><div class="wpb_column grve-column grve-column-1-2 grve-tablet-column-1-2"><div class="grve-column-wrapper"><div id="media_image-2" class="grve-widget widget widget_media_image"><a href="/"><img width="476" height="128" src="https://sscs.ieee.org/wp-content/uploads/ieee-sscs-sm-ko-logo2x.png" class="image wp-image-1260 attachment-full size-full" alt="IEEE Solid-State Circuits Society logo" style="max-width: 100%; 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